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Kada, Wataru*; Kambayashi, Yuya*; Miura, Kenta*; Saruya, Ryota*; Kubota, Atsushi*; Sato, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Hanaizumi, Osamu*
Key Engineering Materials, 643, p.15 - 19, 2015/05
Kada, Wataru*; Kambayashi, Yuya*; Iwamoto, Naoya*; Onoda, Shinobu; Makino, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Hoshino, Norihiro*; Tsuchida, Hidekazu*; Kojima, Kazutoshi*; et al.
Nuclear Instruments and Methods in Physics Research B, 348, p.240 - 245, 2015/04
Times Cited Count:4 Percentile:32.74(Instruments & Instrumentation)Onoda, Shinobu; Kambayashi, Yuya; Kada, Wataru*; Iwamoto, Naoya*; Makino, Takahiro; Umezawa, Hitoshi*; Mokuno, Yoshiaki*; Shikata, Shinichi*; Hanaizumi, Osamu*; Kamiya, Tomihiro; et al.
no journal, ,
no abstracts in English
Kambayashi, Yuya*; Kada, Wataru*; Saruya, Ryota*; Kubota, Atsushi*; Sato, Takahiro; Koka, Masashi; Ishii, Yasuyuki; Kamiya, Tomihiro; Miura, Kenta*; Hanaizumi, Osamu*
no journal, ,
no abstracts in English
Ando, Yushi*; Kambayashi, Yuya*; Kada, Wataru*; Onoda, Shinobu; Makino, Takahiro; Sato, Shinichiro; Umezawa, Hitoshi*; Mokuno, Yoshiaki*; Shikata, Shinichi*; Hanaizumi, Osamu*; et al.
no journal, ,
A transient spectroscopy analysis of pulse signals induced by heavy ion micro probe was applied for chemical vapor deposition (CVD) diamond-based radiation detector to investigate the effects of native defects in on the degradation of charge collection efficiency. A high-purity CVD diamond with thickness of 100 m was employed for the analysis, and as a result, a defect with activation energy of 0.27 eV which is involved in the degradation of CCE was detected.
Kambayashi, Yuya; Onoda, Shinobu; Kada, Wataru*; Makino, Takahiro; Hoshino, Norihiro*; Tsuchida, Hidekazu*; Oshima, Takeshi; Kamiya, Tomihiro; Hanaizumi, Osamu*
no journal, ,
no abstracts in English
Kada, Wataru*; Onoda, Shinobu; Iwamoto, Naoya*; Hoshino, Norihiro*; Tsuchida, Hidekazu*; Makino, Takahiro; Kambayashi, Yuya; Koka, Masashi; Hanaizumi, Osamu*; Kamiya, Tomihiro; et al.
no journal, ,