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Journal Articles

Torsion test technique for interfacial shear evaluation of F82H RAFM HIP-joints

Nozawa, Takashi; Ogiwara, Hiroyuki*; Kannari, Jun*; Kishimoto, Hirotatsu*; Tanigawa, Hiroyasu

Fusion Engineering and Design, 86(9-11), p.2512 - 2516, 2011/10

 Times Cited Count:14 Percentile:71.79(Nuclear Science & Technology)

A hot isostatic press (HIP) process is a key technology to fabricate a first wall of the blanket system utilizing a reduced-activation ferritic/martensitic (RAFM) steel such as F82H. A primary objective of this study is to characterize interfacial properties of HIPed F82H joints by torsion to identify the feasibility of this test method. It is apparent that the absorption energies of the HIP joints varied by the processing conditions, although the maximum shear strength was not much different. According to the fracture surfaces, it is indicated that the reduction of the absorption energy was due to the oxide formed on the interface of the HIP joint and this was consistent with the results of charpy impact tests. In conclusion, the torsion test method enables to precisely evaluate the shear properties of the HIPed joint interface and becomes one of promising powerful techniques for inspection of the HIP joints.

Journal Articles

XUV-FEL spectroscopy; He two-photon ionization cross-sections

Sato, Takahiro*; Iwasaki, Atsushi*; Ishibashi, Kazuki*; Okino, Tomoya*; Yamanouchi, Kaoru*; Adachi, Junichi*; Yagishita, Akira*; Yazawa, Hiroki*; Kannari, Fumihiko*; Aoyama, Makoto; et al.

Europhysics News, 42(5), P. 10, 2011/09

The resonant and non-resonant two-photon single ionization processes of He were investigated using intense free electron laser light in the extreme ultraviolet (XUV) region (53.4-61.4 nm) covering the 1s-2p and 1s-3p resonant transitions of He. On the basis of the dependences of the yield of He$$^{+}$$ on the XUV light-field intensity at 53.4, 58.4, 56.0 and 61.4 nm, the absolute values of the two-photon ionization cross sections of He at the four different wavelengths and their dependence on the light-field intensity were determined for the first time.

Journal Articles

Determination of the absolute two-photon ionization cross section of He by an XUV free electron laser

Sato, Takahiro*; Iwasaki, Atsushi*; Ishibashi, Kazuki*; Okino, Tomoya*; Yamanouchi, Kaoru*; Adachi, Junichi*; Yagishita, Akira*; Yazawa, Hiroki*; Kannari, Fumihiko*; Aoyama, Makoto; et al.

Journal of Physics B; Atomic, Molecular and Optical Physics, 44(16), p.161001_1 - 161001_5, 2011/08

 Times Cited Count:36 Percentile:83.28(Optics)

The resonant and non-resonant two-photon single ionization processes of He were investigated using intense free electron laser light in the extreme ultraviolet (XUV) region (53.4-61.4 nm) covering the 1s-2p and 1s-3p resonant transitions of He. On the basis of the dependences of the yield of He$$^{+}$$ on the XUV light-field intensity at 53.4, 58.4, 56.0 and 61.4 nm, the absolute values of the two-photon ionization cross sections of He at the four different wavelengths and their dependence on the light-field intensity were determined for the first time.

Oral presentation

Activity for oxygen reduction reaction of carbon nano-onion prepared from nano-diamond

Kannari, Naokatsu*; Ozaki, Junichi*; Yamamoto, Shunya; Hakoda, Teruyuki; Yamaki, Tetsuya

no journal, , 

no abstracts in English

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