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Journal Articles

Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques

Hellgren, N.*; Guo, J.*; Luo, Y.*; S${aa}$the, C.*; Agui, Akane; Kashtanov, S.*; Nordgren, J.*; ${AA}$gren, H.*; Sundgren, J.-E.*

Thin Solid Films, 471(1-2), p.19 - 34, 2005/01

https://doi.org/10.1016/j.tsf.2004.03.027
 Times Cited Count：133 Percentile：96.54(Materials Science, Multidisciplinary)

no abstracts in English

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