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Maekawa, Sadamichi; Kikkawa, Takashi*; Chudo, Hiroyuki; Ieda, Junichi; Saito, Eiji
Journal of Applied Physics, 133(2), p.020902_1 - 020902_24, 2023/01
Times Cited Count:1 Percentile:0(Physics, Applied)Lee, O.*; Yamamoto, Kei; Umeda, Maki; Zollitsch, C. W.*; Elyasi, M.*; Kikkawa, Takashi*; Saito, Eiji; Bauer, G. E. W.*; Kurebayashi, Hidekazu*
Physical Review Letters, 130(4), p.046703_1 - 046703_6, 2023/01
Times Cited Count:0 Percentile:0.02(Physics, Multidisciplinary)Oyanagi, Koichi*; Gomez-Perez, J. M.*; Zhang, X.-P.*; Kikkawa, Takashi*; Chen, Y.*; Sagasta, E.*; Chuvilin, A.*; Hueso, L. E.*; Golovach, V. N.*; Sebastian Bergeret, F.*; et al.
Physical Review B, 104(13), p.134428_1 - 134428_14, 2021/10
Times Cited Count:6 Percentile:67.2(Materials Science, Multidisciplinary)Kikkawa, Takashi*; Reitz, D.*; Ito, Hiroaki*; Makiuchi, Takahiko*; Sugimoto, Takaaki*; Tsunekawa, Kakeru*; Daimon, Shunsuke*; Oyanagi, Koichi*; Ramos, R.*; Takahashi, Saburo*; et al.
Nature Communications (Internet), 12, p.4356_1 - 4356_7, 2021/07
Times Cited Count:14 Percentile:89.99(Multidisciplinary Sciences)Ramos, R.*; Makiuchi, Takahiko*; Kikkawa, Takashi*; Daimon, Shunsuke*; Oyanagi, Koichi*; Saito, Eiji
Applied Physics Letters, 117(24), p.242402_1 - 242402_5, 2020/12
Times Cited Count:1 Percentile:7.62(Physics, Applied)Nambu, Yusuke*; Barker, J.*; Okino, Yuki*; Kikkawa, Takashi*; Shiomi, Yuki*; Enderle, M.*; Weber, T.*; Winn, B.*; Graves-Brook, M.*; Tranquada, J. M.*; et al.
Physical Review Letters, 125(2), p.027201_1 - 027201_6, 2020/07
Times Cited Count:32 Percentile:93.5(Physics, Multidisciplinary)Hirschberger, M.*; Nakajima, Taro*; Kriener, M.*; Kurumaji, Takashi*; Spitz, L.*; Gao, S.*; Kikkawa, Akiko*; Yamasaki, Yuichi*; Sagayama, Hajime*; Nakao, Hironori*; et al.
Physical Review B, 101(22), p.220401_1 - 220401_6, 2020/06
Times Cited Count:31 Percentile:91.66(Materials Science, Multidisciplinary)Kobata, Masaaki; Yoshii, Kenji; Fukuda, Tatsuo; Kawasaki, Ikuto; Okane, Tetsuo; Yamagami, Hiroshi; Yaita, Tsuyoshi; Harii, Kazuya; Ieda, Junichi; Okayasu, Satoru; et al.
JPS Conference Proceedings (Internet), 30, p.011192_1 - 011192_6, 2020/03
High energy X-ray photoelectron spectroscopy (HAXPES) measurements were carried out for the Spin Seebeck system Pt/YFe
O
(YIG). This system was found to show anomalous Hall effect, possible due to the formation of intermetallic compounds between Fe
and Pt. To reveal this possibility, we have measured the Fe 1s photoelectron peaks by using HAXPES. It was found that the Fe ions consist of Fe
in YIG and metallic Fe. The formation of the metallic state is consistent with the proposed origin of the anomalous Hall effect. Other spectra such as Pt 4f will be presented at the conference.
Oyanagi, Koichi*; Kikkawa, Takashi*; Saito, Eiji
AIP Advances (Internet), 10(1), p.015031_1 - 015031_5, 2020/01
Times Cited Count:13 Percentile:72.26(Nanoscience & Nanotechnology)Yahiro, Reimei*; Kikkawa, Takashi*; Ramos, R.*; Oyanagi, Koichi*; Hioki, Tomosato*; Daimon, Shunsuke*; Saito, Eiji
Physical Review B, 101(2), p.024407_1 - 024407_7, 2020/01
Times Cited Count:18 Percentile:82.95(Materials Science, Multidisciplinary)Ramos, R.*; Hioki, Tomosato*; Hashimoto, Yusuke*; Kikkawa, Takashi*; Frey, P.*; Kreil, A. J. E.*; Vasyuchka, V. I.*; Serga, A. A.*; Hillebrands, B.*; Saito, Eiji
Nature Communications (Internet), 10, p.5162_1 - 5162_8, 2019/11
Times Cited Count:20 Percentile:78.14(Multidisciplinary Sciences)Kikkawa, Takashi*; Suzuki, Motohiro*; Ramos, R.*; Aguirre, M. H.*; Okabayashi, Jun*; Uchida, Kenichi*; Lucas, I.*; Anadn, A.*; Kikuchi, Daisuke*; Algarabel, P. A.*; et al.
Journal of Applied Physics, 126(14), p.143903_1 - 143903_11, 2019/10
Times Cited Count:8 Percentile:48.17(Physics, Applied)Oyanagi, Koichi*; Takahashi, Saburo*; Cornelissen, L. J.*; Shan, J.*; Daimon, Shunsuke*; Kikkawa, Takashi*; Bauer, G. E. W.*; Van Wees, B. J.*; Saito, Eiji
Nature Communications (Internet), 10, p.4740_1 - 4740_6, 2019/10
Times Cited Count:32 Percentile:89.94(Multidisciplinary Sciences)Ito, Naohiro*; Kikkawa, Takashi*; Barker, J.*; Hirobe, Daichi*; Shiomi, Yuki*; Saito, Eiji
Physical Review B, 100(6), p.060402_1 - 060402_6, 2019/08
Times Cited Count:32 Percentile:86.53(Materials Science, Multidisciplinary)Wang, H.*; Hou, D.*; Qiu, Z.*; Kikkawa, Takashi*; Saito, Eiji; Jin, X.*
Journal of Applied Physics, 122(8), p.083907_1 - 083907_6, 2017/08
Times Cited Count:3 Percentile:16.54(Physics, Applied)Kikkawa, Takashi*; Suzuki, Motohiro*; Okabayashi, Jun*; Uchida, Kenichi*; Kikuchi, Daisuke*; Qiu, Z.*; Saito, Eiji
Physical Review B, 95(21), p.214416_1 - 214416_7, 2017/06
Times Cited Count:15 Percentile:61.68(Materials Science, Multidisciplinary)Ramos, R.*; Kikkawa, Takashi*; Anadn, A.*; Lucas, I.*; Uchida, Kenichi*; Algarabel, P. A.*; Morell
n, L.*; Aguirre, M. H.*; Saito, Eiji; Ibarra, M. R.*
AIP Advances (Internet), 7(5), p.055915_1 - 055915_7, 2017/05
Times Cited Count:17 Percentile:65.69(Nanoscience & Nanotechnology)Yagmur, A.*; Uchida, Kenichi*; Ihara, Kazuki*; Ioka, Ikuo; Kikkawa, Takashi*; Ono, Madoka*; Endo, Junichi*; Kashiwagi, Kimiaki*; Nakashima, Tetsuya*; Kirihara, Akihiro*; et al.
Applied Physics Letters, 109(24), p.243902_1 - 243902_4, 2016/12
Times Cited Count:3 Percentile:16.12(Physics, Applied)Thermoelectric devices based on the spin Seebeck effect (SSE) were irradiated with gamma () rays with the total dose of around 3
10
Gy in order to investigate the
-radiation resistance of the devices. To demonstrate this, Pt/Ni
Zn
Fe
O
/Glass and Pt/Bi
Y
Fe
O
/Gd
Ga
O
SSE devices were used. We confirmed that the thermoelectric, magnetic, and structural properties of the SSE devices are not affected by the
-ray irradiation. This result demonstrates that SSE devices are applicable to thermoelectric generation even in high radiation environments.
Kikkawa, Takashi*; Shen, K.*; Flebus, B.*; Duine, R. A.*; Uchida, Kenichi*; Qiu, Z.*; Bauer, G. E. W.*; Saito, Eiji
Physical Review Letters, 117(20), p.207203_1 - 207203_6, 2016/11
Times Cited Count:128 Percentile:97.62(Physics, Multidisciplinary)Uchida, Kenichi*; Adachi, Hiroto; Kikkawa, Takashi*; Kirihara, Akihiro*; Ishida, Masahiko*; Yorozu, Shinichi*; Maekawa, Sadamichi; Saito, Eiji*
Proceedings of the IEEE, 104(10), p.1946 - 1973, 2016/10
Times Cited Count:202 Percentile:99.24(Engineering, Electrical & Electronic)