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Osakabe, Masaki*; Shinohara, Koji; Toi, Kazuo*; Todo, Yasushi*; Hamamatsu, Kiyotaka; Murakami, Sadayoshi*; Yamamoto, Satoshi*; Idomura, Yasuhiro; Sakamoto, Yoshiteru; Tanaka, Kenji*; et al.
Purazuma, Kaku Yugo Gakkai-Shi, 85(12), p.839 - 842, 2009/12
no abstracts in English
Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Wu, G.*; Kitajima, Yoshinori*
Surface Science, 593(1-3), p.310 - 317, 2005/11
Times Cited Count：2 Percentile：11.66(Chemistry, Physical)Using a newly developed rotatable time-of-flight mass spectrometer(R-TOF-MS) and polarized synchrotron radiation, orientation effect on fragmentation and desorption pathways occurring at the top-most layers of molecular solids have been investigated. Reported will be polarization-angle dependencies of TOF mass spectra, high-resolution electron- and ion-NEXAFS in condensed chlorobenzene.
Ikeura, Hiromi*; Sekiguchi, Tetsuhiro; Kitajima, Yoshinori*; Baba, Yuji
Applied Surface Science, 169-170, p.282 - 286, 2001/01
Times Cited Count：8 Percentile：44.94(Chemistry, Physical)Carbon and nitrogen K-shell excitation and dissociation of condensed formamide at 96 K were studied by near edge X-ray absorption fine structure (NEXAFS) recorded by total electron yield (TEY), total ion yield (TIY) and photon-stimulated desorption (PSD) yield of H+ measurements. It was found that electronic transitions from the C1s or the N1s to the 
*(C-H) and/or (N-H) enhanced ion yield of H+ from the C-H and/or N-H functional group. This selective dissociation indicates that the corresponding unoccupied molecular orbital has an antibonding character of the C-H and/or N-H. To investigate the molecular orientation of condensed formamide, incidence-angle-dependent TEY-NEXAFS spectra were measured. The CNO plane of the adsorbed formamide molecule is determined to be tilted away from the surface by an averaged angle of about 42 degrees.
Sekiguchi, Hiromi*; Sekiguchi, Tetsuhiro; Kitajima, Yoshinori*; Baba, Yuji
Photon Factory Activity Report 1998, Part B, P. 66, 1999/11
no abstracts in English
Okamoto, Makoto*; Kitajima, Masahiro*; Kobayashi, Yoshinori*; Kiuchi, Kiyoshi*; Kano, Shigeki
Nihon Genshiryoku Gakkai-Shi, 37(9), p.796 - 806, 1995/00
Times Cited Count：0 Percentile：0.01(Nuclear Science & Technology)None
