Characterizing the soft X-ray laser beams by submicron-resolution LiF detector

Pikuz, T.; Faenov, A.*; 福田 祐仁; 田中 桃子; 石野 雅彦; 長谷川 登; 錦野 将元; 大橋 治彦*; 矢橋 牧名*; 登野 健介*; et al.

no journal, , 

Review of results, obtained by using recently proposed new imaging detector, based on formation of color centers in LiF crystal and LiF film, for in situ high performance measurements of near-field and far-field properties of soft X-ray lasers (SXRL) beams is presented. Experiments have been carried out with laser-driven transient-collision plasma SXRL, free electron SXRL, and relativistic HOH beams. It was demonstrated that due to favorable combination of high spatial resolution, high dynamic range and wide field of view, that this technique allows measuring not only intensity distribution across the full beam and in local areas with resolution of 700 nm, but also allows to evaluate coherence and spectral distribution of radiation across the beam. Experimental diffraction patterns in the images of periodical structures are analyzed by comparison with the modeled ones in the last case. Good agreement between experimental and modeling data was obtained.