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-type La
Eu
CuO
and Nd
CuOAsano, Shun*; Ishii, Kenji*; Matsumura, Daiju; Tsuji, Takuya; Kudo, Kota*; Taniguchi, Takanori*; Saito, Shin*; Sunohara, Toshiki*; Kawamata, Takayuki*; Koike, Yoji*; et al.
Physical Review B, 104(21), p.214504_1 - 214504_7, 2021/12
Times Cited Count：2 Percentile：12.24(Materials Science, Multidisciplinary)Hirobe, Daichi*; Sato, Masahiro*; Kawamata, Takayuki*; Shiomi, Yuki*; Uchida, Kenichi*; Iguchi, Ryo*; Koike, Yoji*; Maekawa, Sadamichi; Saito, Eiji
Nature Physics, 13(1), p.30 - 34, 2017/01
Times Cited Count：116 Percentile：96.98(Physics, Multidisciplinary)Yoshida, Masahiro*; Ishii, Kenji; Naka, Makoto*; Ishihara, Sumio*; Jarrige, I.*; Ikeuchi, Kazuhiko*; Murakami, Yoichi*; Kudo, Kazutaka*; Koike, Yoji*; Nagata, Tomoko*; et al.
Scientific Reports (Internet), 6, p.23611_1 - 23611_8, 2016/03
Times Cited Count：1 Percentile：10.82(Multidisciplinary Sciences)Yoshida, Masahiro*; Ishii, Kenji; Jarrige, I.*; Watanuki, Tetsu; Kudo, Kazutaka*; Koike, Yoji*; Kumagai, Kenichi*; Hiraoka, Nozomu*; Ishii, Hirofumi*; Tsuei, K.-D.*; et al.
Journal of Synchrotron Radiation, 21(1), p.131 - 135, 2014/01
Times Cited Count：3 Percentile：18.31(Instruments & Instrumentation)
cupratesWakimoto, Shuichi; Ishii, Kenji; Kimura, Hiroyuki*; Ikeuchi, Kazuhiko*; Yoshida, Masahiro*; Adachi, Tadashi*; Casa, D.*; Fujita, Masaki*; Fukunaga, Yasushi*; Gog, T.*; et al.
Physical Review B, 87(10), p.104511_1 - 104511_7, 2013/03
Times Cited Count：10 Percentile：41.87(Materials Science, Multidisciplinary)
Cu
O
studied by resonant inelastic X-ray scatteringYoshida, Masahiro; Ishii, Kenji; Ikeuchi, Kazuhiko*; Jarrige, I.; Murakami, Yoichi*; Mizuki, Junichiro; Tsutsui, Kenji; Toyama, Takami*; Maekawa, Sadamichi*; Kudo, Kazutaka*; et al.
Physica C, 470(Suppl.1), p.S145 - S146, 2010/12
Times Cited Count：4 Percentile：21.08(Physics, Applied)Imazono, Takashi; Sano, Kazuo*; Suzuki, Yoji; Kawachi, Tetsuya; Koike, Masato
AIP Conference Proceedings 1234, p.347 - 350, 2010/06
Times Cited Count：3 Percentile：75.12(Physics, Applied)Linear polarization measurements were carried out using a newly developed soft X-ray polarimeter and ellipsometer (SXPE) for complete polarization analysis at a soft X-ray beamline (BL-11) of the SR Center, Ritsumeikan University, Japan. A Mo/Si multilayer mirror was deposited on the surface of a Si(111) substrate by an ion beam sputtering method. It was cut into two pieces which were then used as reflection-type polarizers. When the incident wavelength was scanned from 12.4 nm to 14.8 nm by a Monk-Gillieson type varied-line-spacing grating monochromator of the BL-11, the angles of incidence of both the Mo/Si multilayer polarizers in the SXPE were also varied from 37.5
to 52.3. The polarizances depended strongly on the wavelength, and the best performance of over 99% was obtained in the vicinity of 14 nm. Using these polarizers, we assessed that the degree of linear polarization of the BL-11 was almost constant at 85-88% in the measured wavelength range.
Imazono, Takashi; Sano, Kazuo*; Suzuki, Yoji; Kawachi, Tetsuya; Koike, Masato
Memoirs of the SR Center Ritsumeikan University, (12), p.87 - 100, 2010/05
A novel apparatus for polarimetric and ellipsometric measurements for the complete polarization analysis in the soft X-ray (SX) region, which is based on the rotating-analyzer ellipsometry by using six independently movable drive shafts, has been designed, constructed, and installed in BL-11. Linear polarization measurement has been demonstrated using two identical Mo/Si multilayer polarizers. The incident wavelength was scanned from 12.4 nm to 14.8 nm by a VLS-PGM of BL-11, and the angles of incidence of both polarizers were also varied from 37.5 to 52.3. The best performance of polarizers has been determined to be over 99% at 13.9 nm, and the degree of linear polarization has been assessed to be 85-88% in the measured wavelength range for the first time since the completion of the beamline. This means that BL-11 is upgraded as the comprehensive evaluation beamline for optical elements including polarizing elements for use in the SX region.
Pb
Sr
CuO
Hiraka, Haruhiro*; Hayashi, Yoichiro*; Wakimoto, Shuichi; Takeda, Masayasu; Kakurai, Kazuhisa; Adachi, Tadashi*; Koike, Yoji*; Yamada, Ikuya*; Miyazaki, Masanori*; Hiraishi, Masatoshi*; et al.
Physical Review B, 81(14), p.144501_1 - 144501_6, 2010/04
Times Cited Count：16 Percentile：55.81(Materials Science, Multidisciplinary)Imazono, Takashi; Suzuki, Yoji; Sano, Kazuo*; Koike, Masato
Spectrochimica Acta, Part B, 65(2), p.147 - 151, 2010/02
Times Cited Count：2 Percentile：14.16(Spectroscopy)To meet the needs we have been developing an apparatus to evaluate polarization abilities of multilayer- and crystal-types polarizing elements and determine the polarization state of light in 1 keV region. The 8-axis goniometer called the polarization analysis-unit is equipped in this apparatus and consists of a phase shifter-unit and an analyzer-unit. All axes can be driven with HV compatible stepping motors. Both reflection- and transmission-types samples are available on P and A. Therefore, this apparatus makes it possible to carry out not only conventional reflection and transmission measurements but also four scanning modes which are double- reflections and transmissions, and transmission-reflection and vice versa.
Imazono, Takashi; Sano, Kazuo*; Suzuki, Yoji; Kawachi, Tetsuya; Koike, Masato
Review of Scientific Instruments, 80(8), p.085109_1 - 085109_8, 2009/08
Times Cited Count：18 Percentile：59.15(Instruments & Instrumentation)A new apparatus for polarimetric and ellipsometric measurements based on the rotating-analyzer method in the soft X-ray region has been designed, constructed, and installed in the soft X-ray beamline BL-11 at the SR Center of Ritsumeikan University, Shiga, Japan. It can realize the optical configurations for the complete polarization analysis by using six independently movable drive shafts. A demonstration of the capabilities of the apparatus has been performed using Mo/Si multilayer polarizers deposited by an ion beam sputtering method. It is for the first time shown that the degree of linear polarization of monochromatized light from the BL-11 is approximately 87% at 92 eV since the beamline has been constructed.
Sr
NiO and La
(Ba,Sr)
CuO superconducting compoundsWakimoto, Shuichi; Kimura, Hiroyuki*; Ishii, Kenji; Ikeuchi, Kazuhiko; Adachi, Tadashi*; Fujita, Masaki*; Kakurai, Kazuhisa; Koike, Yoji*; Mizuki, Junichiro; Noda, Yukio*; et al.
Physical Review Letters, 102(15), p.157001_1 - 157001_4, 2009/04
Times Cited Count：25 Percentile：74.33(Physics, Multidisciplinary)
SR study of impurity effects on the Cu-spin fluctuations in the overdoped regime of LaSr
Cu
Zn
O
Risdiana*; Adachi, Tadashi*; Oki, Naoki*; Yairi, Satoshi*; Tanabe, Yoichi*; Omori, Keisuke*; Suzuki, Takao*; Watanabe, Isao*; Koda, Akihiro*; Higemoto, Wataru; et al.
Physica C, 460-462(2), p.874 - 875, 2007/09
Times Cited Count：3 Percentile：17.24(Physics, Applied)Zero-field muon-spin-relaxation measurements have been carried out for LaSrCuZnO (LSCO)with 
= 0-0.10 in the overdoped regime up to 
= 0.30, in order to investigate whether the dynamical stripe correlations are pinned and stabilized even for the overdoped LSCO or not. It has been found that the Zn-induced slowing down of the Cu-spin fluctuations is weakened with increasing but takes place in the overdoped regime and disappears at = 0.30. This suggests that the stripe-pinning model holds good in the whole superconducting regime of LSCO and that there is no quantum critical point at 
0.19.
CuOIshii, Kenji; Tsutsui, Kenji*; Toyama, Takami*; Inami, Toshiya; Mizuki, Junichiro; Murakami, Yoichi*; Endo, Yasuo*; Maekawa, Sadamichi*; Kudo, Kazutaka*; Koike, Yoji*; et al.
Physical Review B, 76(4), p.045124_1 - 045124_7, 2007/07
Times Cited Count：20 Percentile：62.67(Materials Science, Multidisciplinary)(La,Sr,Ca)CuO is an attractive material in connection with high-
superconductivity because Sr
Ca
CuO becomes a superconductor under high pressure without the CuO
planes. We present RIXS at the Cu 
-edge of (La,Sr,Ca)CuO focusing on the momentum dependence of interband excitation across the Mott gap and the intraband excitation below the gap as a function of hole concentration. The experimental results are consistent with the theoretical predictions.
chains of Ca
YCu
O
Matsuda, Masaaki; Kakurai, Kazuhisa; Kurogi, Shogo*; Kudo, Kazutaka*; Koike, Yoji*; Yamaguchi, Hirotaka*; Ito, Toshimitsu*; Oka, Kunihiko*
Physical Review B, 71(10), p.104414_1 - 104414_8, 2005/03
Times Cited Count：13 Percentile：49.14(Materials Science, Multidisciplinary)no abstracts in English
SrNiO and LaBaCuOWakimoto, Shuichi; Ishii, Kenji; Ikeuchi, Kazuhiko; Kakurai, Kazuhisa; Mizuki, Junichiro; Kimura, Hiroyuki*; Noda, Yukio*; Adachi, Tadashi*; Koike, Yoji*; Fujita, Masaki*; et al.
no journal, ,
no abstracts in English
CaCuO ( = 0, 6) by resonant inelastic X-ray scatteringYoshida, Masahiro; Ishii, Kenji; Jarrige, I.; Ikeuchi, Kazuhiko; Murakami, Yoichi*; Mizuki, Junichiro; Tsutsui, Kenji; Toyama, Takami*; Maekawa, Sadamichi*; Kudo, Kazutaka*; et al.
no journal, ,
no abstracts in English
Imazono, Takashi; Sasai, Hiroyuki*; Harada, Yoshihisa*; Iwai, Nobuyuki*; Moriya, Naoji*; Sano, Kazuo*; Suzuki, Yoji; Kado, Masataka; Kawachi, Tetsuya; Koike, Masato
no journal, ,
no abstracts in English
CuO; Temperature dependence of charge excitation spectraYoshida, Masahiro; Ishii, Kenji; Jarrige, I.; Ikeuchi, Kazuhiko; Murakami, Yoichi*; Mizuki, Junichiro; Tsutsui, Kenji; Toyama, Takami*; Maekawa, Sadamichi*; Kudo, Kazutaka*; et al.
no journal, ,
no abstracts in English
Ishii, Kenji; Yoshida, Masahiro; Jarrige, I.; Ikeuchi, Kazuhiko*; Murakami, Yoichi*; Mizuki, Junichiro; Ishihara, Sumio*; Tsutsui, Kenji; Toyama, Takami*; Maekawa, Sadamichi; et al.
no journal, ,
