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Journal Articles

Study on gamma-ray-degradation of adsorbent for low pressure-loss extraction chromatography

Miyazaki, Yasunori; Sano, Yuichi; Okamura, Nobuo; Watanabe, Masayuki; Koka, Masashi*

QST-M-29; QST Takasaki Annual Report 2019, P. 72, 2021/03

no abstracts in English

Journal Articles

Ion beam induced luminescence of complexes formed in adsorbent for MA recovery process

Watanabe, So; Katai, Yuya*; Matsuura, Haruaki*; Kada, Wataru*; Koka, Masashi*; Sato, Takahiro*; Arai, Tsuyoshi*

Nuclear Instruments and Methods in Physics Research B, 450, p.61 - 65, 2019/07

 Times Cited Count:1 Percentile:24.18(Instruments & Instrumentation)

Journal Articles

Local structure and distribution of remaining elements inside extraction chromatography adsorbents

Watanabe, So; Sano, Yuichi; Shiwaku, Hideaki; Yaita, Tsuyoshi; Ono, Shimpei*; Arai, Tsuyoshi*; Matsuura, Haruaki*; Koka, Masashi*; Sato, Takahiro*

Nuclear Instruments and Methods in Physics Research B, 404, p.202 - 206, 2017/08

 Times Cited Count:3 Percentile:41.49(Instruments & Instrumentation)

Journal Articles

Microscopic analyses of complexes formed in adsorbent for Mo and Zr separation chromatography

Abe, Ryoji*; Nagoshi, Kohei*; Arai, Tsuyoshi*; Watanabe, So; Sano, Yuichi; Matsuura, Haruaki*; Takagi, Hideaki*; Shimizu, Nobutaka*; Koka, Masashi*; Sato, Takahiro*

Nuclear Instruments and Methods in Physics Research B, 404, p.173 - 178, 2017/08

 Times Cited Count:3 Percentile:29.35(Instruments & Instrumentation)

JAEA Reports

Light ion microbeam analysis / processing system and its improvement

Koka, Masashi; Ishii, Yasuyuki; Yamada, Naoto; Okubo, Takeru; Kada, Wataru*; Kitamura, Akane; Iwata, Yoshihiro*; Kamiya, Tomihiro; Sato, Takahiro

JAEA-Technology 2016-006, 41 Pages, 2016/03

JAEA-Technology-2016-006.pdf:14.03MB

A MeV-class light ion microbeam system has been developed for micro-analysis and micro-fabrication with high spatial resolution at 3-MV single-ended accelerator in Takasaki Ion Accelerators for Advanced Radiation Application of Takasaki Advanced Radiation Research Institute, Sector of Nuclear Science Research, Japan Atomic Energy Agency. This report describes the technical improvements for the main apparatus (the accelerator, beam-transport lines, and microbeam system), and auxiliary equipments/ parts for ion beam applications such as Particle Induced X-ray/Gamma-ray Emission (PIXE/PIGE) analysis, 3-D element distribution analysis using PIXE-Computed Tomography(CT), Ion Beam-Induced Luminescence (IBIL) analysis, and Proton Beam Writing with the microbeam scanning, with functional outline of these apparatus and equipments/parts.

Journal Articles

In-situ monitoring of ion-beam luminescence of Si-O-C(-H) ceramics under proton-beam irradiation

Narisawa, Masaki*; Koka, Masashi; Takeyama, Akinori; Sugimoto, Masaki; Idesaki, Akira; Sato, Takahiro; Hokazono, Hiroki*; Kawai, Taketoshi*; Iwase, Akihiro*

Journal of the Ceramic Society of Japan, 123(9), p.805 - 808, 2015/09

Journal Articles

Investigation of phosphor materials for the real-time measurement of the transverse intensity distribution of large-area ion beams at the JAEA AVF cyclotron facility

Yuri, Yosuke; Yuyama, Takahiro; Ishizaka, Tomohisa; Koka, Masashi; Yamada, Naoto

Proceedings of 12th Annual Meeting of Particle Accelerator Society of Japan (Internet), p.420 - 423, 2015/09

no abstracts in English

Journal Articles

Fabrication of microstructures embedded in SC-CVD diamond with a focused proton microbeam

Kada, Wataru*; Kambayashi, Yuya*; Miura, Kenta*; Saruya, Ryota*; Kubota, Atsushi*; Sato, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Hanaizumi, Osamu*

Key Engineering Materials, 643, p.15 - 19, 2015/05

Journal Articles

Development of microbeam technology to expand applications at TIARA

Kamiya, Tomihiro; Sato, Takahiro; Koka, Masashi; Kada, Wataru*

Nuclear Instruments and Methods in Physics Research B, 348, p.4 - 7, 2015/04

 Times Cited Count:5 Percentile:48.62(Instruments & Instrumentation)

Journal Articles

Development of diagnostic method for deep levels in semiconductors using charge induced by heavy ion microbeams

Kada, Wataru*; Kambayashi, Yuya*; Iwamoto, Naoya*; Onoda, Shinobu; Makino, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Hoshino, Norihiro*; Tsuchida, Hidekazu*; Kojima, Kazutoshi*; et al.

Nuclear Instruments and Methods in Physics Research B, 348, p.240 - 245, 2015/04

 Times Cited Count:4 Percentile:41.12(Instruments & Instrumentation)

Journal Articles

Development of embedded Mach-Zehnder optical waveguide structures in polydimethylsiloxane thin films by proton beam writing

Kada, Wataru*; Miura, Kenta*; Kato, Hijiri*; Saruya, Ryota*; Kubota, Atsushi*; Sato, Takahiro; Koka, Masashi; Ishii, Yasuyuki; Kamiya, Tomihiro; Nishikawa, Hiroyuki*; et al.

Nuclear Instruments and Methods in Physics Research B, 348, p.218 - 222, 2015/04

 Times Cited Count:6 Percentile:55.25(Instruments & Instrumentation)

Journal Articles

Development of a scintillator for single-ion detection

Yokoyama, Akihito; Kada, Wataru*; Sato, Takahiro; Koka, Masashi; Yamamoto, Shunya; Kamiya, Tomihiro; Yokota, Wataru

JAEA-Review 2014-050, JAEA Takasaki Annual Report 2013, P. 168, 2015/03

no abstracts in English

Journal Articles

Development of real-time position detection system for single-ion hit

Yokoyama, Akihito; Kada, Wataru*; Sato, Takahiro; Koka, Masashi; Yamamoto, Shunya; Kamiya, Tomihiro; Yokota, Wataru

Nuclear Instruments and Methods in Physics Research B, 332, p.334 - 336, 2014/08

 Times Cited Count:1 Percentile:11.8(Instruments & Instrumentation)

A system is developed for the real-time position detection of single-ions which hits a target with spatial accuracy about 1 $$mu$$m. The system combines highly luminescent, sensitive, scintillators with a high sensitivity luminescence detection system. The real-time detection system contains a Al$$_{2}$$O$$_{3}$$:Eu scintillator, Eu implanting into $$alpha$$-Al$$_{2}$$O$$_{3}$$. A single-crystal scintillator has been selected since position resolution of emission for powdery scintillator is limited by a grain size, several micrometers for ZnS for example. When the material is irradiated with an electron or ion beam, the Eu is activated and strong luminescence occurs. The detection system includes an image intensifier tube and an electron multiplier CCD camera. The results show that our system can be sufficiently sensitive to detect the hit of a single-ion in real time through simple improvement in emission intensity of the scintillator.

Journal Articles

Real-time single-ion hit position detecting system for cell irradiation

Sato, Takahiro; Koka, Masashi; Kada, Wataru*; Yokoyama, Akihito; Kamiya, Tomihiro

Nuclear Instruments and Methods in Physics Research B, 332, p.242 - 244, 2014/08

 Times Cited Count:5 Percentile:44.02(Instruments & Instrumentation)

Journal Articles

Simultaneous ion luminescence imaging and spectroscopy of individual aerosol particles with external proton or helium microbeams

Kada, Wataru*; Sato, Takahiro; Yokoyama, Akihito; Koka, Masashi; Kamiya, Tomihiro

Nuclear Instruments and Methods in Physics Research B, 332, p.42 - 45, 2014/08

 Times Cited Count:9 Percentile:65.62(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Fabrication of fine imaging devices using an external proton microbeam

Sakai, Takuro; Yasuda, Ryo; Iikura, Hiroshi; Nojima, Takehiro; Koka, Masashi; Sato, Takahiro; Ishii, Yasuyuki; Oshima, Akihiro*

Nuclear Instruments and Methods in Physics Research B, 332, p.238 - 241, 2014/08

 Times Cited Count:0 Percentile:0.02(Instruments & Instrumentation)

We have successfully fabricated novel microscopic imaging devices made from UV/EB curable resin using an external scanning proton microbeams. The devices are micro-structured fluorescent plates that consist of an array of micro-pillars that align periodically. The base material used in the pillars is UV/EB curable resin and each pillar contains phosphor grains. The pattern exposures were performed using a proton beam writing technique. The height of the pillars depends on the range of the proton beam. Optical microscopy and scanning electron microscopy have been used to characterize the samples. The results show that the fabricated fluorescent plates are expected to be high-spatial-resolution imaging devices.

Journal Articles

Continuous observation of polarization effects in thin SC-CVD diamond detector designed for heavy ion microbeam measurement

Kada, Wataru*; Iwamoto, Naoya; Sato, Takahiro; Onoda, Shinobu; Grilj, V.*; Skukan, N.*; Koka, Masashi; Oshima, Takeshi; Jak$v{s}$i$'c$, M.*; Kamiya, Tomihiro

Nuclear Instruments and Methods in Physics Research B, 331, p.113 - 116, 2014/07

 Times Cited Count:20 Percentile:87.73(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Analysis of microscopic air-bone particle by combined system of in-air micro PIXE and ion luminescence microscopic imaging and spectroscopy

Kada, Wataru*; Yokoyama, Akihito; Sato, Takahiro; Koka, Masashi; Kamiya, Tomihiro

Hoshasen To Sangyo, (136), p.40 - 45, 2014/06

no abstracts in English

Journal Articles

High-resolution ion luminescence analysis with external proton microbeam probe

Kada, Wataru; Yokoyama, Akihito; Koka, Masashi; Sato, Takahiro; Kamiya, Tomihiro

International Journal of PIXE, 23(1&2), p.47 - 53, 2014/05

no abstracts in English

Journal Articles

Magnetic patterning of FeRh thin films by energetic light ion microbeam irradiation

Koide, Tetsuya*; Sato, Takahiro; Koka, Masashi; Saito, Yuichi; Kamiya, Tomihiro; Okochi, Takuo*; Kotsugi, Masato*; Kinoshita, Toyohiko*; Nakamura, Tetsuya*; Iwase, Akihiro*; et al.

Japanese Journal of Applied Physics, 53(5S1), p.05FC06_1 - 05FC06_4, 2014/05

 Times Cited Count:9 Percentile:44.13(Physics, Applied)

We previously reported that the magnetic state of FeRh can be controlled by irradiation with ion beams. In this paper, we evaluate possibility of magnetic patterning on FeRh thin films using energetic light ion microbeam irradiation with various shapes and dimensions. Proton microbeam irradiation with 2 MeV was performed at JAEA-Takasaki to produce micron-sized magnetic patterns. XMCD-PEEM observation was performed at SPring8 to confirm the synthesized magnetic patterns. As a result, the XMCD-PEEM images of the various micrometer sized patters in FeRh film were observed using 2 MeV H ion beam. The observed bright regions are considered to have ferromagnetic spin orders, in contrast that the gray areas have anti-ferromagnetic spin order. Since the brightness of the PEEM images is strongly correlated with the magnetization of the samples, we reveal that the magnetic state in local regions of the FeRh thin films can be controlled by changing the ion fluences.

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