Magnetic patterning of FeRh thin films by energetic light ion microbeam irradiation

Koide, Tetsuya*; Sato, Takahiro; Koka, Masashi; Saito, Yuichi; Kamiya, Tomihiro; Okochi, Takuo*; Kotsugi, Masato*; Kinoshita, Toyohiko*; Nakamura, Tetsuya*; Iwase, Akihiro*; et al.

Japanese Journal of Applied Physics, 53(5S1), p.05FC06_1 - 05FC06_4, 2014/05

https://doi.org/10.7567/JJAP.53.05FC06

We previously reported that the magnetic state of FeRh can be controlled by irradiation with ion beams. In this paper, we evaluate possibility of magnetic patterning on FeRh thin films using energetic light ion microbeam irradiation with various shapes and dimensions. Proton microbeam irradiation with 2 MeV was performed at JAEA-Takasaki to produce micron-sized magnetic patterns. XMCD-PEEM observation was performed at SPring8 to confirm the synthesized magnetic patterns. As a result, the XMCD-PEEM images of the various micrometer sized patters in FeRh film were observed using 2 MeV H ion beam. The observed bright regions are considered to have ferromagnetic spin orders, in contrast that the gray areas have anti-ferromagnetic spin order. Since the brightness of the PEEM images is strongly correlated with the magnetization of the samples, we reveal that the magnetic state in local regions of the FeRh thin films can be controlled by changing the ion fluences.

MFM and PEEM observation of micrometre-sized magnetic dot arrays fabricated by ion-microbeam irradiation in FeRh thin films

Aiko, Kazuma*; Toki, Atsushi*; Matsui, Toshiyuki*; Iwase, Akihiro*; Sato, Takahiro; Takano, Katsuyoshi*; Koka, Masashi; Saito, Yuichi; Kamiya, Tomihiro; Okochi, Takuo*; et al.

Journal of Synchrotron Radiation, 19(2), p.223 - 226, 2012/03

https://doi.org/10.1107/S0909049511054057

Control of epitaxy of graphene by crystallographic orientation of a Si substrate toward device applications

Fukidome, Hirokazu*; Takahashi, Ryota*; Abe, Shunsuke*; Imaizumi, Kei*; Handa, Hiroyuki*; Kang, H. C.*; Karasawa, Hiromi*; Suemitsu, Tetsuya*; Otsuji, Taiichi*; Enta, Yoshiharu*; et al.

Journal of Materials Chemistry, 21(43), p.17242 - 17248, 2011/11

https://doi.org/10.1039/c1jm12921j

Performance of a very high resolution soft X-ray beamline BL25SU with a twin-helical undulator at SPring-8

Saito, Yuji; Kimura, Hiroaki*; Suzuki, Yoshio*; Nakatani, Takeshi*; Matsushita, Tomohiro*; Muro, Takayuki*; Miyahara, Tsuneaki*; Fujisawa, M.*; Soda, Kazuo*; Ueda, Shigenori*; et al.

Review of Scientific Instruments, 71(9), p.3254 - 3259, 2000/09

https://doi.org/10.1063/1.1287626

no abstracts in English

LEED and SR-XPS observations of graphene formation processes on 3C-SiC(100)/Si(100) thin film

Inomata, Shuya*; Handa, Hiroyuki*; Abe, Shunsuke*; Takahashi, Ryota*; Imaizumi, Kei*; Fukidome, Hirokazu*; Teraoka, Yuden; Yoshigoe, Akitaka; Kotsugi, Masato*; Okochi, Takuo*; et al.

no journal, , 

no abstracts in English

Surface-chemical bonding states of rotated epitaxial thin film of 3C-SiC(111)/Si(110)

Sambonsuge, Shota*; Abe, Shunsuke*; Takahashi, Ryota*; Imaizumi, Kei*; Handa, Hiroyuki*; Yoshigoe, Akitaka; Teraoka, Yuden; Kotsugi, Masato*; Okochi, Takuo*; Kinoshita, Toyohiko*; et al.

no journal, , 

no abstracts in English