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Hirahara, Toru*; Otrokov, M. M.*; Sasaki, Taisuke*; Sumida, Kazuki*; Tomohiro, Yuta*; Kusaka, Shotaro*; Okuyama, Yuma*; Ichinokura, Satoru*; Kobayashi, Masaki*; Takeda, Yukiharu; et al.
Nature Communications (Internet), 11, p.4821_1 - 4821_8, 2020/09
Times Cited Count:47 Percentile:92.16(Multidisciplinary Sciences)Shikin, A. M.*; Estyunin, D. A.*; Klimovskikh, I. I.*; Filnov, S. O.*; Kumar, S.*; Schwier, E. F.*; Miyamoto, Koji*; Okuda, Taichi*; Kimura, Akio*; Kuroda, Kenta*; et al.
Scientific Reports (Internet), 10, p.13226_1 - 13226_13, 2020/08
Times Cited Count:69 Percentile:95.73(Multidisciplinary Sciences)Kuroda, Junya*; Manabe, Seiya*; Watanabe, Yukinobu*; Ito, Kojiro*; Liao, W.*; Hashimoto, Masanori*; Abe, Shinichiro; Harada, Masahide; Oikawa, Kenichi; Miyake, Yasuhiro*
IEEE Transactions on Nuclear Science, 67(7), p.1599 - 1605, 2020/07
Times Cited Count:4 Percentile:37.85(Engineering, Electrical & Electronic)Soft errors induced by terrestrial radiation in semiconductor devices have been of concern from the viewpoint of their reliability. Generally, to evaluate the soft error rates (SERs), neutron irradiation tests are performed at neutron facility. We have performed SER measurement for the 65-nm bulk SRAM and the FDSOI SRAM at RCNP in Osaka University and CYRIC in Tohoku University. In this study, we performed SER measurement for the same devices at BL10 in J-PARC MLF. The increasing rate of SER by reducing the supply voltage at J-PARC BL10 is larger than those obtained at RCNP and CYRIC. From PHITS simulation, the cause of this difference can be explained by the influence of the protons generated by neutron elastic scattering with hydrogen atoms in the package resin.
Abe, Shinichiro; Sato, Tatsuhiko; Kuroda, Junya*; Manabe, Seiya*; Watanabe, Yukinobu*; Liao, W.*; Ito, Kojiro*; Hashimoto, Masanori*; Harada, Masahide; Oikawa, Kenichi; et al.
Proceedings of IEEE International Reliability Physics Symposium (IRPS 2020) (Internet), 6 Pages, 2020/04
Times Cited Count:2 Percentile:58.01(Engineering, Electrical & Electronic)Single event upsets (SEUs) caused by neutrons have been recognized as a serious reliability problem for microelectronic devices on the ground level. In our previous work, it was found that hydride placed in front of the memory chip has considerably impact on SEU cross sections because H ions generated via elastic scattering of neutrons with hydrogen atoms are only emitted in a forward direction. In this study, the effect of components neighboring transistors on neutron-induced SEUs was investigated for 65-nm bulk SRAMs by using PHITS. It was found that the shape of the SEU cross section around few MeV comes from the thickness and the position of components placed in front of transistors when that components do not contains hydrogen atoms. By considering components adjoin memory cells in the test board used in the simulation, measured data at J-PARC BL10 were reproduced well. In addition, it was found that the effect of components neighboring transistors on neutron-induced SERs does not negligible in terrestrial environment.
Ohara, Takashi; Kiyanagi, Ryoji; Oikawa, Kenichi; Kaneko, Koji; Kawasaki, Takuro; Tamura, Itaru; Nakao, Akiko*; Hanashima, Takayasu*; Munakata, Koji*; Moyoshi, Taketo*; et al.
Journal of Applied Crystallography, 49(1), p.120 - 127, 2016/02
Times Cited Count:56 Percentile:95.92(Chemistry, Multidisciplinary)Ye, M.*; Kuroda, Kenta*; Takeda, Yukiharu; Saito, Yuji; Okamoto, Kazuaki*; Zhu, S.-Y.*; Shirai, Kaito*; Miyamoto, Koji*; Arita, Masashi*; Nakatake, Masashi*; et al.
Journal of Physics; Condensed Matter, 25(23), p.232201_1 - 232201_5, 2013/06
Times Cited Count:12 Percentile:47.35(Physics, Condensed Matter)no abstracts in English
Ye. M.*; Eremeev, S. V.*; Kuroda, Kenta*; Krasovskii, E. E.*; Chulkov, E. V.*; Takeda, Yukiharu; Saito, Yuji; Okamoto, Kazuaki*; Zhu, S. Y.*; Miyamoto, Koji*; et al.
Physical Review B, 85(20), p.205317_1 - 205317_5, 2012/05
Times Cited Count:63 Percentile:88.98(Materials Science, Multidisciplinary)no abstracts in English
Sakakibara, Tetsuro; Tsutomu, Tanabe,; Takahashi, Kuniaki; Akutsu, Shigeru; Kojima, Hiroshi; Sakashita, Akira*; Kuroda, Kazuhiko*
Proceedings of International Waste Management Symposium 2005 (WM 2005), 0 Pages, 2005/00
Focusing on the cover layer materials (as the Radon Barrier Materials), which could have the effect to restrain the radon from scattering into the air and the effect of the radiation shielding, we produced the radon barrier materials with crude bentonite on an experimental basis, using the rotary type comprehensive unit for grinding and mixing, through which we carried out the evaluation of the characteristics thereof.
Otaka, Osamu*; Fukui, Hiroyuki*; Kunisada, Taichi*; Fujisawa, Tomoyuki*; Funakoshi, Kenichi*; Utsumi, Wataru; Irifune, Tetsuo*; Kuroda, Koji*; Kikegawa, Takumi*
Physical Review B, 63(17), p.174108_1 - 174108_8, 2001/05
Times Cited Count:137 Percentile:97.03(Materials Science, Multidisciplinary)no abstracts in English
Kuroda, Koji*; Irifune, Tetsuo*; Inoue, Toru*; Nishiyama, Norimasa*; Miyashita, Minoru*; Funakoshi, Kenichi*; Utsumi, Wataru
Physics and Chemistry of Minerals, 27(8), p.523 - 532, 2000/09
Times Cited Count:40 Percentile:76.49(Materials Science, Multidisciplinary)no abstracts in English
Irifune, Tetsuo*; Nishiyama, Norimasa*; Kuroda, Koji*; Inoue, Toru*; Isshiki, Maiko*; Utsumi, Wataru; Funakoshi, Kenichi*; Urakawa, Satoru*; Uchida, Takeyuki*; Katsura, Tomoo*; et al.
Science, 279(5357), p.1698 - 1700, 1998/03
Times Cited Count:210 Percentile:93.46(Multidisciplinary Sciences)no abstracts in English
Irifune, Tetsuo*; Kuroda, Koji*; Nishiyama, Norimasa*; Inoue, Toru*; Funamori, Nobumasa*; Uchida, Takeyuki*; Yagi, Takehiko*; Utsumi, Wataru; Miyajima, Nobuyoshi*; Fujino, Kiyoshi*; et al.
Geophysical Monograph 101 (Properties of Earth and Planetary Materials at High Pressure and Temperature), p.1 - 8, 1998/00
no abstracts in English
Ohara, Takashi; Kiyanagi, Ryoji; Nakao, Akiko*; Munakata, Koji*; Moyoshi, Taketo*; Moriyama, Kentaro*; Hanashima, Takayasu*; Kuroda, Tetsuya*
no journal, ,
Kino, Kenichiro*; Saigusa, Moriyuki*; Sakashita, Akira*; Kuroda, Kazuhiko*; Sakakibara, Tetsuro; Kohanawa, Osamu; Akutsu, Shigeru; Kojima, Hiroshi
no journal, ,
no abstracts in English
Ohara, Takashi; Kiyanagi, Ryoji; Hanashima, Takayasu*; Moyoshi, Taketo*; Nakao, Akiko*; Munakata, Koji*; Kuroda, Tetsuya*
no journal, ,
no abstracts in English
Kiyanagi, Ryoji; Ohara, Takashi; Nakao, Akiko*; Hanashima, Takayasu*; Munakata, Koji*; Moyoshi, Taketo*; Kuroda, Tetsuya*; Tamura, Itaru; Oikawa, Kenichi; Kaneko, Koji; et al.
no journal, ,
SENJU is a TOF-Laue type neutron single crystal diffractometer built at BL18 in J-PARC/MLF and has been in operation since 2012. This instrument is designed to perform precise structure analyses of inorganic materials, small molecular materials and magnetic materials under special environment. With this instrument, highly efficient measurements of a small single crystal can be achieved utilizing the high flux white neutrons provided by J-PARC and multiple 2-dimentional detectors. 4K-cryostat is one of the most commonly used sample environment devices which is equipped with a 2-axis rotators at the cold head. Owing to this functionality, one can measure several different orientations of a sample without moving the cryostat nor without taking the sample out. The superconducting magnet which can generate 7T at most offers very clean data since no Bragg reflections originated from the magnet appear in the low-momentum transfer region. The measured data will be analyzed with a software called STARGazer, which can cover the visualization of the data, data reduction to histogram files, determination of the orientation matrixes and integration of peak intensity for further structure analyses.
Ohara, Takashi; Hanashima, Takayasu*; Munakata, Koji*; Moyoshi, Taketo*; Kiyanagi, Ryoji; Nakao, Akiko*; Kuroda, Tetsuya*
no journal, ,
no abstracts in English
Ohara, Takashi; Hanashima, Takayasu*; Munakata, Koji*; Moyoshi, Taketo*; Kiyanagi, Ryoji; Nakao, Akiko*; Kuroda, Tetsuya*
no journal, ,
Kiyanagi, Ryoji; Noda, Yukio*; Ohara, Takashi; Kawasaki, Takuro; Oikawa, Kenichi; Kaneko, Koji; Tamura, Itaru; Hanashima, Takayasu*; Moyoshi, Taketo*; Nakao, Akiko*; et al.
no journal, ,
no abstracts in English
Sakakibara, Tetsuro; Kohanawa, Osamu; Akutsu, Shigeru; Kojima, Hiroshi; Sakashita, Akira*; Kuroda, Kazuhiko*; Kino, Kenichiro*; Saigusa, Moriyuki*
no journal, ,
no abstracts in English