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Journal Articles

SIMS analyses of SiO$$_{2}$$/4H-SiC(0001) interface

Yamashita, Kenya*; Kitabatake, Makoto*; Kusumoto, Osamu*; Takahashi, Kunimasa*; Uchida, Masao*; Miyanaga, Ryoko*; Ito, Hisayoshi; Yoshikawa, Masahito

Materials Science Forum, 389-393, p.1037 - 1040, 2002/00

https://doi.org/10.4028/www.scientific.net/MSF.389-393.1037
 Times Cited Count：3 Percentile：15.53(Materials Science, Multidisciplinary)

no abstracts in English

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