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Sugano, Michinaka*; Machiya, Shutaro*; Shobu, Takahisa; Shiro, Ayumi*; Kajiwara, Kentaro*; Nakamoto, Tatsushi*
Superconductor Science and Technology, 33(8), p.085003_1 - 085003_10, 2020/08
Times Cited Count:3 Percentile:17.39(Physics, Applied)Osamura, Kozo*; Machiya, Shutaro*; Kajiwara, Kentaro*; Kawasaki, Takuro; Harjo, S.; Zhang, Y.*; Fujita, Shinji*; Iijima, Yasuhiro*; Hampshire, D. P.*
AIP Advances (Internet), 9(7), p.075216_1 - 075216_11, 2019/07
Times Cited Count:7 Percentile:44.15(Nanoscience & Nanotechnology)Osamura, Kozo*; Machiya, Shutaro*; Kawasaki, Takuro; Harjo, S.; Kato, Takeshi*; Kobayashi, Shinichi*; Osabe, Goro*
Materials Research Express (Internet), 6(2), p.026001_1 - 026001_13, 2019/02
Times Cited Count:4 Percentile:22.03(Materials Science, Multidisciplinary)Tanaka, Keisuke*; Koike, Yuki*; Sano, Katsuki*; Tanaka, Hiroto*; Machiya, Shutaro*; Shobu, Takahisa; Kimachi, Hirohisa*
Zairyo, 64(7), p.528 - 535, 2015/07
no abstracts in English
Osamura, Kozo*; Machiya, Shutaro*; Hampshire, D. P.*; Tsuchiya, Yoshinori*; Shobu, Takahisa; Kajiwara, Kentaro*; Osabe, Goro*; Yamazaki, Kohei*; Yamada, Yuichi*; Fujikami, Jun*
Superconductor Science and Technology, 27(8), p.085005_1 - 085005_11, 2014/08
Times Cited Count:26 Percentile:73.45(Physics, Applied)Harjo, S.; Hemmi, Tsutomu; Abe, Jun; Gong, W.; Nunoya, Yoshihiko; Aizawa, Kazuya; Ito, Takayoshi*; Koizumi, Norikiyo; Machiya, Shutaro*; Osamura, Kozo*
Materials Science Forum, 777, p.84 - 91, 2014/02
Times Cited Count:2 Percentile:74.69Hemmi, Tsutomu; Harjo, S.; Kajitani, Hideki; Nabara, Yoshihiro; Takahashi, Yoshikazu; Nunoya, Yoshihiko; Koizumi, Norikiyo; Abe, Jun; Gong, W.; Aizawa, Kazuya; et al.
KEK Progress Report 2013-4, p.45 - 47, 2013/11
The gradual degradation was observed in the results for ITER CS conductor samples. To investigate its origin, the internal strain in the sample after the testing was successfully measured using a neutron diffraction technique non-destructively. Up to now, the transverse electromagnetic loading has been considered as an origin of the degradation due to the local bending at the high loading side (HLS). However, as a result of the neutron diffraction measurement, the large bending at the LLS of the HFZ was found. The large bending was considered as an origin of the strand buckling due to the large void generated by the transverse electromagnetic loading and the thermally induced residual compressive strain. For the improvement of the conductor performance on the strand buckling, the shorter twisting pitch (STP) can be considered. The result of the SULTAN testing of the conductor sample with STP found very effective, and the performance degradation was negligible.
Hemmi, Tsutomu; Harjo, S.; Nunoya, Yoshihiko; Kajitani, Hideki; Koizumi, Norikiyo; Aizawa, Kazuya; Machiya, Shutaro*; Osamura, Kozo*
Superconductor Science and Technology, 26(8), p.084002_1 - 084002_6, 2013/08
Times Cited Count:14 Percentile:55.09(Physics, Applied)JAEA has responsibly to procure all ITER CS conductors. Several conductor samples was fabricated and tested. From the result of the cyclic testing in first conductor sample named JACS01 and second conductor sample named JACS02, the continuous linear degradation of the current sharing temperature () was observed. To investigate the
degradation, the visual inspection of JACS01 right leg was performed. As a result, the large deflection at the lower loading side (LLS) in the high field zone (HFZ) was observed. The bending strain of the strands cannot be evaluated from the only deflection obtained by a visual inspection. To evaluate the strain of strands in the conductor sample quantitatively, the neutron diffraction measurement of JACS01 left leg was performed using the engineering materials diffractometer in J-PARC. From the result, the large bending strain at the LLS in the HFZ was observed. Therefore, the degraded position in the conductor sample can be determined.
Osamura, Kozo*; Machiya, Shutaro*; Tsuchiya, Yoshinori*; Suzuki, Hiroshi; Shobu, Takahisa; Sato, Masugu*; Hemmi, Tsutomu; Nunoya, Yoshihiko; Ochiai, Shojiro*
Superconductor Science and Technology, 25(5), p.054010_1 - 054010_9, 2012/05
Times Cited Count:17 Percentile:59.07(Physics, Applied)Hemmi, Tsutomu; Harjo, S.; Ito, Takayoshi; Matsui, Kunihiro; Nunoya, Yoshihiko; Koizumi, Norikiyo; Takahashi, Yoshikazu; Nakajima, Hideo; Aizawa, Kazuya; Suzuki, Hiroshi; et al.
IEEE Transactions on Applied Superconductivity, 21(3), p.2028 - 2031, 2011/06
Times Cited Count:10 Percentile:50.78(Engineering, Electrical & Electronic)Residual strain in conductors is caused by the difference in the coefficient of expansion between NbSn strands and the jacket over a temperature range of 5 - 923 K. The superconducting properties of strands vary significantly, depending on the strain. It is important to clarify the residual strain as part of the evaluation of superconducting performance. However, the residual strain of strands in the conductor has not been measured so far because of their complicated configuration and their location in a jacket. The engineering materials diffractometer "Takumi" in J-PARC can measure residual strain with a relative accuracy of around 0.02%, using neutron diffraction. In this study, the Takumi was applied to the measurement of residual strain in strands for the ITER TF conductor. Results indicate that the residual strain of strands in the conductor can be determined, thereby clarifying the mechanism of residual strain and its relationship to superconducting performance.
Ito, Takayoshi; Harjo, S.; Osamura, Kozo*; Hemmi, Tsutomu; Awaji, Satoshi*; Machiya, Shutaro*; Oguro, Hidetoshi*; Nishijima, Gen*; Takahashi, Koki*; Matsui, Kunihiro; et al.
Materials Science Forum, 681, p.209 - 214, 2011/05
Times Cited Count:1 Percentile:54.51Osamura, Kozo*; Machiya, Shutaro*; Tsuchiya, Yoshinori*; Suzuki, Hiroshi
Superconductor Science and Technology, 23(4), p.045020_1 - 045020_7, 2010/04
Times Cited Count:29 Percentile:74.04(Physics, Applied)The stress/strain behavior of the surround Cu stabilized YBCO coated conductors and its influence on critical current were precisely investigated. The internal strain exerted on the superconducting YBCO layer was determined at 77 K by using a neutron diffraction technique at JAEA. The initial compressive strain decreased during tensile loading and changed to a tensile component at the force free strain (A), where the internal uniaxial stress becomes zero in the YBCO layer. The A
was evaluated to be 0.19-0.21% at 77 K. The critical current measurements were carried out under a uniaxial tensile load at 77 K. The strain dependence revealed a characteristic behavior, where a maximum was observed at 0.035%. Thus it was made clear that the strain at the critical current maximum does not correlate with A
for YBCO coated conductors.
Tsuchiya, Yoshinori*; Suzuki, Hiroshi; Umeno, Takahiro*; Machiya, Shutaro*; Osamura, Kozo*
Measurement Science and Technology, 21(2), p.025904_1 - 025904_4, 2010/01
Times Cited Count:17 Percentile:71.77(Engineering, Multidisciplinary)Strain measurements under loading at cryogenic temperatures are much requested for investigation of the stress/strain effect on the critical current for composite superconductors. In order to provide in-situ measurements of the lattice strain, a cryogenic load frame with a GM refrigerator has been developed, which is suitable for the neutron diffraction facility RESA equipped at JRR-3 in JAEA. The lowest temperature of 4.8 K was achieved, while the capacity of the load frame was 10 kN. Using the present cryogenic load frame, plane spacing measurement was performed under loading for two specified samples of 316 stainless steel and engineering YBCO coated conductor. The relation between applied stress/strain and lattice strain has been made clear in a wide range of temperatures.
Machiya, Shutaro; Osamura, Kozo*; Suzuki, Hiroshi; Shiota, Yoshinori*; Ayai, Naoki*; Hayashi, Kazuhiko*; Sato, Kenichi*
no journal, ,
In situ strain measurement was made for inner Bi2223 filaments and outer Ag alloy in the Ag-sheathed Bi2223 tapes using neutron diffraction. The residual strain and the strain response under the axial tensile loading were measured in the Ag-sheathed Bi2223 tapes stacked with 10 sheets.
Machiya, Shutaro; Osamura, Kozo*; Suzuki, Hiroshi; Ayai, Naoki*; Hayashi, Kazuhiko*; Sato, Kenichi*; Kato, Takeshi*
no journal, ,
no abstracts in English
Saito, Toru; Terakado, Katsuyoshi*; Ishibashi, Toshihiro*; Katayanagi, Kazue*; Machiya, Shutaro; Tomota, Yo*
no journal, ,
no abstracts in English
Suzuki, Hiroshi; Machiya, Shutaro; Akiniwa, Yoshiaki; Kasahara, Naoto; Kisohara, Naoyuki
no journal, ,
no abstracts in English
Machiya, Shutaro; Osamura, Kozo*; Suzuki, Hiroshi; Ayai, Naoki*; Kato, Takeshi*; Hayashi, Kazuhiko*; Sato, Kenichi*
no journal, ,
no abstracts in English
Machiya, Shutaro; Suzuki, Hiroshi; Saito, Toru; Katsuyama, Jinya; Morii, Yukio
no journal, ,
no abstracts in English
Suzuki, Hiroshi; Saito, Toru; Machiya, Shutaro; Morii, Yukio
no journal, ,
Neutron Diffractometer for Residual Stress Analysis (RESA) installed in JRR-3 of JAEA has been used mainly for the stress or the strain measurement for sample of small or medium size so far. However, the experiment number of stress measurements for the large structure increases as the number of industrial applications increases in recent years. As a result, overcrowded machine time and lack of measuring time, etc. have been caused. It is necessary to develop a highly effective, highly accurate neutron stress measurement technology to solve these various problems. One of the upgrades is development of the asymmetric monochromator system. In this research, the diffraction characteristic of the silicon crystal of the asymmetric diffraction type was evaluated. As a result, the increasing rate of the diffracted intensity that had been obtained by the experiment correspond with the increasing rate calculated from the theory.