Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes

Hazama, Masatoshi*; Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Makino, Takahiro; Hirao, Toshio*; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*; et al.

Proceedings of 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-10) (Internet), p.115 - 118, 2012/12

Evaluation of soft errors using nuclear probes in SOI SRAM with body-tie structure fabricated by partial trench isolation

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Makino, Takahiro; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*; Takai, Mikio*

Proceedings of 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-9), p.72 - 75, 2010/10

no abstracts in English

Sedimentological time-averaging and C dating of marine shells

Fujiwara, Osamu; Kamataki, Takanobu*; Masuda, Fujio*

Nuclear Instruments and Methods in Physics Research B, 223-224, p.540 - 544, 2004/08

https://doi.org/10.1016/j.nimb.2004.04.101

The radiocarbon dating of sediments using marine shells involves uncertainties due to the mixed ages of the shells mainly attributed to depositional processes also known as sedimentological time-averaging. This stratigraphic disorder can be removed by selecting the well-preserved indigenous shells based on ecological and taphonomic criteria. These criteria on sample selection are recommended for accurate estimation of the depositional age of geologic strata from 14C dating of marine shells.

Paleoenvironmental changes during the last post glacial period on the western coast of the Miura Peninsula, Kanagawa Prefecture, Central Japan; Fossil ostracode fauna and event deposits in bore hole cores

Irizuki, Toshiaki*; Fujiwara, Osamu; Fuse, Keisuke*; Masuda, Fujio*

Kaseki, (64), p.1 - 22, 1998/07

http://ci.nii.ac.jp/naid/110002703652

None

Soft error rate in SOI SRAM with technology node of 90 nm using oxygen ion probe

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Takai, Mikio*; Hirao, Toshio; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*

no journal, , 

no abstracts in English