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Matsuo, Yoji*; Hoshiyama, Takuya*; Mori, Shigeo*; Yoshii, Kenji; Michiue, Yuichi*; Kambe, Takashi*; Ikeda, Naoshi*; Brown, F.*; Kimizuka, Noboru*
Japanese Journal of Applied Physics, 48(9), p.09KB04_1 - 09KB04_3, 2009/10
Times Cited Count:1 Percentile:5.01(Physics, Applied)We have investigated an average crystal structure and microstructures in LuFe
Ti
O
by the transmission electron microscopy (TEM), in combination with the dielectric measurements. In this work, high-qualitypolycrystalline samples of LuFe
Ti
O
were successfully synthesized in air by the conventional solid state reaction. The average crystal structure at room temperature is characterized by the hexagonal structure (space group:
6
cm). Dielectric measurements revealed that LuFe
Ti
O
shows broad dielectric dispersion around 570 K, which should originate from the formation of the polar domain structures on the nanometer scale.
Ti
O
(R=Lu,Yb)Hoshiyama, Takuya*; Mori, Shigeo*; Matsuo, Yoji*; Funae, Takeshi*; Kambe, Takashi*; Ikeda, Naoshi*; Kimizuka, Noboru*; Yoshii, Kenji; Michiue, Yuichi*
no journal, ,
We have investigated the crystal structure and physical properties of RFe
Ti
O
(R=Lu,Yb). The samples were prepared by the solid-state reaction method in air. X-ray and electron diffraction measurements showed that the materials have the same crystal structure as that of multiferroic RMnO
. Magnetic measurements showed the absence of magnetic transition below 400 K. Dielectric measurements showed the peak of dielectric constant above room temperature, suggesting a existence of ferroelectric phase transition at high temperatures.