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Journal Articles

Evaluation of element circuits constructing new radiation hardened SOI FPGAs

Shindo, Hiroyuki*; Midorikawa, Masahiko*; Sato, Yohei*; Kuboyama, Satoshi*; Hirao, Toshio; Oshima, Takeshi

JAEA-Review 2008-055, JAEA Takasaki Annual Report 2007, P. 5, 2008/11

no abstracts in English

Journal Articles

Optimization for SEU/SET immunity on 0.15 $$mu$$m fully depleted CMOS/SOI digital logic devices

Makihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.

Proceedings of 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-7), p.95 - 98, 2006/10

no abstracts in English

Journal Articles

Measurements of the depth profile of the refractive indices in oxide films on SiC by spectroscopic ellipsometry

Iida, Takeshi*; Tomioka, Yuichi*; Yoshimoto, Kimihiro*; Midorikawa, Masahiko*; Tsukada, Hiroyuki*; Orihara, Misao*; Hijikata, Yasuto*; Yaguchi, Hiroyuki*; Yoshikawa, Masahito; Ito, Hisayoshi; et al.

Japanese Journal of Applied Physics, Part 1, 41(2A), p.800 - 804, 2002/02

 Times Cited Count:15 Percentile:52.3(Physics, Applied)

no abstracts in English

Journal Articles

Characterization of the interfaces between SiC and oxide films by spectroscopic ellipsometry

Tomioka, Yuichi*; Iida, Takeshi*; Midorikawa, Masahiko*; Tsukada, Hiroyuki*; Yoshimoto, Kimihiro*; Hijikata, Yasuto*; Yaguchi, Hiroyuki*; Yoshikawa, Masahito; Ishida, Yuki*; Kosugi, Ryoji*; et al.

Materials Science Forum, 389-393, p.1029 - 1032, 2002/00

 Times Cited Count:4 Percentile:20.33(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

The Investigation of 4H-SiC/SiO$$_{2}$$ interfaces by optical and electrical measurements

Ishida, Yuki*; Takahashi, Tetsuo*; Okumura, Hajime*; Jikimoto, Tamotsu*; Tsuchida, Hidekazu*; Yoshikawa, Masahito; Tomioka, Yuichi*; Midorikawa, Masahiko*; Hijikata, Yasuto*; Yoshida, Sadafumi*

Materials Science Forum, 389-393, p.1013 - 1016, 2002/00

 Times Cited Count:4 Percentile:20.33(Materials Science, Multidisciplinary)

no abstracts in English

Oral presentation

Technologies of radiation hardness for deep submicron semiconductor devices; Development of rad-hard high-speed logic circuit using SOI technology

Shindo, Hiroyuki*; Sato, Yohei*; Midorikawa, Masahiko*; Kuboyama, Satoshi*; Makihara, Akiko*; Hirao, Toshio; Ito, Hisayoshi

no journal, , 

no abstracts in English

Oral presentation

Optimization for SEU/SET immunity on 0.15$$mu$$m fully depleted CMOS/SOI digital logic devices

Makihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.

no journal, , 

no abstracts in English

Oral presentation

The Present status and prospect of the development of space LSIs using SOI substrates

Kuboyama, Satoshi*; Shindo, Hiroyuki*; Midorikawa, Masahiko*; Sato, Yohei*; Oshima, Takeshi; Hirao, Toshio; Yokose, Tamotsu*; Makihara, Akiko*

no journal, , 

no abstracts in English

Oral presentation

Evaluation of new SOI FPGA element circuits with radiation hardness

Shindo, Hiroyuki*; Midorikawa, Masahiko*; Sato, Yohei*; Kuboyama, Satoshi*; Hirao, Toshio

no journal, , 

no abstracts in English

9 (Records 1-9 displayed on this page)
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