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Si
without local inversion symmetryNakamura, Shota*; Hyodo, Kazushi*; Matsumoto, Yuji*; Haga, Yoshinori; Sato, Hitoshi*; Ueda, Shigenori*; Mimura, Kojiro*; Saiki, Katsuyoshi*; Iso, Kosei*; Yamashita, Minoru*; et al.
Journal of the Physical Society of Japan, 89(2), p.024705_1 - 024705_5, 2020/02
Times Cited Count：2 Percentile：16.33(Physics, Multidisciplinary)
studied by photoemission and soft X-ray absorption spectroscopiesUtsumi, Yuki*; Sato, Hitoshi*; Kurihara, Hidenao*; Maso, Hiroyuki*; Hiraoka, Koichi*; Kojima, Kenichi*; Tobimatsu, Komei*; Okochi, Takuo*; Fujimori, Shinichi; Takeda, Yukiharu; et al.
Physical Review B, 84(11), p.115143_1 - 115143_7, 2011/09
Times Cited Count：13 Percentile：46.95(Materials Science, Multidisciplinary)We have studied conduction-band (CB) electronic states of a typical valence-transition compound YbInCu by means of temperature-dependent hard X-ray photoemission spectroscopy (HX-PES), soft X-ray absorption spectroscopy (XAS), and soft X-ray photoemission spectroscopy (SX-PES) of the valence band. We have described the valence transition in YbInCu in terms of the charge transfer from the CB to Yb 4
states.
by X-ray fluorescence holographyMimura, Kojiro*; Hosokawa, Shinya*; Happo, Naohisa*; Hu, W.; Hayashi, Koichi*; Wakita, Kazuki*; Ishii, Hirofumi*; Yoshimura, Masato*; Jeyakanthan, J.*; Mamedov, N.*
e-Journal of Surface Science and Nanotechnology (Internet), 9, p.273 - 276, 2011/07
thermoelectric material obtained by X-ray fluorescence holographyHosokawa, Shinya*; Happo, Naohisa*; Hayashi, Koichi*; Mimura, Kojiro*; Wakita, Kazuki*; Hu, W.; Ishii, Hirofumi*; Yoshimura, Masato*; Jeyakanthan, J.*; Mamedov, N.*
Japanese Journal of Applied Physics, 50(5), p.05FC06_1 - 05FC06_2, 2011/05
Times Cited Count：8 Percentile：32.87(Physics, Applied)Si studied using resonant hard X-ray photoemission spectroscopyKusatake, Ryota*; Kamioka, Shunsuke*; Shimooka, Kaisei*; Yasui, Akira*; Kawamura, Naomi*; Sasabe, Norimasa*; Mizumaki, Masaichiro*; Hirose, Yusuke; Settai, Rikio*; Uozumi, Takayuki*; et al.
no journal, ,
no abstracts in English
Si investigated using resonant hard X-ray photoemission spectroscopyKamioka, Shunsuke*; Kusatake, Ryota*; Shimooka, Kaisei*; Yasui, Akira*; Kawamura, Naomi*; Sasabe, Norimasa*; Mizumaki, Masaichiro*; Hirose, Yusuke; Settai, Rikio*; Uozumi, Takayuki*; et al.
no journal, ,
no abstracts in English
