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Journal Articles

Applicability of redundant pairs of SOI transistors for analog circuits and their applications to phase-locked loop circuits

Makihara, Akiko*; Yokose, Tamotsu*; Tsuchiya, Yoshihisa*; Miyazaki, Yoshio*; Abe, Hiroshi; Shindo, Hiroyuki*; Ebihara, Tsukasa*; Maru, Akifumi*; Morikawa, Koichi*; Kuboyama, Satoshi*; et al.

IEEE Transactions on Nuclear Science, 60(1), p.230 - 235, 2013/02

 Times Cited Count:6 Percentile:43.8(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

Applicability of redundant pairs of SOI transistors for analog circuits

Makihara, Akiko*; Yokose, Tamotsu*; Tsuchiya, Yoshihisa*; Tani, Koichi*; Morimura, Tadaaki*; Abe, Hiroshi; Shindo, Hiroyuki*; Ebihara, Tsukasa*; Maru, Akifumi*; Morikawa, Koichi*; et al.

Proceedings of 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-10) (Internet), p.119 - 122, 2012/12

no abstracts in English

Oral presentation

Latest slip plane and mass transfer in the basement rock; An Example of the Atera fault

Otani, Tomoyuki*; Morikawa, Koichiro*; Kojima, Satoru*; Kakamu, Kazuhiko

no journal, , 

Mass transfer along the latest slip plane is examined by geological, petrological and geochemical studies in a fracture zone outcrop of the Atera Fault, which is displaced in 1586 Tensho Earthquake. Whole rock chemical composition shows that the sharp dark brownish gouge is remarkably Mn-rich compared to other gouges and host rocks. The fact indicates that Mn-oxides or -hydroxides were precipitated due to the latest slip along the dark brownish gouge.

Oral presentation

Study on the noble metals sedimentation behavior in the melted glass

Morikawa, Yo; Miyauchi, Atsushi; Nakajima, Masayoshi; Oyama, Koichi; Yamashita, Teruo; Komamine, Satoshi*; Ochi, Eiji*

no journal, , 

no abstracts in English

Oral presentation

Investigation of coagulated glass included noble metal compounds by Raman spectroscopy

Nagai, Takayuki; Oyama, Koichi; Kobayashi, Hidekazu; Morikawa, Yo; Yokozawa, Takuma; Nakajima, Masayoshi; Yamashita, Teruo; Amamoto, Ippei

no journal, , 

no abstracts in English

Oral presentation

Influence of long-term melting on the noble metals shape and glass viscosity, 2

Oyama, Koichi; Morikawa, Yo; Miyauchi, Atsushi; Nakajima, Masayoshi; Yamashita, Teruo; Komamine, Satoshi*; Ochi, Eiji*

no journal, , 

no abstracts in English

Oral presentation

Study on the sedimentation behavior of the noble metal particles in molten borosilicate glass

Oyama, Koichi; Morikawa, Yo; Miyauchi, Atsushi; Nakajima, Masayoshi; Yamashita, Teruo; Komamine, Satoshi*; Ochi, Eiji*

no journal, , 

no abstracts in English

Oral presentation

Sedimentation behavior of noble metal particles in simulated high-level waste borosilicate glasses

Nakajima, Masayoshi; Oyama, Koichi; Morikawa, Yo; Miyauchi, Atsushi; Yamashita, Teruo; Komamine, Satoshi*; Ochi, Eiji*

no journal, , 

Noble metal elements (NME) contained in high level liquid waste (HLLW) are distributed in a vitrification melter. Some part of them forms sediment which causes negative effects to steady operation of the melter. The formation process and characteristics of the sediment is useful information for considering methods of removing or discharging them. Thus the sedimentation observation was carried out by using simulated glass. Samples with 1.1wt% of initial NME concentration held at 1100$$^{circ}$$C indicated zone settling, and the settling rate of interface is constant; 2.4 mm/h. This sedimentation behavior is the type of rapid settling. Following the rapid settling, the settling rate goes slower gradually, this is the type of compressive settling. The samples whose initial NME concentrations are 3.0wt% and 6.1wt% showed compression settling form the beginning. From the settling curve of interface, the maximum concentration of NME in sediment was estimated as around 23-26wt%. This value can specify the properties of sediment to be removed, Also, growth of NME particles was observed by holding at 1100$$^{circ}$$C for up to 2880 hours.

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