Analysis of deposits inside the reactor at Fukushima Daiichi Nuclear Power Station in JFY2021; The Subsidy program of "Project of Decommissioning and Contaminated Water Management (Development of Analysis and Estimation Technology for Characterization of Fuel Debris)" starting FY2021

Ikeuchi, Hirotomo; Sasaki, Shinji; Onishi, Takashi; Nakayoshi, Akira; Arai, Yoichi; Sato, Takumi; Ohgi, Hiroshi; Sekio, Yoshihiro; Yamaguchi, Yukako; Morishita, Kazuki; et al.

JAEA-Data/Code 2023-005, 418 Pages, 2023/12

JAEA-Data-Code-2023-005-01.pdf:24.59MB
JAEA-Data-Code-2023-005-02.pdf:32.18MB

For safe and steady decommissioning of Tokyo Electric Power Company Holdings' Fukushima Daiichi Nuclear Power Station (1F), information concerning composition and physical/chemical properties of fuel debris generated in the reactors should be estimated and provided to other projects conducting the decommissioning work including the retrieval of fuel debris and the subsequent storage. For this purpose, in FY2021, samples of contaminants (the wiped smear samples and the deposits) obtained through the internal investigation of the 1F Unit 2 were analyzed to clarify the components and to characterize the micro-particles containing uranium originated from fuel (U-bearing particles) in detail. This report summarized the results of analyses performed in FY2021, including the microscopic analysis by SEM and TEM, radiation analysis, and elemental analysis by ICP-MS, as a database for evaluating the main features of each sample and the probable formation mechanism of the U-bearing particles.

Relativistic laser plasma from micron-sized argon clusters as a debris-free X-ray source for pulse X-ray diffraction

Fukuda, Yuji; Akahane, Yutaka; Aoyama, Makoto; Inoue, Norihiro*; Ueda, Hideki; Nakai, Yoshiki*; Tsuji, Koichi*; Yamakawa, Koichi; Hironaka, Yoichiro*; Kishimura, Hiroaki*; et al.

Applied Physics Letters, 85(21), p.5099 - 5101, 2004/11

https://doi.org/10.1063/1.1823589

We have demonstrated diffraction from Si(111) crystal using X-rays from highly ionized Ar ions produced by laser irradiation with an intensity of 610 W/cm and a pulse duration of 30 fs acting upon micron-sized Ar clusters. The measured total photon flux and line width in the He line (3.14 keV) were 410 photons/shot/4sr and 3.7 eV (FWHM), respectively, which is sufficient to utilize as a debris-free light source for time-resolved X-ray diffraction studies.