Development of solution behavior observation system under criticality accident conditions in TRACY

Ogawa, Kazuhiko; Morita, Toshio*; Yanagisawa, Hiroshi; Aizawa, Eiju; Sakuraba, Koichi; Sugawara, Susumu; Ono, Akio

Journal of Nuclear Science and Technology, 37(12), p.1088 - 1097, 2000/12

https://doi.org/10.3327/jnst.37.1088

no abstracts in English

Irradiation effect of transistor by Co-60 gamma ray and electron beam; Effects of dose rate and exposure temperatures

Hirao, Toshio; Yoshikawa, Masahito; Morita, Yosuke; *; *

JAERI-M 89-207, 128 Pages, 1989/12

JAERI-M-89-207.pdf:2.62MB

no abstracts in English

Durability test of optical fibers for long term irradiation, (II); Effect of irradiation temperature

Hirao, Toshio; Morita, Yosuke; Kawakami, Waichiro

EIM-87-12, p.99 - 109, 1986/00

no abstracts in English