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Journal Articles

Recent progress in the energy recovery linac project in Japan

Sakanaka, Shogo*; Akemoto, Mitsuo*; Aoto, Tomohiro*; Arakawa, Dai*; Asaoka, Seiji*; Enomoto, Atsushi*; Fukuda, Shigeki*; Furukawa, Kazuro*; Furuya, Takaaki*; Haga, Kaiichi*; et al.

Proceedings of 1st International Particle Accelerator Conference (IPAC '10) (Internet), p.2338 - 2340, 2010/05

Future synchrotron light source using a 5-GeV energy recovery linac (ERL) is under proposal by our Japanese collaboration team, and we are conducting R&D efforts for that. We are developing high-brightness DC photocathode guns, two types of cryomodules for both injector and main superconducting (SC) linacs, and 1.3 GHz high CW-power RF sources. We are also constructing the Compact ERL (cERL) for demonstrating the recirculation of low-emittance, high-current beams using above-mentioned critical technologies.

Journal Articles

Local oxidation induced by inhomogeneous stress on blistered Si surface

Igarashi, Shinichi*; Itakura, Akiko*; Kitajima, Masahiro*; Nakano, Shinsuke*; Muto, Shunsuke*; Tanabe, Tetsuo*; Yamamoto, Hiroyuki; Hojo, Kiichi

Japanese Journal of Applied Physics, Part 1, 45(5A), p.4179 - 4182, 2006/05

 Times Cited Count:3 Percentile:12.93(Physics, Applied)

By utilizing surface stress to modify surface reaction potential and increase surface reactivity, a technique for the twodimensional patterning of surface chemical reactions may be realized by surface stress modulation. A blister is a local protrusion on a solid surface induced by gas ion irradiation, and is considered to create local stress on surface layers. Si(100) substrate was irradiated with H$$^{+}$$ (incident energy: 10 keV, fluence: 1$$times$$10$$^{22}$$ ions) at an angle of 30 to the surface normal. Blisters of 1-5 mm in diameter at the base were formed. After the ion irradiation, the substrate was oxidized. Scanning Auger electron microscopy revealed that, compared with the flat surface, the perimeters of the blisters had a higher oxygen intensity whereas the blister tops had a lower oxygen intensity. The stress distribution of the blister was calculated using the finite element method. It was found that the surface layers were stretched laterally at the blisters tops and compressed at theperimeters, relative to the flat surface. There was a clear correspondence between the O distribution and the stress distribution on the surface. Our results indicate that the patterned oxidation of the Si surface can be governed by the application of surface stress.

Journal Articles

Local oxidation induced by inhomogeneous stress on the blistered Si surface

Igarashi, Shinichi*; Itakura, Akiko*; Kitajima, Masahiro*; Nakano, Shinsuke*; Muto, Shunsuke*; Tanabe, Tetsuo*; Yamamoto, Hiroyuki; Hojo, Kiichi

Hyomen Kagaku, 25(9), p.562 - 567, 2004/09

Surface stress can be utilized positively in modifying the surface reaction potential and increasing the surface reactivity. Blister is a local protrusion of solid surface induced by gas ion irradiation, and is considered to create local stress on surface layers. Si(100) substrate was irradiated with 10 keV H$$^{+}$$ (fluence; 1$$times$$10$$^{22}$$ ions/m$$^{2}$$) at an angle of 30$$^{circ}$$ to the surface normal. The blisters of several $$mu$$m in diameter at the bottom were formed. After the ion irradiation, the substrate was oxidized. By means of scanning Auger microscopy, we observed that the rims of the blisters have higher oxygen intensities than the flat surfaces and the tops have lower than the flats. The calculated stress distribution of the blister shows that the surface layers should be stretched laterally at the top of blisters and are compressed at the rim, relative to the flat surfaces. The O distribution clearly consists with the stress distribution of the surface. Our results demonstrate a patterned oxidation of Si surface applying its reactivity depending on the surface stress.

Journal Articles

In-situ observation of surface blistering in silicon by deuterium and helium ion irradiation

Igarashi, Shinichi; Muto, Shunsuke*; Tanabe, Tetsuo*; Aihara, Jun; Hojo, Kiichi

Surface & Coatings Technology, 158-159, p.421 - 425, 2002/09

no abstracts in English

Journal Articles

Structural change in graphite under electron irradiation of low temperatures

*; Muto, Shunsuke*; Tanabe, Tetsuo*; Kurata, Hiroki; Hojo, Kiichi

Journal of Nuclear Materials, 271-272, p.280 - 284, 1999/00

 Times Cited Count:24 Percentile:84.01(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

TEM analyses of surface ridge network in an ion-irradiated graphite thin film

Muto, Shunsuke*; Tanabe, Tetsuo*; *; *; Furuno, Shigemi*; Hojo, Kiichi

Journal of Nuclear Materials, 271-272, p.285 - 289, 1999/00

 Times Cited Count:5 Percentile:40.64(Materials Science, Multidisciplinary)

no abstracts in English

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