Effect of helium on irradiation creep behavior of B-doped F82H irradiated in HFIR

Ando, Masami; Nozawa, Takashi; Hirose, Takanori; Tanigawa, Hiroyasu; Wakai, Eiichi; Stoller, R. E.*; Myers, J.*

Fusion Science and Technology, 68(3), p.648 - 651, 2015/10

https://doi.org/10.13182/FST14-963

Pressurized tubes of F82H and B-doped F82H irradiated at 573 and 673 K up to 6dpa have been measured by a laser profilometer. The irradiation creep strain in F82H irradiated at 573 and 673 K was almost linearly dependent on the effective stress level for stresses below 260 MPa and 170 MPa, respectively. The creep strain of BN-F82H was similar to that of F82H IEA at each effective stress level except 294 MPa at 573 K irradiation. For 673 K irradiation, the creep strain of some BN-F82H tubes was larger than that of F82H tubes. It is suggested that a swelling caused in each BN-F82H because small helium babbles might be produced by a reaction of B(n, ) Li.