Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Pt
MacLaughlin, D. E.*; Rose, M. S.*; Bernal, O. O.*; Heffner, R. H.; Nieuwenhuys, G. J.*; Chau, R.*; Maple, M. B.*
Physica B; Condensed Matter, 374-375, p.174 - 176, 2006/03
Times Cited Count:0 Percentile:0.00(Physics, Condensed Matter)Transverse-field
SR shifts and relaxation rates have been measured in the non-Fermi liquid alloy system UCu
Pt
. At low temperatures the fractional spread in Knight shifts is 2 for x=1, but is only half this value for x=1.5 and 2.5. In a disorder-driven scenario where the NFL behavior is due to a broadly distributed characteristic energy E, our results indicate that
E/E
K/K)
is similar for UCu
Pd
. Our results correlate with the observed suppression of other NFL anomaliess.
PdMacLaughlin, D. E.*; Rose, M. S.*; Anderson, J. E.*; Bernal, O. O.*; Heffner, R. H.; Nieuwenhuys, G. J.*; Baumbach, R. E.*; Butch, N. P.*; Maple, M. B.*
Physica B; Condensed Matter, 374-375, p.177 - 179, 2006/03
Times Cited Count:1 Percentile:6.06(Physics, Condensed Matter)Longitudinal-field
SR experiments have been performed in unannealed and annealed samples of the heavy-fermion compound UCu
Pd to study the effect of disorder on non-Fermi liquid behavior in this material. The observed scaling exponent independent of annealing. Annealed samples exhibited a reduction of the relaxation rate at low temperatures, indicating that annealing shifts fluctuation noise power to higher frequencies. There was no tendency of the inhomogeneous spread in rates to decrease with annealing. The correlation with residual resistivity previously observed for a number of NFL heavy-electron materials is also found in the present work.
probed by
SROishi, Kazuki; Heffner, R. H.; MacDougall, G. J.*; Ito, Takashi; Higemoto, Wataru; Luke, G. M.*; Amato, A.*; Nieuwenhuys, G.*; Spehling, J.*; Klauss, H. H.*; et al.
no journal, ,
no abstracts in English
probed by
SROishi, Kazuki; Heffner, R. H.; Spehling, J.*; MacDougall, G. J.*; Ito, Takashi; Higemoto, Wataru; Amato, A.*; Nieuwenhuys, G.*; Klauss, H. H.*; Luke, G. M.*; et al.
no journal, ,