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Nishimura, Hayato*; Hojo, Tomohiko*; Ajita, Saya*; Shibayama, Yuki*; Koyama, Motomichi*; Saito, Hiroyuki*; Shiro, Ayumi*; Yasuda, Ryo*; Shobu, Takahisa; Akiyama, Eiji*
Tetsu To Hagane, 107(9), p.760 - 768, 2021/09
Times Cited Count：0 Percentile：0(Metallurgy & Metallurgical Engineering)no abstracts in English
Nishimura, Hayato*; Hojo, Tomohiko*; Ajita, Saya*; Shibayama, Yuki*; Koyama, Motomichi*; Saito, Hiroyuki*; Shiro, Ayumi*; Yasuda, Ryo*; Shobu, Takahisa; Akiyama, Eiji*
ISIJ International, 61(4), p.1170 - 1178, 2021/04
Times Cited Count：3 Percentile：25.78(Metallurgy & Metallurgical Engineering)Yoshida, Kensuke*; Fujioka, Shinsuke*; Higashiguchi, Takeshi*; Ugomori, Teruyuki*; Tanaka, Nozomi*; Kawasaki, Masato*; Suzuki, Yuhei*; Suzuki, Chihiro*; Tomita, Kentaro*; Hirose, Ryoichi*; et al.
Applied Physics Letters, 106(12), p.121109_1 - 121109_5, 2015/03
Times Cited Count：10 Percentile：38.07(Physics, Applied)Yoshida, Kensuke*; Fujioka, Shinsuke*; Higashiguchi, Takeshi*; Ugomori, Teruyuki*; Tanaka, Nozomi*; Ohashi, Hayato*; Kawasaki, Masato*; Suzuki, Yuhei*; Suzuki, Chihiro*; Tomita, Kentaro*; et al.
Applied Physics Express, 7(8), p.086202_1 - 086202_4, 2014/08
Times Cited Count：29 Percentile：73.72(Physics, Applied)We demonstrate high conversion efficiency for extreme ultraviolet (EUV) emission at 6.5-6.7 nm from multiple laser beam-produced one-dimensional spherical plasmas. Multiply charged-state ions produce strong resonance emission lines, which combine to yield intense unresolved transition arrays in Gd, Tb, and Mo. The maximum in-band EUV conversion efficiency was observed to be 0.8%, which is one of the highest values ever reported due to the reduction of plasma expansion loss.
Ohashi, Hayato*; Suda, Shintaro*; Tanuma, Hajime*; Fujioka, Shinsuke*; Nishimura, Hiroaki*; Nishihara, Katsunobu*; Kai, Takeshi; Sasaki, Akira; Sakaue, Hiroyuki*; Nakamura, Nobuyuki*; et al.
Journal of Physics; Conference Series, 163, p.012071_1 - 012071_4, 2009/06
Times Cited Count：7 Percentile：89.27(Physics, Multidisciplinary)Extreme ultra-violet (EUV) emission spectra of multiply charged tin ions were measured in the wavelength range of 10-22 nm following charge exchange collisions or the electron impact excitation of tin ions. In charge exchange collisions, we observed both the resonance lines and the emission lines corresponding to the transitions between the excited states. On the other hand, we observed mainly the resonance lines in the electron impact experiments. We can distinguish the resonance lines from other emission lines in the charge exchange spectrum by comparison with the emission lines in the electron impact spectrum.
Ajita, Saya*; Nishimura, Hayato*; Hojo, Tomohiko*; Koyama, Motomichi*; Fujita, Kenichi*; Kakinuma, Hiroshi*; Akiyama, Eiji*; Shibayama, Yuki
no journal, ,
no abstracts in English
