Refine your search:     
Report No.
 - 
Search Results: Records 1-9 displayed on this page of 9
  • 1

Presentation/Publication Type

Initialising ...

Refine

Journal/Book Title

Initialising ...

Meeting title

Initialising ...

First Author

Initialising ...

Keyword

Initialising ...

Language

Initialising ...

Publication Year

Initialising ...

Held year of conference

Initialising ...

Save select records

Journal Articles

Reduction of electron concentration in Lightly N-Doped n-Type 4H-SiC epilayers by 200 keV electron irradiation

Matsuura, Hideharu*; Yanagisawa, Hideki*; Nishino, Kozo*; Nojiri, Takunori*; Myojin, Yoshiko*; Matsuyama, Yukei*; Onoda, Shinobu; Oshima, Takeshi

Open Applied Physics Journal (Internet), 4, p.37 - 40, 2011/05

Journal Articles

Reduction in majority-carrier concentration in N-doped or Al-doped 4H-SiC epilayer by electron irradiation

Matsuura, Hideharu*; Yanagisawa, Hideki*; Nishino, Kozo*; Nojiri, Takunori*; Onoda, Shinobu; Oshima, Takeshi

Proceedings of 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-9), p.89 - 91, 2010/10

Journal Articles

Plant life management in JOYO; Replacement of gas coolers in reactor vessel concrete shield cooling system and cold trap system

Tobita, Shigeharu; Nishino, Kazunari; Sumino, Kozo; Ogawa, Toru

UTNL-R-0453, p.2_1 - 2_10, 2006/03

no abstracts in English

JAEA Reports

Periodic Safety Review of the Experimental Fast Reactor JOYO; Review of Aging Management

Isozaki, Kazunori; Ogawa, Toru; Nishino, Kazunari; Kaito, Yasuaki; Ichige, Satoshi; Sumino, Kozo; Suto, Masayoshi; Kawahara, Hirotaka; Suzuki, Toshiaki; Takamatsu, Misao; et al.

JNC TN9440 2005-003, 708 Pages, 2005/05

JNC-TN9440-2005-003.pdf:31.46MB

Periodic safety review (Review of the aging management) which consisted of Technical review on aging for the safety related structures, systems and components and Establish a long term maintenance program was carried out up to April 2005.1. Technical review on aging for the safety related structures, systems and components It was technically confirmed to prevent the loss of function of the safety related structures, systems and components due to aging phenomena, which (1) irradiation damage, (2) corrosion, (3) abrasion and erosion, (4) thermal aging, (5) creep and fatigue, (6) Stress Corrosion Cracking, (7) insulation deterioration and (8) general deterioration, under the periodic monitoring or renewal of them 2. Establish a long term maintenance program The long term maintenance program during JPY2005 to 2014 were established based on the technical review on aging for the safety related structures, systems and components. It was evaluated that the inspection or renewal based on the long term maintenance program, in addition to the spontaneous inspection long-term schedule of the long term voluntary inspection plan, could prevent the loss of function of the safety related structures, systems and components in future.

Oral presentation

Verification of reduction in acceptor density due to displacement of C in Al-doped 4H-SiC by electron irradiation

Nishino, Kozo*; Minohara, Nobumasa*; Matsuura, Hideharu*; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Increase of hole concentration in Al-doped 6H-SiC epilayer by 100 keV electron irradiation or annealing

Yanagisawa, Hideki*; Nishino, Kozo*; Nojiri, Takunori*; Matsuura, Hideharu*; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Change of acceptor densities in Al-doped 4H-SiC by displacement of C atoms

Nishino, Kozo*; Yanagisawa, Hideki*; Nojiri, Takunori*; Matsuura, Hideharu*; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Radiation resistance of Al-doped 4H-SiC epilayer to 200keV electron irradiation

Nojiri, Takunori*; Nishino, Kozo*; Yanagisawa, Hideki*; Matsuura, Hideharu*; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Change in hole concentration in Al-doped 6H-SiC by electron irradiation and thermal annealing

Matsuura, Hideharu*; Yanagisawa, Hideki*; Nishino, Kozo*; Myojin, Yoshiko*; Nojiri, Takunori*; Matsuyama, Yukei*; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

9 (Records 1-9 displayed on this page)
  • 1