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Shinto, Katsuhiro; Wada, Motoi*; Nishida, Tomoaki*; Demura, Yasuhiro*; Sasaki, Daichi*; Tsumori, Katsuyoshi*; Nishiura, Masaki*; Kaneko, Osamu*; Kisaki, Masashi*; Sasao, Mamiko*
AIP Conference Proceedings 1390, p.675 - 683, 2011/09
Times Cited Count：0 Percentile：0.00(Physics, Atomic, Molecular & Chemical)Shinto, Katsuhiro; Wada, Motoi*; Kaneko, Osamu*; Tsumori, Katsuyoshi*; Nishiura, Masaki*; Sasao, Mamiko*; Kisaki, Masashi*
Proceedings of 1st International Particle Accelerator Conference (IPAC '10) (Internet), p.999 - 1001, 2010/05
We propose a negative ion beam probe system as a new scheme to diagnose beam profile of high power positive ion beams. Two RF linacs of IFMIF have to drive the neutron source by providing continuous-wave (CW) positive deuterium ion beams with the intensity of 125 mA each at the beam energy of 40 MeV. During the CW beam operations, the extreme intensity of the beam and the severe radiation levels make the beam diagnostics with conventional techniques in the transport lines terribly difficult. A beam of negative ions liable to lose the additional electron at the occasion of impact with a high energy particle can work as a probe to measure the positive ion beam profile. On possible configuration to achieve high intensity beam profile measurement is to inject a negative ion probe beam into the target beam perpendicularly, and measure the attenuation of the negative ion beam by beam-beam interaction at each position. We have started an experimental study for the proof-of-principle of the new beam profile monitoring system. The paper presents the status quo of this beam profile monitor system development and the prospects to apply the system to the IFMIF beam line controls.
Isobe, Mitsutaka*; Toi, Kazuo*; Matsushita, Hiroyuki*; Goto, Kazuyuki*; Suzuki, Chihiro*; Nagaoka, Kenichi*; Nakajima, Noriyoshi*; Yamamoto, Satoshi*; Murakami, Sadayoshi*; Shimizu, Akihiro*; et al.
Nuclear Fusion, 46(10), p.S918 - S925, 2006/10
Times Cited Count：31 Percentile：69.32(Physics, Fluids & Plasmas)no abstracts in English
Shinto, Katsuhiro; Wada, Motoi*; Nishida, Tomoaki*; Demura, Yasuhiro*; Sasaki, Daichi*; Tsumori, Katsuyoshi*; Kisaki, Masashi*; Nishiura, Masaki*; Kaneko, Osamu*; Sasao, Mamiko*
no journal, ,
no abstracts in English
Shinto, Katsuhiro; Wada, Motoi*; Nishida, Tomoaki*; Kisaki, Masashi*; Tsumori, Katsuyoshi*; Nishiura, Masaki*; Kaneko, Osamu*; Sasao, Mamiko*
no journal, ,
We have proposed a negative ion beam probe system as a new scheme to diagnose beam profiles of high power positive ion beams. We show the present status of the proof-of-principle experiment for the negative ion beam probe system performed at NIFS NBI test stand. A negative hydrogen ion source which produces a rectangular shape beam was installed at the diagnostic chamber in the NBI test stand and the total current of H
beam extracted from the ion source was measured. We obtained the total H beam current of 10 
A with the beam energy of 3 kV.
