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Journal Articles

Microbeam system for study of single event upset of semiconductor devices

Kamiya, Tomihiro; *; Minehara, Eisuke; Tanaka, Ryuichi; Odomari, Iwao*

Nuclear Instruments and Methods in Physics Research B, 64, p.362 - 366, 1992/00

https://doi.org/10.1016/0168-583X(92)95495-D
 Times Cited Count：30 Percentile：91.05(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Development of ion microprobe system at WASEDA University

M.Koh*; *; *; *; *; *; *; Kamiya, Tomihiro; *; Minehara, Eisuke; et al.

Proceedings of International Workshop on Radiation Effects of Semiconductor Devices for Spasce Application, p.105 - 111, 1992/00

no abstracts in English

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