Measurement of Doppler broadening of prompt gamma-rays from various zirconium- and ferro-borons

Tsuchikawa, Yusuke; Kai, Tetsuya; Abe, Yuta; Oishi, Yuji*; Sun, Y.*; Oikawa, Kenichi; Nakatani, Takeshi; Sato, Ikken

Nuclear Instruments and Methods in Physics Research A, 991, p.164964_1 - 164964_5, 2021/03

https://doi.org/10.1016/j.nima.2020.164964

Peak shape analysis was performed for the energy spectra of Doppler-broadened prompt -rays generated by neutron capture reactions with various boride or boron samples. Significant differences were observed between nonmetallic and metallic borides. Minor differences between the peak shapes of prompt -rays from zirconium- and ferro-borons were evaluated by a peak fitting method. The identification of zirconium- and ferro-borons and other types of borides was estimated.

Behavior of Sm in the boron cage of Sm-doped B ( =Yb, La) observed by multiple-wavelength neutron holography

Uechi, Shoichi*; Oyama, Kenji*; Fukumoto, Yohei*; Kanazawa, Yuki*; Happo, Naohisa*; Harada, Masahide; Inamura, Yasuhiro; Oikawa, Kenichi; Matsuhra, Wataru*; Iga, Fumitoshi*; et al.

Physical Review B, 102(5), p.054104_1 - 054104_10, 2020/08

https://doi.org/10.1103/PhysRevB.102.054104

Impact of hydrided and non-hydrided materials near transistors on neutron-induced single event upsets

Abe, Shinichiro; Sato, Tatsuhiko; Kuroda, Junya*; Manabe, Seiya*; Watanabe, Yukinobu*; Liao, W.*; Ito, Kojiro*; Hashimoto, Masanori*; Harada, Masahide; Oikawa, Kenichi; et al.

Proceedings of IEEE International Reliability Physics Symposium (IRPS 2020) (Internet), 6 Pages, 2020/04

https://doi.org/10.1109/IRPS45951.2020.9128951

Single event upsets (SEUs) caused by neutrons have been recognized as a serious reliability problem for microelectronic devices on the ground level. In our previous work, it was found that hydride placed in front of the memory chip has considerably impact on SEU cross sections because H ions generated via elastic scattering of neutrons with hydrogen atoms are only emitted in a forward direction. In this study, the effect of components neighboring transistors on neutron-induced SEUs was investigated for 65-nm bulk SRAMs by using PHITS. It was found that the shape of the SEU cross section around few MeV comes from the thickness and the position of components placed in front of transistors when that components do not contains hydrogen atoms. By considering components adjoin memory cells in the test board used in the simulation, measured data at J-PARC BL10 were reproduced well. In addition, it was found that the effect of components neighboring transistors on neutron-induced SERs does not negligible in terrestrial environment.

Neutron transmission spectrum of liquid lead bismuth eutectic

Oba, Yojiro; Ito, Daisuke*; Saito, Yasushi*; Onodera, Yohei*; Parker, J. D.*; Shinohara, Takenao; Oikawa, Kenichi

Materials Research Proceedings, Vol.15, p.160 - 164, 2020/02

https://doi.org/10.21741/9781644900574-25

Lead Bismuth eutectic (LBE) is a promising candidate of the coolant for accelerator driven system (ADS) and fast breeder reactor. Neutron transmission imaging is a powerful technique to investigate the LBE in flow channel. However, previous studies have focused on the analysis of the neutron transmission spectra due to Bragg diffraction (Bragg edge transmission) from the solid phase of the LBE. If the neutron transmission spectra due to the diffraction from a liquid phase can be observed, it is useful to study the behavior of the molten LBE in the flow channel. Therefore, the energy-resolved neutron transmission imaging measurements of the molten LBE was carried out. The observed neutron transmission spectra can be explained by those calculated from the scattering profiles of the molten LBE. This indicates that the structure of the molten LBE can be characterized and mapped using the neutron transmission imaging.

Feasibility study of two-dimensional neutron-resonance thermometry using molybdenum in 316 stainless-steel

Kai, Tetsuya; Hiroi, Kosuke; Su, Y.; Segawa, Mariko; Shinohara, Takenao; Matsumoto, Yoshihiro*; Parker, J. D.*; Hayashida, Hirotoshi*; Oikawa, Kenichi

Materials Research Proceedings, Vol.15, p.149 - 153, 2020/02

https://doi.org/10.21741/9781644900574-23

Temperature dependent characteristics of neutron signals from a current-biased Nb nanowire detector with B converter

Vu, TheDang; Iizawa, Yuki*; Nishimura, Kazuma*; Shishido, Hiroaki*; Kojima, Kenji*; Oikawa, Kenichi; Harada, Masahide; Miyajima, Shigeyuki*; Hidaka, Mutsuo*; Oku, Takayuki; et al.

Journal of Physics; Conference Series, 1293, p.012051_1 - 012051_9, 2019/10

https://doi.org/10.1088/1742-6596/1293/1/012051

Recent progress on practical materials study by Bragg edge imaging at J-PARC

Oikawa, Kenichi; Su, Y.; Kiyanagi, Ryoji; Kawasaki, Takuro; Shinohara, Takenao; Kai, Tetsuya; Hiroi, Kosuke; Harjo, S.; Parker, J. D.*; Matsumoto, Yoshihiro*; et al.

Physica B; Condensed Matter, 551, p.436 - 442, 2018/12

https://doi.org/10.1016/j.physb.2017.12.038

Testing of time-of-flight neutron diffraction imaging using a high-resolution scintillator detector with wavelength-shifting fibers

Kawasaki, Takuro; Nakamura, Tatsuya; Gong, W.*; Oikawa, Kenichi

Physica B; Condensed Matter, 551, p.460 - 463, 2018/12

https://doi.org/10.1016/j.physb.2018.01.067

Spatial resolution test targets made of gadolinium and gold for conventional and resonance neutron imaging

Segawa, Mariko; Oikawa, Kenichi; Kai, Tetsuya; Shinohara, Takenao; Hayashida, Hirotoshi*; Matsumoto, Yoshihiro*; Parker, J. D.*; Nakatani, Takeshi; Hiroi, Kosuke; Su, Y.; et al.

JPS Conference Proceedings (Internet), 22, p.011028_1 - 011028_8, 2018/11

https://doi.org/10.7566/JPSCP.22.011028

Experimental validation of the brightness distribution on the surfaces of coupled and decoupled moderators composed of 99.8% parahydrogen at the J-PARC pulsed spallation neutron source

Harada, Masahide; Teshigawara, Makoto; Oi, Motoki; Klinkby, E.*; Zanini, L.*; Batkov, K.*; Oikawa, Kenichi; Toh, Yosuke; Kimura, Atsushi; Ikeda, Yujiro

Nuclear Instruments and Methods in Physics Research A, 903, p.38 - 45, 2018/09

https://doi.org/10.1016/j.nima.2018.06.011