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Journal Articles

Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO$$_{2}$$

Takahiro, Katsumi*; Oizumi, Shinnosuke*; Morimoto, Keiichi*; Kawatsura, Kiyoshi*; Isshiki, Toshiyuki*; Nishio, Koji*; Nagata, Shinji*; Yamamoto, Shunya; Narumi, Kazumasa; Naramoto, Hiroshi*

Applied Surface Science, 256(4), p.1061 - 1064, 2009/11

 Times Cited Count:8 Percentile:36.66(Chemistry, Physical)

Journal Articles

Core level and valence band photoemission spectra of Au clusters embedded in carbon

Takahiro, Katsumi*; Oizumi, Shinnosuke*; Terai, Atsushi*; Kawatsura, Kiyoshi*; Tsuchiya, Bun*; Nagata, Shinji*; Yamamoto, Shunya; Naramoto, Hiroshi; Narumi, Kazumasa; Sasase, Masato*

Journal of Applied Physics, 100(8), p.084325_1 - 084325_6, 2006/10

 Times Cited Count:28 Percentile:68.36(Physics, Applied)

X-ray photoelectron spectroscopy (XPS) has been applied for size estimation of Au clusters formed by ion implantation into glassy carbon. The 4f and 5d XPS spectra reveal the presence of the cluster 0.7-2.5nm in diameter, depending on the Au concentration. The elationship between XPS 4f-binding energy shift and 5d splitting is determined for the Au clusters embedded in the carbon and found to be significantly different from the previous data for the ones supported on a carbon substrate. We suppose that this difference results from the effect of the environment around a cluster on Coulomb charging during photoemission at the final state.

Journal Articles

Amorphization of carbon materials studied by X-ray photoelectron spectroscopy

Takahiro, Katsumi*; Terai, Atsushi*; Oizumi, Shinnosuke*; Kawatsura, Kiyoshi*; Yamamoto, Shunya; Naramoto, Hiroshi

Nuclear Instruments and Methods in Physics Research B, 242(1-2), p.445 - 447, 2006/01

 Times Cited Count:9 Percentile:53.56(Instruments & Instrumentation)

X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy have been applied to investigate amorphization processes by ion irradiation for various carbon materials, including highly oriented pyrolytic graphite (HOPG), isotropic graphite, glassy carbon (GC) and C$$_{60}$$ crystalline film. It is found that the asymmetry of the XPS C 1s line increases as the irradiation dose increases. The origin of the asymmetry appeared on the C 1s line is discussed. It is concluded that the asymmetry of the C 1s line is not correlated with the increase in the size of a graphitic layer, but is related with the structural disorders, such as a bond angle disorder.

Oral presentation

Application of X-ray photoelectron spectroscopy to characterization of metallic nanoclusters formed by ion implantation, 3

Takahiro, Katsumi*; Oizumi, Shinnosuke*; Kawatsura, Kiyoshi*; Isshiki, Toshiyuki*; Nishio, Koji*; Nagata, Shinji*; Yamamoto, Shunya; Narumi, Kazumasa; Naramoto, Hiroshi

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