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Okada, Ryuta; Yoshigoe, Akitaka; Teraoka, Yuden; Yamada, Yoichi*; Sasaki, Masahiro*
Applied Physics Express, 8(2), p.025701_1 - 025701_4, 2015/02
Times Cited Count:7 Percentile:30.62(Physics, Applied)We studied the surface oxidation on a Ge(111)-c(28) surface at room temperature using supersonic oxygen beams as a function of the translational energy of the incident oxygen molecules ranging from 26 meV to 2.3 eV. In situ synchrotron photoemission spectroscopy performed during the oxidation revealed that the surface oxidation terminated with the formation of a sub-monolayer oxide of at most 0.52 ML, for all the beam energies examined. In addition, the oxidation state of the surface oxides was found to depend on the translational energy. These results demonstrate the precise chemical control of the ultrathin surface oxides of Ge(111)-c(28).
Yoshigoe, Akitaka; Teraoka, Yuden; Okada, Ryuta; Yamada, Yoichi*; Sasaki, Masahiro*
Journal of Chemical Physics, 141(17), p.174708_1 - 174708_7, 2014/11
Times Cited Count:8 Percentile:29.47(Chemistry, Physical)synchrotron radiation photoelectron spectroscopy was performed during the oxidation of the Ge(100)-21 surface induced by a molecular oxygen beam with various incident energies up to 2.2 eV from the initial to saturation coverage of surface oxides. The saturation coverage of oxygen on the clean Ge(100) surface was much lower than one monolayer and the oxidation state of Ge was +2 at most. This indicates that the Ge(100) surface is in strong contrast to Si surfaces. The direct adsorption process can be activated by increasing the translational energy, resulting in an increased population of Ge and a higher final oxygen coverage. Our findings will contribute to the fundamental understanding of oxygen adsorption processes at 300 K from the initial stages to saturated oxidation.
Teraoka, Yuden; Jinno, Muneaki*; Takaoka, Tsuyoshi*; Harries, J.; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
Denki Gakkai Rombunshi, C, 134(4), p.524 - 525, 2014/04
Teraoka, Yuden; Iwai, Yutaro*; Yoshigoe, Akitaka; Okada, Ryuta
Dai-57-Kai Nihon Gakujutsu Kaigi Zairyo Kogaku Rengo Koenkai Koen Rombunshu, p.44 - 45, 2013/11
no abstracts in English
Teraoka, Yuden; Inoue, Keisuke*; Jinno, Muneaki*; Harries, J.; Okada, Ryuta; Iwai, Yutaro*; Takaoka, Tsuyoshi*; Yoshigoe, Akitaka; Komeda, Tadahiro*
Dai-56-Kai Nihon Gakujutsu Kaigi Zairyo Kogaku Rengo Koenkai Koen Rombunshu, p.360 - 361, 2012/10
no abstracts in English
Okada, Ryuta; Yoshigoe, Akitaka; Teraoka, Yuden; Jinno, Muneaki*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
Ge is one of the promising materials for the next generation FET because of its high carrier mobility overwhelming that of Si. Understanding of oxidation processes on Ge substrates with various index planes is necessary to control the quality of oxide layers for these devices. In this research, we employed SR-XPS to analyze oxide layers on the Ge(111)-c(28) surface formed by thermal-O gas and supersonic O beam. Ge component was generated only by high energy supersonic O beam, although the oxide layer on Ge(100) has up to Ge. This result indicates that oxidation states are different depending on crystal planes. Our results give insight into mechanisms of oxidation processes on Ge.
Jinno, Muneaki*; Teraoka, Yuden; Takaoka, Tsuyoshi*; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
no journal, ,
no abstracts in English
Okada, Ryuta; Yoshigoe, Akitaka; Teraoka, Yuden; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
Ge has been attracting considerable attention as one of the promising materials for next-generation MOSFET devises because of its high carrier mobility. Understanding of O adsorption process on Ge substrate with various index planes is the most essential to control the quality of oxide layers for these devices. In this research, we employ SR-XPS (synchrotron radiation X-ray photoelectron spectroscopy) measurement to study the oxidation mechanism of the Ge(111) which is known as one of the low index planes. We found the difference in Ge3d profiles of the Ge oxide formed by between supersonic O molecular beam and back filling O. The difference shows that the kinetic energy of the supersonic O molecular beam caused higher coordination of Ge oxide than that of back filling O. This result suggests the presence of new O adsorption states activated by the supersonic O molecular beam.
Okada, Ryuta; Yoshigoe, Akitaka; Teraoka, Yuden; Jinno, Muneaki*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
no abstracts in English
Jinno, Muneaki*; Teraoka, Yuden; Takaoka, Tsuyoshi*; Harries, J.; Okada, Ryuta; Iwai, Yutaro*; Yoshigoe, Akitaka; Komeda, Tadahiro*
no journal, ,
Yoshigoe, Akitaka; Okada, Ryuta; Teraoka, Yuden; Jinno, Muneaki*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
no abstracts in English
Teraoka, Yuden; Inoue, Keisuke*; Jinno, Muneaki*; Okada, Ryuta; Yoshigoe, Akitaka
no journal, ,
Hino, Ryutaro; Shiozawa, Shusaku; Inagaki, Yoshiyuki; Shirasaki, Tomohiko*; Okada, Yoshimi*; Oka, Yoshiaki*
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no abstracts in English
Okada, Ryuta; Yoshigoe, Akitaka; Teraoka, Yuden; Jinno, Muneaki*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
Recently, the oxidation of Ge surfaces has been important in application because they are considered to be one of the promising candidates as a new channel material in MOSFET's. In this research, we employed SR-XPS to analyze the oxide layer on the Ge(111)-c(28) surface formed by supersonic O molecular beam (2.2 eV) and thermal O gas (0.027 eV). It was clarified that the amount of adsorbed oxygen caused by supersonic O beam is larger than that caused by thermal O. In addition, comparing Ge oxide components formed by molecular beams with those formed by O gas, we discovered that the Ge component was generated only by supersonic O beam corresponding to the increase of adsorbed oxygen amount.
Yoshigoe, Akitaka; Okada, Ryuta; Teraoka, Yuden; Jinno, Muneaki*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
Recently, it has been important to reveal the oxidation on Ge surfaces because they are considered to be one of the promising candidates as an alternative channel material in MOSFET's. In this study, we employed in situ SR-XPS to compare thin oxide layers formed by supersonic O beam (2.2 eV) and thermal O (0.027 eV) on Ge(100)-21 at 300 K. It was appeared that the amount of adsorbed oxygen caused by supersonic O beam (2.2 eV) is more than that caused by thermal O. In addition, by a comparison with Ge oxide components, we discovered the difference of oxygen adsorption sites corresponding to the increase in adsorbed oxygen.
Okada, Ryuta; Yoshigoe, Akitaka; Teraoka, Yuden; Jinno, Muneaki*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
no abstracts in English
Yoshigoe, Akitaka; Okada, Ryuta; Teraoka, Yuden; Jinno, Muneaki*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
no abstracts in English
Teraoka, Yuden; Inoue, Keisuke*; Jinno, Muneaki*; Yoshigoe, Akitaka; Okada, Ryuta
no journal, ,
no abstracts in English
Okada, Ryuta; Yoshigoe, Akitaka; Teraoka, Yuden; Jinno, Muneaki*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
no abstracts in English
Okada, Ryuta; Yoshigoe, Akitaka; Teraoka, Yuden; Jinno, Muneaki*; Yamada, Yoichi*; Sasaki, Masahiro*
no journal, ,
no abstracts in English