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Ohshima, Hiroyuki; Morishita, Masaki*; Aizawa, Kosuke; Ando, Masanori; Ashida, Takashi; Chikazawa, Yoshitaka; Doda, Norihiro; Enuma, Yasuhiro; Ezure, Toshiki; Fukano, Yoshitaka; et al.
Sodium-cooled Fast Reactors; JSME Series in Thermal and Nuclear Power Generation, Vol.3, 631 Pages, 2022/07
This book is a collection of the past experience of design, construction, and operation of two reactors, the latest knowledge and technology for SFR designs, and the future prospects of SFR development in Japan. It is intended to provide the perspective and the relevant knowledge to enable readers to become more familiar with SFR technology.
Takahashi, Yoshihiro*; Oki, Takahiro*; Nagasawa, Takaharu*; Nakajima, Yasuhito*; Kawanabe, Ryu*; Onishi, Kazunori*; Hirao, Toshio; Onoda, Shinobu; Mishima, Kenta; Kawano, Katsuyasu*; et al.
Nuclear Instruments and Methods in Physics Research B, 260(1), p.309 - 313, 2007/07
Times Cited Count：4 Percentile：35.11(Instruments & Instrumentation)no abstracts in English
m fully depleted CMOS/SOI digital logic devicesMakihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.
Proceedings of 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-7), p.95 - 98, 2006/10
no abstracts in English
n diodes due to heavy ion irradiationHirao, Toshio; Laird, J. S.; Onoda, Shinobu; Shibata, Toshihiko*; Wakasa, Takeshi; Yamakawa, Takeshi; Abe, Hiroshi; Takahashi, Yoshihiro*; Onishi, Kazunori*; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.105 - 109, 2004/10
no abstracts in English
Abe, Tetsuo*; Onishi, Kazunori*; Takahashi, Yoshihiro*; Hirao, Toshio
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.157 - 160, 2004/10
no abstracts in English
Takahashi, Yoshihiro*; Shibata, Toshihiko*; Murase, Yuji*; Onishi, Kazunori*; Hirao, Toshio; Kamiya, Tomihiro
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.111 - 114, 2004/10
no abstracts in English
Takahashi, Yoshihiro*; Onishi, Kazunori*; Fujimaki, Takeshi*; Yoshikawa, Masahito
IEEE Transactions on Nuclear Science, 46(6), p.1578 - 1585, 1999/12
Times Cited Count：23 Percentile：82.43(Engineering, Electrical & Electronic)no abstracts in English
Takahashi, Yoshihiro*; Onishi, Kazunori*; Fujimaki, Takeshi*; Yoshikawa, Masahito
Proceedings of 3rd International Workshop on Radiation Effects on Semiconductor Devices for Space Application, p.10 - 15, 1998/00
no abstracts in English
Saito, Kazunari; Yoshikawa, Masahito; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Takahashi, Yoshihiro*; Onishi, Kazunori*
JAERI-Conf 97-003, p.243 - 248, 1997/03
no abstracts in English
Yoshikawa, Masahito; ; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Yoshida, Sadafumi*; Okumura, Hajime*; Takahashi, Yoshihiro*; Onishi, Kazunori*
Journal of Applied Physics, 80(1), p.282 - 287, 1996/07
Times Cited Count：22 Percentile：70.38(Physics, Applied)no abstracts in English
Onishi, Kazunori*; Takahashi, Yoshihiro*; ; Yoshikawa, Masahito
JAERI-Research 95-090, 40 Pages, 1996/01
JAERI-Research-95-090.pdf:1.41MB
no abstracts in English
Takahashi, Yoshihiro*; Imaki, Shunsaku*; Onishi, Kazunori*; Yoshikawa, Masahito
Proceedings of IEEE 1995 International Coferece on Microelectronic Test Structures, Vol.8, p.243 - 246, 1995/03
no abstracts in English
; ; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*
Heisei-7-Nendo Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Rombunshu, 0, p.153 - 154, 1995/00
no abstracts in English
annealing due to 
-ray irradiation; Gate voltage dependenceImaki, Shunsaku*; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*
Heisei-7-Nendo Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Rombunshu, 0, p.151 - 152, 1995/00
no abstracts in English
Onishi, Kazunori*; Takahashi, Yoshihiro*; Imaki, Shunsaku*; ; Yoshikawa, Masahito
Proc. of 21st Int. Symp. for Testing and Failure Analysis (ISTFA 95), 0, p.269 - 274, 1995/00
no abstracts in English
-ray radiation; ; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*
Denshi Joho Tsushin Gakkai Gijutsu Kenkyu Hokoku, 93(172), p.23 - 27, 1993/07
no abstracts in English
-ray irradiated 3C-SiC MOS structureNemoto, Norio*; Yoshikawa, Masahito; Nashiyama, Isamu; Yoshida, Sadafumi*; Onishi, Kazunori*
Heisei-5-Nendo (Dai-37-Kai) Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Koen Rombunshu; Zairyo, Bussei, p.149 - 150, 1993/00
no abstracts in English
-ray irradiation; ; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*
Heisei-5-Nendo (Dai-37-Kai) Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Koen Rombunshu; Zairyo, Bussei, p.131 - 132, 1993/00
no abstracts in English
; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*
Heisei-5-Nendo (Dai-37-Kai) Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Koen Rombunshu; Zairyo, Bussei, p.133 - 134, 1993/00
no abstracts in English
Imaki, Shunsaku*; ; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*
Heisei-5-Nendo (Dai-37-Kai) Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Koen Rombunshu; Zairyo, Bussei, p.135 - 136, 1993/00
no abstracts in English
