Magnetism induced by interlayer electrons in the quasi-two-dimensional electride YC; Inelastic neutron scattering study

Tamatsukuri, Hiromu; Murakami, Yoichi*; Kuramoto, Yoshio*; Sagayama, Hajime*; Matsuura, Masato*; Kawakita, Yukinobu; Matsuishi, Satoru*; Washio, Yasuhito*; Inoshita, Takeshi*; Hamada, Noriaki*; et al.

Physical Review B, 102(22), p.224406_1 - 224406_5, 2020/12

https://doi.org/10.1103/PhysRevB.102.224406

Direct observation of strain in InAs quantum dots and cap layer during molecular beam epitaxial growth using X-ray diffraction

Shimomura, Kenichi*; Suzuki, Hidetoshi*; Sasaki, Takuo; Takahashi, Masamitsu; Oshita, Yoshio*; Kamiya, Itaru*

Journal of Applied Physics, 118(18), p.185303_1 - 185303_7, 2015/11

https://doi.org/10.1063/1.4935456

Defect characterization in compositionally graded InGaAs layers on GaAs (001) grown by MBE

Sasaki, Takuo; Norman, A. G.*; Romero, M. J.*; Al-Jassim, M. M.*; Takahashi, Masamitsu; Kojima, Nobuaki*; Oshita, Yoshio*; Yamaguchi, Masafumi*

Physica Status Solidi (C), 10(11), p.1640 - 1643, 2013/11

https://doi.org/10.1002/pssc.201300284

In situ three-dimensional X-ray reciprocal-space mapping of GaAs epitaxial films on Si(001)

Takahashi, Masamitsu; Nakata, Yuka*; Suzuki, Hidetoshi*; Ikeda, Kazuma*; Kozu, Miwa; Hu, W.; Oshita, Yoshio*

Journal of Crystal Growth, 378, p.34 - 36, 2013/09

https://doi.org/10.1016/j.jcrysgro.2012.12.119

Real-time structural analysis of compositionally graded InGaAs/GaAs(001) layers

Sasaki, Takuo*; Suzuki, Hidetoshi*; Inagaki, Makoto*; Ikeda, Kazuma*; Shimomura, Kenichi*; Takahashi, Masamitsu; Kozu, Miwa*; Hu, W.; Kamiya, Itaru*; Oshita, Yoshio*; et al.

IEEE Journal of Photovoltaics, 2(1), p.35 - 40, 2012/01

https://doi.org/10.1109/JPHOTOV.2011.2174198

Growth temperature dependence of strain relaxation during InGaAs/GaAs(0 0 1) heteroepitaxy

Sasaki, Takuo*; Suzuki, Hidetoshi*; Sai, Akihisa*; Takahashi, Masamitsu; Fujikawa, Seiji; Kamiya, Itaru*; Oshita, Yoshio*; Yamaguchi, Masafumi*

Journal of Crystal Growth, 323(1), p.13 - 16, 2011/05

https://doi.org/10.1016/j.jcrysgro.2010.10.005

Growth temperature dependence of strain relaxation during InGaAs/GaAs(001) molecular beam epitaxy was studied by in situ X-ray reciprocal space mapping. Evolution of the residual strain and crystal quality for the InGaAs film was obtained as a function of film thickness at growth temperatures of 420, 445 and 477 C. In the early stages of strain relaxation, it was found that evolution of the residual strain and crystal quality was dependent on the growth temperature. In order to discuss this observation quantitatively, the strain relaxation model was proposed based on the Dodson-Tsao kinetic model, and its validity was demonstrated by good agreement with the experimental residual strain. Additionally, rate coefficients reflecting dislocation motions during strain relaxation were obtained as a function of growth temperature and strain relaxation was discussed in terms of the thermally active dislocation motion.

In situ study of strain relaxation mechanisms during lattice-mismatched InGaAs/GaAs growth by X-ray reciprocal space mapping

Sasaki, Takuo*; Suzuki, Hidetoshi*; Sai, Akihisa*; Takahashi, Masamitsu; Fujikawa, Seiji; Oshita, Yoshio*; Yamaguchi, Masafumi*

Materials Research Society Symposium Proceedings, Vol.1268, 6 Pages, 2010/05

https://doi.org/10.1557/PROC-1268-EE06-02

Energetic protons from a few-micron metallic foil evaporated by an intense laser pulse

Matsukado, Koji*; Esirkepov, T. Z.; Kinoshita, Kenichi*; Daido, Hiroyuki; Utsumi, Takayuki*; Li, Z.*; Fukumi, Atsushi*; Hayashi, Yukio; Orimo, Satoshi; Nishiuchi, Mamiko; et al.

Physical Review Letters, 91(21), p.215001_1 - 215001_4, 2003/11

https://doi.org/10.1103/PhysRevLett.91.215001

no abstracts in English

Study on Evaluation of Excavation Disturbed Zone at kamaishi Mine in 1996

Horita, Masakuni*; Kinoshita, Naoto*; Yoshioka, Naoya*; Tsuchihara, H.*

JNC TJ7400 2005-014, 424 Pages, 1997/03

In this study, the excavation disturbed zone (EDZ) in deep rock is evaluated in the 250m-level drift st the Kamaishi Mine for the kamaishi In-situ Test Project, Phase II.

Study on Evaluation of Excavation Disturbed Zone at kamaishi Mine

Horita, Masakuni*; Kinoshita, Naoto*; Yoshioka, Naoya*; Nagahisa, K.*

JNC TJ7400 2005-013, 445 Pages, 1995/03

JNC-TJ7400-2005-013.PDF:15.85MB

The characteristics and extend of EDZ around an exting drift are evaluated by means of several investigation techniques and test in the drift and borehole.