JAEA
  • help
  • PC | SP
  • JP | EN
          
Refine your search：     
Report No.
 - 
Clear All
Search Results: Records 1-2 displayed on this page of 2
  • 1

Presentation/Publication Type

Initialising ...

Refine

Journal/Book Title

Initialising ...

Meeting title

Initialising ...

First Author

Initialising ...

Keyword

Initialising ...

Language

Initialising ...

Publication Year

Initialising ...

Held year of conference

Initialising ...

Save select records

Journal Articles

Comprehensive study on layout dependence of soft errors in CMOS latch circuits and its scaling trend for 65 nm technology node and beyond

Fukui, Hironobu*; Hamaguchi, Masafumi*; Yoshimura, Hisao*; Oyamatsu, Hisato*; Matsuoka, Fumitomo*; Noguchi, Tatsuo*; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Yamakawa, Takeshi; et al.

Proceedings of 2005 Symposia on VLSI Technology and Circuits, p.222 - 223, 2005/00

no abstracts in English

Journal Articles

Study on proton-induced single event upset in Sub-0.1$$mu$$m CMOS LSIs

Fukui, Hironobu*; Hamaguchi, Masafumi*; Yoshimura, Hisao*; Oyamatsu, Hisato*; Matsuoka, Fumitomo*; Noguchi, Tatsuo*; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Yamakawa, Takeshi; et al.

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.169 - 172, 2004/10

no abstracts in English

2 (Records 1-2 displayed on this page)
  • 1