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Journal Articles

$$E_1/E_2$$ traps in 6H-SiC studied with Laplace deep level transient spectroscopy

Koizumi, Atsushi*; Markevich, V. P.*; Iwamoto, Naoya; Sasaki, Sho*; Oshima, Takeshi; Kojima, Kazutoshi*; Kimoto, Tsunenobu*; Uchida, Kazuo*; Nozaki, Shinji*; Hamilton, B.*; et al.

Applied Physics Letters, 102(3), p.032104_1 - 032104_4, 2013/01

https://doi.org/10.1063/1.4788814
 Times Cited Count：11 Percentile：44.13(Physics, Applied)

Oral presentation

Observation of negative-U centers in n-type 6H-SiC using laplace DLTS

Koizumi, Atsushi*; Markevich, V. P.*; Iwamoto, Naoya; Sasaki, Sho*; Koike, Shumpei*; Oshima, Takeshi; Kojima, Kazutoshi*; Kimoto, Tsunenobu*; Uchida, Kazuo*; Nozaki, Shinji*; et al.

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