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Journal Articles

Characterization of surface carbon films on weathered Japanese roof tiles by soft X-ray spectroscopy

Muramatsu, Yasuji; Yamashita, Michiru*; Motoyama, Muneyuki*; Hirose, Mika*; Denlinger, J. D.*; Gullikson, E. M.*; Perera, R. C. C.*

X-Ray Spectrometry, 34(6), p.509 - 513, 2005/11

 Times Cited Count:0 Percentile:100(Spectroscopy)

Surface carbon films on the weathered Japanese roof tiles were characterized by soft X-ray spectroscopy. From the X-ray absorption measurements, it was confirmed that the surface carbon films were oxidized by weathering. On the ohterhand, from the X-ray emission measurements, it can be confirmed that the degree of the orientation was kept in the inner carbon films.

Journal Articles

Element-selective observation of electronic structure transition between semiconducting and metallic states in boron-doped diamond using soft X-ray emission and absorption spectroscopy

Iihara, Junji*; Muramatsu, Yasuji; Takebe, Toshihiko*; Sawamura, Akitaka*; Namba, Akihiko*; Imai, Takahiro*; Denlinger, J. D.*; Perera, R. C. C.*

Japanese Journal of Applied Physics, Part 1, 44(9A), p.6612 - 6617, 2005/09

 Times Cited Count:11 Percentile:57.24(Physics, Applied)

Electronic structure transition between semiconducting and metallic states in boron (B) -doped diamonds was element-selectively observed by soft X-ray emission and absorption spectroscopy using synchrotron radiation. For the lightly B-doped diamonds, the B 2$$p$$-density of states (DOS) in the valence band were enhanced with a steep-edge-feature near the Fermi level, and localized acceptor levels, characteristic of semiconductors, were clearly observed both in B 2$$p$$- and C 2$$p$$-DOS in the conduction bands. For the heavily B-doped diamonds, the localized acceptor levels developed into extended energy levels and new energy levels were generated to form an extended conduction band structure which overlapped with the valence band. Thus, this clarified that the metallic energy band structure is actually formed by heavy boron doping. Such valence and conduction band structures observed by soft X-ray emission and absorption spectroscopy well accounted for the electrical properties of the B-doped diamonds.

Journal Articles

Evaluation of carbon films on the Japanese smoked roof tile "Ibushi-Kawara" by angle-dependent soft X-ray emission spectroscopy using synchrotron radiation

Muramatsu, Yasuji; Yamashita, Michiru*; Motoyama, Muneyuki*; Denlinger, J. D.*; Gullikson, E. M.*; Perera, R. C. C.*

Spectrochimica Acta, Part B, 59(8), p.1317 - 1322, 2004/08

 Times Cited Count:2 Percentile:89.24(Spectroscopy)

Polarized emission spectra from graphite have been measured by an EPMA and discussed by means of molecular orbital calculation of 2p electrons densities of state of graphite by some of the present authors. The present study treats the refined measurements of the polarized C K-emission band spectra from the highly oriented pyrolytic graphite (HOPG) and discusses the structure of the surface carbons of Japanese traditional smoked roof tiles, Ibushi Kawara.

Journal Articles

Soft X-ray emission spectroscopy of polycyclic aromatic hydrocarbons

Muramatsu, Yasuji; Tomizawa, Kana; Denlinger, J. D.*; Perera, R. C. C.*

Journal of Electron Spectroscopy and Related Phenomena, 137-140(1-3), p.823 - 826, 2004/07

High-resolution CK X-ray emission spectra of polycyclic aromatic hydrocarbons (PAH) were measured using synchrotron radiation. The main peak energies in the PAH X-ray spectra shifted to a higher energy region as the ratio of hydrogenated outer carbon atoms to the non-hydrogenated inner carbon atoms increased. Discrete variational (DV)-X$$alpha$$ molecular orbital calculations provided theoretical confirmation that the spectral features depend on the ratio of hydrogenated/non-hydrogenated carbon atoms, which suggests that the features around the main peaks provide the information of the degree of hydrogenation in PAH compounds.

Journal Articles

First principles study of core-hole effect on fluorine K-edge X-ray absorption spectra of MgF$$_{2}$$ and ZnF$$_{2}$$

Yamamoto, Tomoyuki*; Mizoguchi, Teruyasu*; Tatsumi, Kazuyoshi*; Tanaka, Isao*; Adachi, Hirohiko*; Muramatsu, Yasuji; Gullikson, E. M.*; Perera, R. C. C.*

Materials Transactions, 45(7), p.1991 - 1993, 2004/07

 Times Cited Count:5 Percentile:60.8(Materials Science, Multidisciplinary)

First principles calculations have been carried out to investigate the core-hole effects on the theoretical fine structures of the X-ray absorption spectra of MgF$$_{2}$$ and ZnF$$_{2}$$ ath FK-edge. Experimental profiles of the near-edge X-ray absorption fine structures are well reproduced by the theoretical calculations when the core-hole effect is introduced. The dependence of supercell size on the theoretical fine structures is also examined.

Journal Articles

Soft X-ray emission and absorption spectra of typical solid carbon compounds

Muramatsu, Yasuji; Gullikson, E. M.*; Perera, R. C. C.*

X-sen Bunseki No Shimpo, 35, p.125 - 136, 2004/00

Soft X-ray emission and absorption spectra in the CK region of typical solid carbon compounds (HOPG, carbon nanotube, diamond, fullerene, polyethylene, ${it p}$-terphenyl, anthracene) are demonstrated. Take-off/incident-angle dependent X-ray spectra of HOPG are also shown to utilize for the structural analysis of anistropic crystals. Spectral analysis of these compounds using discrete variational (DV)-X$$alpha$$ molecular orbital calclations is also demonstrated.

Journal Articles

Characterization of carbon films on the Japanese smoked roof tile "Ibushi-Kawara" by high-resolution soft X-ray spectroscopy

Muramatsu, Yasuji; Motoyama, Muneyuki*; Denlinger, J. D.*; Gullikson, E. M.*; Perera, R. C. C.*

Japanese Journal of Applied Physics, Part 1, 42(10), p.6551 - 6555, 2003/10

 Times Cited Count:5 Percentile:74.5(Physics, Applied)

Carbon films on Japanese smoked roof tile "Ibushi-Kawara" were characterized by high-resolution soft X-ray spectroscopy using synchrotron radiation. By comparing the soft X-ray emission and absorption spectra of Kawara with the reference carbon compounds, it was determined that the carbon films on Kawara consist of mostly carbon-black-like sp2 carbon atoms and that the surface also contains polyethylene-like sp3 carbon atoms. The take-off/incident-angle dependence on the X-ray emission/absorption spectra of Kawara implies that the carbon-black-like sp2 carbon atoms partially form a layer structure parallel to the basal clay plane. From the take-off-angle dependence of the p/s-peak intensity ratio in the X-ray emission spectra, the layer ordering of the carbon films is estimated to be 50% of highly oriented pyrolytic graphite (HOPG). Therefore, the metallic oxidized color and durability are due to the layer structure and the random structure that connects the layer-structured clusters, respectively.

Journal Articles

Angle-resolved soft X-ray emission and absorption spectroscopy of hexagonal boron nitride

Muramatsu, Yasuji; Kaneyoshi, Takahiro*; Gullikson, E. M.*; Perera, R. C. C.*

Spectrochimica Acta, Part A, 59(9), p.1951 - 1957, 2003/07

Angle-resolved soft X-ray emission and absorption spectra in the BK and NK regions of hexagonal BN were measured using polarized synchrotron radiation. The take-off/incident-angle-dependence on the spectral features in both X-ray emission and absorption is clearly observed. The configuration of the s and p orbitals, which were calculated using discrete variaional (DV) -Xa molecular orbital calculations, explains the angle-resolved soft X-ray emission and absorption spectra. The relative peak intensity of the 394-eV peak in the NK X-ray emission provides useful information about the BN layer ordering.

Journal Articles

Take-off/incident-angle-dependence of $$pi$$/$$sigma$$ peak intensity ratio in soft X-ray emission and absorption spectra of graphite and hexagonal boron nitride

Muramatsu, Yasuji; Gullikson, E. M.*; Perera, R. C. C.*

X-sen Bunseki No Shimpo, 34, p.153 - 163, 2003/00

Take-off/incident-angle-resolved soft X-ray emission and absorption spectra of highly oriented pyrolytic graphite (HOPG) and hexagonal boron nitride (h-BN) are measured by using polarized synchrotron radiation. The angle-dependent $$pi$$/$$sigma$$ peak intensity ratio can be explained by the configuration of $$pi$$- and $$sigma$$-orbitals, which provides the information of layer ordering in the graphite-like layered materials.

Journal Articles

Total-electron-yield X-ray standing-wave measurements of multilayer X-ray mirrors for interface structure evaluation

Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*

Japanese Journal of Applied Physics, Part 1, 41(6B), p.4250 - 4252, 2002/06

 Times Cited Count:9 Percentile:60.54(Physics, Applied)

no abstracts in English

Journal Articles

Experimental technique for radiative-process-resolved X-ray absorption spectroscopy at the inner-shell excitation thresholds

Muramatsu, Yasuji; Ueno, Yuko*; Sasaki, Teikichi; Gullikson, E. M.*; Perera, R. C. C.*

Journal of Synchrotron Radiation, 8(2), p.369 - 371, 2002/03

 Times Cited Count:2 Percentile:79.08(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Soft X-ray emission and absorption spectra in the 0 K region of microporous carbon and some reference aromatic compounds

Muramatsu, Yasuji; Kuramoto, Kentaro*; Gullikson, E. M.*; Perera, R. C. C.*

Surface Review and Letters, 9(1), p.267 - 270, 2002/02

 Times Cited Count:4 Percentile:72.79(Chemistry, Physical)

no abstracts in English

Journal Articles

Evaluation methods of interlayer-structure-distribution in multilayers by total-electron-yield X-ray standing wave measurements

Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*

X-sen Bunseki No Shimpo, 33, p.145 - 154, 2002/00

no abstracts in English

Journal Articles

Total-electron-yeild X-ray standing wave measurements of multilayer X-ray mirrors

Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*

Advanced Light Source Compendium of User Abstracts 2000, 10 Pages, 2001/07

no abstracts in English

Journal Articles

Soft X-ray reflectivity and structure evaluation of CoCr/C multilayer X-ray mirrors for spectral region around 6nm

Takenaka, Hisataka*; Nagai, Komei*; Ito, Hisashi*; Muramatsu, Yasuji; Kawamura, T.*; Gullikson, E. M.*; Perera, R. C. C.*

Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.337 - 340, 2001/07

 Times Cited Count:8 Percentile:45.47(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Soft X-ray reflectivity and structure evaluation of Ni/C/Ti/C multilayer X-ray mirrors for water-window region

Takenaka, Hisataka*; Ito, Hisashi*; Nagai, Komei*; Muramatsu, Yasuji; Gullikson, E. M.*; Perera, R. C. C.*

Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.341 - 344, 2001/07

 Times Cited Count:24 Percentile:15.09(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Soft X-ray emission and absorption spectra in the C K region of sputtered amorphous carbon films

Muramatsu, Yasuji; Hirono, Shigeru*; Umemura, Shigeru*; Ueno, Yuko*; Hayashi, Takayoshi*; Grush, M. M.*; Gullikson, E. M.*; Perera, R. C. C.*

Carbon, 39(9), p.1403 - 1407, 2001/06

 Times Cited Count:17 Percentile:41.2(Chemistry, Physical)

no abstracts in English

Journal Articles

Soft X-ray emission and absorption spectra in the O K region of oxygen incorporated in microporous carbon

Muramatsu, Yasuji; Ueno, Yuko*; Ishiwata, Yoichi*; Eguchi, Ritsuko*; Watanabe, Masamitsu*; Shin, S.*; Perera, R. C. C.*

Carbon, 39(9), p.1359 - 1402, 2001/06

no abstracts in English

Journal Articles

Soft X-ray emission spectra in the OK region of oxygen incorporated in microporous carbon

Muramatsu, Yasuji; Watanabe, Masamitsu*; Ueno, Yuko*; Shin, S.*; Perera, R. C. C.*

Journal of Electron Spectroscopy and Related Phenomena, 114-116, p.301 - 305, 2001/03

 Times Cited Count:1 Percentile:94.86(Spectroscopy)

no abstracts in English

Journal Articles

Chemical bonding state analysis of silicon carbide layers in Mo/SiC/Si multilayer mirrors by soft X-ray emission and absorption spectroscopy

Muramatsu, Yasuji; Takenaka, Hisataka*; Ueno, Yuko*; Gullikson, E. M.*; Perera, R. C. C.*

Applied Physics Letters, 77(17), p.2653 - 2655, 2000/10

 Times Cited Count:12 Percentile:49.33(Physics, Applied)

no abstracts in English

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