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Detection of internal defect in materials by infrared thermography and its numerical simulation; Effect of thermal diffusivity of materials on defect detection

Ishii, Toshimitsu; Inagaki, Terumi*; Sakane, Taisuke*; Nakatani, Takahiko*; Ooka, Norikazu; Omi, Masao; Hoshiya, Taiji

Hihakai Kensa, 51(4), p.223 - 230, 2002/04

http://ci.nii.ac.jp/naid/10007951261

no abstracts in English