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Oikawa, Kenichi; Matsumoto, Yoshihiro*; Watanabe, Kenichi*; Sato, Hirotaka*; Parker, J. D.*; Shinohara, Takenao; Kiyanagi, Yoshiaki*
Scientific Reports (Internet), 14, p.27990_1 - 27990_11, 2024/11
Times Cited Count:0 Percentile:0.00(Multidisciplinary Sciences)Matsumoto, Yoshihiro*; Oikawa, Kenichi; Watanabe, Kenichi*; Sato, Hirotaka*; Parker, J. D.*; Shinohara, Takenao; Kiyanagi, Yoshiaki*
Journal of Archaeological Science; Reports, 58, p.104729_1 - 104729_10, 2024/10
Lan, Z.*; Arikawa, Yasunobu*; Mirfayzi, S. R.*; Morace, A.*; Hayakawa, Takehito*; Sato, Hirotaka*; Kamiyama, Takashi*; Wei, T.*; Tatsumi, Yuta*; Koizumi, Mitsuo; et al.
Nature Communications (Internet), 15, p.5365_1 - 5365_7, 2024/07
Times Cited Count:2Oikawa, Kenichi; Sato, Hirotaka*; Watanabe, Kenichi*; Su, Y. H.; Shinohara, Takenao; Kai, Tetsuya; Kiyanagi, Yoshiaki*; Hasemi, Hiroyuki
Journal of Physics; Conference Series, 2605, p.012013_1 - 012013_6, 2023/10
Ito, Daisuke*; Sato, Hirotaka*; Odaira, Naoya*; Saito, Yasushi*; Parker, J. D.*; Shinohara, Takenao; Kai, Tetsuya; Oikawa, Kenichi
Journal of Nuclear Materials, 569, p.153921_1 - 153921_6, 2022/10
Times Cited Count:3 Percentile:48.92(Materials Science, Multidisciplinary)Sakurai, Yosuke*; Sato, Hirotaka*; Adachi, Nozomu*; Morooka, Satoshi; Todaka, Yoshikazu*; Kamiyama, Takashi*
Applied Sciences (Internet), 11(11), p.5219_1 - 5219_17, 2021/06
Times Cited Count:4 Percentile:41.32(Chemistry, Multidisciplinary)Shinohara, Takenao; Kai, Tetsuya; Oikawa, Kenichi; Nakatani, Takeshi; Segawa, Mariko; Hiroi, Kosuke; Su, Y. H.; Oi, Motoki; Harada, Masahide; Iikura, Hiroshi; et al.
Review of Scientific Instruments, 91(4), p.043302_1 - 043302_20, 2020/04
Times Cited Count:69 Percentile:96.96(Instruments & Instrumentation)Oikawa, Kenichi; Kiyanagi, Yoshiaki*; Sato, Hirotaka*; Omae, Kazuma*; Pham, A.*; Watanabe, Kenichi*; Matsumoto, Yoshihiro*; Shinohara, Takenao; Kai, Tetsuya; Harjo, S.; et al.
Materials Research Proceedings, Vol.15, p.207 - 213, 2020/02
Ito, Daisuke*; Sato, Hirotaka*; Saito, Yasushi*; Parker, J. D.*; Shinohara, Takenao; Kai, Tetsuya
Journal of Visualization, 22(5), p.889 - 895, 2019/06
Times Cited Count:2 Percentile:6.57(Computer Science, Interdisciplinary Applications)Ishikawa, Hirotaku*; Kai, Tetsuya; Sato, Hirotaka*; Kamiyama, Takashi*
Journal of Nuclear Science and Technology, 56(2), p.221 - 227, 2019/02
Times Cited Count:4 Percentile:36.10(Nuclear Science & Technology)Oikawa, Kenichi; Su, Y. H.; Kiyanagi, Ryoji; Kawasaki, Takuro; Shinohara, Takenao; Kai, Tetsuya; Hiroi, Kosuke; Harjo, S.; Parker, J. D.*; Matsumoto, Yoshihiro*; et al.
Physica B; Condensed Matter, 551, p.436 - 442, 2018/12
Times Cited Count:6 Percentile:27.64(Physics, Condensed Matter)Oba, Yojiro; Shinohara, Takenao; Sato, Hirotaka*; Onodera, Yohei*; Hiroi, Kosuke; Su, Y. H.; Sugiyama, Masaaki*
Journal of the Physical Society of Japan, 87(9), p.094004_1 - 094004_5, 2018/09
Times Cited Count:1 Percentile:11.13(Physics, Multidisciplinary)no abstracts in English
Sato, Hirotaka*; Shiota, Yoshinori*; Morooka, Satoshi; Todaka, Yoshikazu*; Adachi, Nozomu*; Sadamatsu, Sunao*; Oikawa, Kenichi; Harada, Masahide; Zhang, S.*; Su, Y. H.; et al.
Journal of Applied Crystallography, 50(6), p.1601 - 1610, 2017/12
Times Cited Count:19 Percentile:81.17(Chemistry, Multidisciplinary)Su, Y. H.; Oikawa, Kenichi; Shinohara, Takenao; Kai, Tetsuya; Hiroi, Kosuke; Harjo, S.; Kawasaki, Takuro; Gong, W.; Zhang, S. Y.*; Parker, J. D.*; et al.
Physics Procedia, 88, p.42 - 49, 2017/06
Times Cited Count:5 Percentile:87.78(Instruments & Instrumentation)Oikawa, Kenichi; Su, Y. H.; Tomota, Yo*; Kawasaki, Takuro; Shinohara, Takenao; Kai, Tetsuya; Hiroi, Kosuke; Zhang, S.*; Parker, J. D.*; Sato, Hirotaka*; et al.
Physics Procedia, 88, p.34 - 41, 2017/00
Times Cited Count:5 Percentile:87.78(Instruments & Instrumentation)Time of flight Bragg edge transmission (BET) imaging was adopted to the plastically bent plates of a ferritic steel and a duplex stainless steel, and the obtained results were validated using neutron diffraction method and electron backscatter diffraction (EBSD) observations. The BET imaging results of texture distribution and phase volume fractions showed good agreements with those obtained by neutron diffraction and EBSD. The crystallite size evaluation using extinction correction was succeeded by the RITS code where Sabine's primary extinction function was applied, however, the crystallite size was not obtained by the Rietveld refinement where the same function was used for the evaluation. In this study, we comparatively reinvestigate the crystallite size and the dislocation density of the plastically bent steel plates by the use of Pawley analysis on the diffraction data and grain analysis on EBSD data.
Oba, Yojiro*; Morooka, Satoshi; Sato, Hirotaka*; Sato, Nobuhiro*; Inoue, Rintaro*; Sugiyama, Masaaki*
Hamon, 26(4), p.170 - 173, 2016/11
Su, Y. H.; Oikawa, Kenichi; Harjo, S.; Shinohara, Takenao; Kai, Tetsuya; Harada, Masahide; Hiroi, Kosuke; Zhang, S.*; Parker, J. D.*; Sato, Hirotaka*; et al.
Materials Science & Engineering A, 675, p.19 - 31, 2016/10
Times Cited Count:27 Percentile:74.39(Nanoscience & Nanotechnology)Shinohara, Takenao; Kai, Tetsuya; Oikawa, Kenichi; Segawa, Mariko; Harada, Masahide; Nakatani, Takeshi; Oi, Motoki; Aizawa, Kazuya; Sato, Hirotaka*; Kamiyama, Takashi*; et al.
Journal of Physics; Conference Series, 746, p.012007_1 - 012007_6, 2016/00
Times Cited Count:59 Percentile:99.80(Physics, Nuclear)no abstracts in English
Abe, Shinichiro; Sato, Tatsuhiko; Matsuba, Hirotaka*; Watanabe, Yukinobu*
Proceedings of 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-11) (Internet), p.45 - 48, 2015/11
Secondary cosmic-rays have been recognized as a cause of soft errors for microelectronics in terrestrial environment. Recently, the contribution of terrestrial muons to soft errors is concerned for advanced microelectronics because it becomes small and sensitive to radiation. Muons generate energetic secondary through photonuclear interaction and negative muon capture. In the present work, we investigate the effect of these interactions on terrestrial muon-induced soft errors. The analysis of soft error rate (SER) in the 25-nm design rule NMOSFET is performed based on the multiple sensitive volume (MSV) model using PHITS. It is clarified that the terrestrial muon-induced SER is a few or less of neutron-induced SER and it is mainly caused though negative muon capture while the effect of muon photonuclear interaction is small. It is also found that direct ionization only affects soft errors with extremely low critical charge.
Su, Y. H.; Oikawa, Kenichi; Kawasaki, Takuro; Kai, Tetsuya; Shiota, Yoshinori*; Sato, Hirotaka*; Shinohara, Takenao; Tomota, Yo*; Harada, Masahide; Kiyanagi, Ryoji; et al.
JPS Conference Proceedings (Internet), 8, p.031015_1 - 031015_5, 2015/09
In this study, neutron imaging experiment was performed using NOBORU, BL10 of MLF at J-PARC. Four kinds of cast duplex stainless steel with ferrite and austenite microstructure were studied here, which were produced by different casting method at different temperature. Firstly, two-dimensional scintillation detector using wavelength-shifting fibers with pixel size of 0.52 mm 0.52 mm and illuminated area 55 mm
55 mm was used for data collection. Then, measurement by Micro Pixel Chamber based neutron imaging detector having higher spatial resolution about 0.2 mm was conducted. Data analysis code RITS (Rietveld Imaging of Transmission Spectra) will be used for microstructure including crystalline phase, lattice strain, crystallite size, texture evaluation.