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JAEA Reports

Structural investigation of borosilicate glasses by using XAFS measurement in Soft X-ray region (Joint research)

Nagai, Takayuki; Okamoto, Yoshihiro; Yamagishi, Hirona*; Ota, Toshiaki*; Kojima, Kazuo*; Inose, Takehiko*; Sato, Seiichi*; Hatakeyama, Kiyoshi*

JAEA-Research 2021-010, 62 Pages, 2022/01

JAEA-Research-2021-010.pdf:6.05MB

The local structure of glass-forming elements and waste elements in borosilicate glasses varies with its chemical composition. In this study, borosilicate glass frit and simulated waste glass samples were prepared and the local structure and chemical state regarding boron(B), oxygen(O), silicon(Si) and waste elements of iron(Fe), cesium(Cs) were estimated by using XAFS measurement in soft X-ray region. Following results were obtained by XAFS measurements of prepared glass frit and simulated waste glass samples: (1) The effect of Na$$_{2}$$O concentration on B-O coordination structure is greater than that of the waste elements concentration. (2) The height of pre-edge by O K-edge spectrum depends on the concentration of first transition elements such as Fe in glass samples. Following results were obtained by XAFS measurements of simulated waste glass samples after immersion test to investigate the long chemical stability. (1) A new compound was formed on the sample surface after the immersion test, and changes in the surface state were confirmed by Raman spectroscopy. (2) Cs on the sample surface after immersion test dissolves into the leaching solution. The Si K-edge XANES spectra of borosilicate glass frits and simulated waste glass samples included lanthanides oxide were measured, and following was confirmed. (1) As the Na$$_{2}$$O concentration increases in borosilicate glass frit, the K-edge peak of Si shifts to the low energy side. (2) The peak height of the K-edge of Si differs depending on the kind of lanthanide.

Journal Articles

Visualization of radioactive substances using a freely moving gamma-ray imager based on Structure from Motion

Sato, Yuki; Minemoto, Kojiro*; Nemoto, Makoto*; Torii, Tatsuo

Journal of Nuclear Engineering and Radiation Science, 7(4), p.042003_1 - 042003_12, 2021/10

Journal Articles

3D position and radioactivity estimation of radiation source by a simple directional radiation detector combined with structure from motion

Sato, Yuki; Minemoto, Kojiro*; Nemoto, Makoto*

Radiation Measurements, 142, p.106557_1 - 106557_6, 2021/03

 Times Cited Count:0 Percentile:0.01(Nuclear Science & Technology)

Journal Articles

Automatic data acquisition for visualizing radioactive substances by combining a gamma-ray imager and an autonomous mobile robot

Sato, Yuki; Minemoto, Kojiro*; Nemoto, Makoto*; Torii, Tatsuo

Journal of Instrumentation (Internet), 16(1), p.P01020_1 - P01020_18, 2021/01

 Times Cited Count:0 Percentile:0(Instruments & Instrumentation)

Journal Articles

Construction of virtual reality system for radiation working environment reproduced by gamma-ray imagers combined with SLAM technologies

Sato, Yuki; Minemoto, Kojiro*; Nemoto, Makoto*; Torii, Tatsuo

Nuclear Instruments and Methods in Physics Research A, 976, p.164286_1 - 164286_6, 2020/10

 Times Cited Count:6 Percentile:93.25(Instruments & Instrumentation)

JAEA Reports

Structural investigation of simulated waste glass samples by using XAFS measurement in soft X-ray region (Joint research)

Nagai, Takayuki; Okamoto, Yoshihiro; Yamagishi, Hirona*; Ota, Toshiaki*; Kojima, Kazuo*; Inose, Takehiko*; Sato, Seiichi*; Hatakeyama, Kiyoshi*

JAEA-Research 2020-009, 48 Pages, 2020/09

JAEA-Research-2020-009.pdf:4.53MB

The local structure of glass-forming elements and waste elements in waste glass varies with its chemical composition. In this study, borosilicate glass frit and simulated waste glass samples were prepared and the local structure and chemical state regarding boron (B), oxygen (O), and waste elements of cerium (Ce), cesium (Cs) were estimated by using XAFS measurement in soft X-ray region. Following results were obtained by XAFS measurements of prepared glass frit and simulated waste glass samples: (1) The existence ratio of four coordinate sp$$^{3}$$ structure (BO$$_{4}$$) tends to increase with increasing Na$$_{2}$$O content in glass samples. (2) The height of a pre-edge which appears by K-edge XANES spectrum of O is so high that the Fe content in glass samples. Following results were obtained by XAFS measurements of simulated waste glass samples after immersion test to investigate long chemical stability. (1) The existence ratio of four coordinate sp$$^{3}$$ structure (BO$$_{4}$$) increases by immersion test. (2) Ce which exists in the surface layer is oxidized by immersion test, and much of Cs in surface layer is lost after leach testing. Even if the glass frit form (fiber cartridge or beads) and manufacturing method were changed and a glass sample of the similar chemical composition was prepared, these observed Raman spectra of samples were different.

Journal Articles

Production of $$^{266}$$Bh in the $$^{248}$$Cm($$^{23}$$Na,5$$n$$)$$^{266}$$Bh reaction and its decay properties

Haba, Hiromitsu*; Fan, F.*; Kaji, Daiya*; Kasamatsu, Yoshitaka*; Kikunaga, Hidetoshi*; Komori, Yukiko*; Kondo, Narumi*; Kudo, Hisaaki*; Morimoto, Koji*; Morita, Kosuke*; et al.

Physical Review C, 102(2), p.024625_1 - 024625_12, 2020/08

 Times Cited Count:2 Percentile:57.67(Physics, Nuclear)

Journal Articles

Remote detection of radioactive hotspot using a Compton camera mounted on a moving multi-copter drone above a contaminated area in Fukushima

Sato, Yuki; Ozawa, Shingo*; Terasaka, Yuta; Minemoto, Kojiro*; Tamura, Satoshi*; Shingu, Kazutoshi*; Nemoto, Makoto*; Torii, Tatsuo

Journal of Nuclear Science and Technology, 57(6), p.734 - 744, 2020/06

 Times Cited Count:7 Percentile:95.29(Nuclear Science & Technology)

Journal Articles

Electronic structure of a (3$$times$$3)-ordered silicon layer on Al(111)

Sato, Yusuke*; Fukaya, Yuki; Cameau, M.*; Kundu, A. K.*; Shiga, Daisuke*; Yukawa, Ryu*; Horiba, Koji*; Chen, C.-H.*; Huang, A.*; Jeng, H.-T.*; et al.

Physical Review Materials (Internet), 4(6), p.064005_1 - 064005_6, 2020/06

 Times Cited Count:3 Percentile:51.8(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Impact of hydrided and non-hydrided materials near transistors on neutron-induced single event upsets

Abe, Shinichiro; Sato, Tatsuhiko; Kuroda, Junya*; Manabe, Seiya*; Watanabe, Yukinobu*; Liao, W.*; Ito, Kojiro*; Hashimoto, Masanori*; Harada, Masahide; Oikawa, Kenichi; et al.

Proceedings of IEEE International Reliability Physics Symposium (IRPS 2020) (Internet), 6 Pages, 2020/04

Single event upsets (SEUs) caused by neutrons have been recognized as a serious reliability problem for microelectronic devices on the ground level. In our previous work, it was found that hydride placed in front of the memory chip has considerably impact on SEU cross sections because H ions generated via elastic scattering of neutrons with hydrogen atoms are only emitted in a forward direction. In this study, the effect of components neighboring transistors on neutron-induced SEUs was investigated for 65-nm bulk SRAMs by using PHITS. It was found that the shape of the SEU cross section around few MeV comes from the thickness and the position of components placed in front of transistors when that components do not contains hydrogen atoms. By considering components adjoin memory cells in the test board used in the simulation, measured data at J-PARC BL10 were reproduced well. In addition, it was found that the effect of components neighboring transistors on neutron-induced SERs does not negligible in terrestrial environment.

Journal Articles

Heavy fermion state of YbNi$$_2$$Si$$_3$$ without local inversion symmetry

Nakamura, Shota*; Hyodo, Kazushi*; Matsumoto, Yuji*; Haga, Yoshinori; Sato, Hitoshi*; Ueda, Shigenori*; Mimura, Kojiro*; Saiki, Katsuyoshi*; Iso, Kosei*; Yamashita, Minoru*; et al.

Journal of the Physical Society of Japan, 89(2), p.024705_1 - 024705_5, 2020/02

 Times Cited Count:1 Percentile:32.18(Physics, Multidisciplinary)

Journal Articles

Negative and positive muon-induced single event upsets in 65-nm UTBB SOI SRAMs

Manabe, Seiya*; Watanabe, Yukinobu*; Liao, W.*; Hashimoto, Masanori*; Nakano, Keita*; Sato, Hikaru*; Kin, Tadahiro*; Abe, Shinichiro; Hamada, Koji*; Tampo, Motonobu*; et al.

IEEE Transactions on Nuclear Science, 65(8), p.1742 - 1749, 2018/08

 Times Cited Count:6 Percentile:64.98(Engineering, Electrical & Electronic)

Recently, the malfunction of microelectronics caused by secondary cosmic-ray muon is concerned as semiconductor devices become sensitive to radiation. In this study, we have performed muon irradiation testing for 65-nm ultra-thin body and thin buried oxide (UTBB-SOI) SRAMs in the Japan Proton Accelerator Research Complex (J-PARC), in order to investigate dependencies of single event upset (SEU) cross section on incident muon momentum and supply voltage. It was found that the SEU cross section by negative muon are approximately two to four times larger than those by positive muon in the momentum range from 35 MeV/c to 39 MeV/c. The supply voltage dependence of muon-induced SEU cross section was measured with the momentum of 38 MeV/c. SEU cross sections decrease with increasing supply voltage, but the decreasing of SEU cross section by negative muon is gentler than that by positive muon. Experimental data of positive and negative muon irradiation with the momentum of 38 MeV/c were analyzed by PHITS. It was clarified that the negative muon capture causes the difference between the SEU cross section by negative muon and that by positive muon.

Journal Articles

Measurement and mechanism investigation of negative and positive muon-induced upsets in 65-nm Bulk SRAMs

Liao, W.*; Hashimoto, Masanori*; Manabe, Seiya*; Watanabe, Yukinobu*; Abe, Shinichiro; Nakano, Keita*; Sato, Hikaru*; Kin, Tadahiro*; Hamada, Koji*; Tampo, Motonobu*; et al.

IEEE Transactions on Nuclear Science, 65(8), p.1734 - 1741, 2018/08

 Times Cited Count:12 Percentile:91.11(Engineering, Electrical & Electronic)

Soft error induced by secondary cosmic-ray muon is concerned since susceptibility of semiconductor device to soft error increases with the scaling of technology. In this study, we have performed irradiation tests of muons on 65-nm bulk CMOS SRAM in the Japan Proton Accelerator Research Complex (J-PARC) and measured soft error rate (SER) to investigate mechanism of muon-induced soft errors. It was found that SER by negative muon increases above 0.5 V supply voltage, although SER by positive muon increases monotonically as the supply voltage lowers. SER by negative muon also increases with forward body bias. In addition, negative muon causes large multiple cell upset (MCU) of more than 20 bits and the ratio of MCU events to all the events is 66% at 1.2V supply voltage. These tendencies indicate that parasitic bipolar action (PBA) is highly possible to contribute to SER by negative muon. Experimental data are analyzed by PHITS. It was found that negative muon can deposit larger charge than positive muon, and such events that can deposit large charge may trigger PBA.

Journal Articles

Cluster formation in relativistic nucleus-nucleus collisions

Ogawa, Tatsuhiko; Sato, Tatsuhiko; Hashimoto, Shintaro; Niita, Koji*

Physical Review C, 98(2), p.024611_1 - 024611_15, 2018/08

 Times Cited Count:0 Percentile:0.02(Physics, Nuclear)

Particle production by nucleus-nucleus reactions in the energy range from GeV to TeV is substantially important for safety evaluation in heavy ion accelerators and evaluation of space radiation dose. A lot of models and theories have been studied. In the models developed in the past, interaction between nucleons were dependent on the reference frame; therefore the moving incident nucleus and the target nucleus at rest transferred to the common frame were disintegrated. Previously, intentional bias was introduced to the calculation algorithms to supplement stability but residual nucleus mass and secondary particle production was underestimated. In this study, a reaction model JAMQMD was developed, in which intra-nucleon interaction was described in a frame-independent way. This model can reproduce the stability of nuclei regardless of the reference frame and the yield of residual nuclei as well as secondary particles including deuterons. JQMD Ver.2 developed 3 years ago can simulate nucleus-nucleus reactions up to 3 GeV/nucleon; therefore the development of JAMQMD is the doorway to simulate nucleus-nucleus reactions regardless of the incident energy. JAMQMD is an useful model for not only radiation protection studies but also analysis of fundamental physics studies.

Journal Articles

Comparison of cosmic-ray environments on earth, moon, mars and in spacecraft using PHITS

Sato, Tatsuhiko; Nagamatsu, Aiko*; Ueno, Haruka*; Kataoka, Ryuho*; Miyake, Shoko*; Takeda, Kazuo*; Niita, Koji*

Radiation Protection Dosimetry, 180(1-4), p.146 - 149, 2018/08

 Times Cited Count:9 Percentile:84.45(Environmental Sciences)

Cosmic-ray dose rates spatially and temporally change very much. In this study, we compared the calculated cosmic-ray environments on the Earth, Moon, and Mars as well as inside spacecraft on low-earth orbit (LEO) and at interplanetary space. In the calculation, a galactic cosmic-ray model developed in DLR and trapped proton/electron models AP9/AE9 were used for determining the incident cosmic-ray fluxes, and the Particle and Heavy Ion Transport code System, PHITS, was employed for the cosmic-ray transport simulation in the Earth, Lunar, and Martian systems as well as spacecraft. The virtual International Space Station (ISS) model developed by JAXA was adopted as the representative of spacecraft in the PHITS simulation. This paper focuses on the comprehensive discussions on the difference of cosmic-ray environments and the effective methods of their shielding in various exposure situations.

Journal Articles

Features of particle and heavy ion transport code system (PHITS) version 3.02

Sato, Tatsuhiko; Iwamoto, Yosuke; Hashimoto, Shintaro; Ogawa, Tatsuhiko; Furuta, Takuya; Abe, Shinichiro; Kai, Takeshi; Tsai, P.-E.; Matsuda, Norihiro; Iwase, Hiroshi*; et al.

Journal of Nuclear Science and Technology, 55(6), p.684 - 690, 2018/06

 Times Cited Count:352 Percentile:100(Nuclear Science & Technology)

We have upgraded many features of the Particle and Heavy Ion Transport code System (PHITS) and released the new version as PHITS3.02. The accuracy and the applicable energy ranges of the code were greatly improved and extended, respectively, owing to the revisions to the nuclear reaction models and the incorporation of new atomic interaction models. In addition, several user-supportive functions were developed, such as new tallies to efficiently obtain statistically better results, radioisotope source-generation function, and software tools useful for applying PHITS to medical physics. In this paper, we summarize the basic features of PHITS3.02, especially those of the physics models and the functions implemented after the release of PHITS2.52 in 2013.

Journal Articles

2018 Annual Meeting of Japan Atomic Energy Society, Joint Session of Nuclear Data Subcommittee and Sigma Special Advisory Committee; Present status and future of nuclear data evaluation code in Japan, 4; Role and improvement of nuclear reaction models in the PHITS code

Hashimoto, Shintaro; Sato, Tatsuhiko; Iwamoto, Yosuke; Ogawa, Tatsuhiko; Furuta, Takuya; Abe, Shinichiro; Niita, Koji*

Kaku Deta Nyusu (Internet), (120), p.26 - 34, 2018/06

Particle and heavy-ion transport code system PHITS has been used for calculations of radiation shielding in accelerator facilities. PHITS describes physical phenomena induced by radiation as combination of transport and collision processes. The collision process including nuclear reactions is simulated by the three-step calculation: a generation of a reaction, pre-equilibrium, and compound processes. In the simulation, many physics models are used. This report explains roles of the models in PHITS and shows their developments we recently performed.

Journal Articles

Integrated simulation of fragmentation, evaporation, and gamma-decay processes in the interaction of cosmic-ray heavy ions with the atmosphere using PHITS

Ogawa, Tatsuhiko; Hashimoto, Shintaro; Sato, Tatsuhiko; Niita, Koji*; Kamae, Tsuneyoshi*

Proceedings of 3rd International Conference on Particle Physics and Astrophysics (ICPPA 2017) (Internet), p.391 - 398, 2018/04

BB2017-0888.pdf:1.97MB

 Times Cited Count:0

In the reactions of cosmic-ray heavy ions producing high-energy gamma-rays, heavy ions are directed to the ground therefore prompt gamma-rays from projectile fragments are boosted by Doppler effect and observed on the ground. Recently, a lot of experiments pay attention to such high energy gamma-rays. In order to simulate such high-energy gammas, event-by-event simulation of fragmentation reaction which determines the excitation energy and angular momentum of the produced fragment, and de-excitation simulation based on the nuclear structure data. Such models are available in the general-purpose radiation transport simulation code PHITS. JAERI Quantum Molecular Dynamics model was recently updated to accurately simulate charge and mass distribution of fragments. EBITEM, which was released recently, can simulate gamma deexcitation after evaporation based on the excitation energy and angular momentum. Thus latest PHITS can accurately simulate production of $$gamma$$-rays attributed to cosmic-ray heavy ions. This study shows a new approach to reproduce $$gamma$$-rays by cosmic-ray heavy ions.

Journal Articles

Investigation of hydrogen gas generation by radiolysis for cement-solidified products of used adsorbents for water decontamination

Sato, Junya; Kikuchi, Hiroshi*; Kato, Jun; Sakakibara, Tetsuro; Matsushima, Ryotatsu; Sato, Fuminori; Kojima, Junji; Nakazawa, Osamu

QST-M-8; QST Takasaki Annual Report 2016, P. 62, 2018/03

no abstracts in English

Journal Articles

Upgrade and Replacement of Plant Dynamics Test Loop (PLANDTL)

Uchiyama, Naoki*; Ozawa, Tatsuya*; Sato, Koji*; Kobayashi, Jun; Onojima, Takamitsu; Tanaka, Masaaki

FAPIG, (194), p.12 - 18, 2018/02

no abstracts in English

492 (Records 1-20 displayed on this page)