Structural analysis of high-energy implanted Ni atoms into Si(100) by X-ray absorption fine structure spectroscopy

Entani, Shiro*; Sato, Shinichiro*; Honda, Mitsunori; Suzuki, Chihiro*; Taguchi, Tomitsugu*; Yamamoto, Shunya*; Oshima, Takeshi*

Radiation Physics and Chemistry, 199, p.110369_1 - 110369_7, 2022/10

https://doi.org/10.1016/j.radphyschem.2022.110369

Ni silicide synthesis by Ni ion beam irradiation into Si attracts attention due to its advantages including the ability of formation of local structures, the controllability of ion beams, the formability of silicide without heat treatment and the high reproducibility of the resulting specimen. In this work, we investigate the local atomic structure of Si implanted with 3.0 MeV Ni ions. Analysis of Ni K-edge fluorescent-yield extended X-ray absorption fine structure reveals that Ni atoms have mixed structure of metallic-like face-centered cubic Ni and NiSi phases at the initial stage of the irradiation and the formation of NiSi promotes significantly with the ion fluence above 10 ions cm. With consideration of the agreement between the ion fluence threshold for the structural transition and the critical Si-amorphization fluence, it is concluded that the amorphization of Si plays an important role in the synthesis of the NiSi phase in Ni-irradiated Si.

Modernization of the DCHAIN-PHITS activation code with new features and updated data libraries

Ratliff, H.; Matsuda, Norihiro; Abe, Shinichiro; Miura, Takamitsu*; Furuta, Takuya; Iwamoto, Yosuke; Sato, Tatsuhiko

Nuclear Instruments and Methods in Physics Research B, 484, p.29 - 41, 2020/12

https://doi.org/10.1016/j.nimb.2020.10.005

Impact of hydrided and non-hydrided materials near transistors on neutron-induced single event upsets

Abe, Shinichiro; Sato, Tatsuhiko; Kuroda, Junya*; Manabe, Seiya*; Watanabe, Yukinobu*; Liao, W.*; Ito, Kojiro*; Hashimoto, Masanori*; Harada, Masahide; Oikawa, Kenichi; et al.

Proceedings of IEEE International Reliability Physics Symposium (IRPS 2020) (Internet), 6 Pages, 2020/04

https://doi.org/10.1109/IRPS45951.2020.9128951

Single event upsets (SEUs) caused by neutrons have been recognized as a serious reliability problem for microelectronic devices on the ground level. In our previous work, it was found that hydride placed in front of the memory chip has considerably impact on SEU cross sections because H ions generated via elastic scattering of neutrons with hydrogen atoms are only emitted in a forward direction. In this study, the effect of components neighboring transistors on neutron-induced SEUs was investigated for 65-nm bulk SRAMs by using PHITS. It was found that the shape of the SEU cross section around few MeV comes from the thickness and the position of components placed in front of transistors when that components do not contains hydrogen atoms. By considering components adjoin memory cells in the test board used in the simulation, measured data at J-PARC BL10 were reproduced well. In addition, it was found that the effect of components neighboring transistors on neutron-induced SERs does not negligible in terrestrial environment.

Overview of accident-tolerant fuel R&D program in Japan

Yamashita, Shinichiro; Ioka, Ikuo; Nemoto, Yoshiyuki; Kawanishi, Tomohiro; Kurata, Masaki; Kaji, Yoshiyuki; Fukahori, Tokio; Nozawa, Takashi*; Sato, Daiki*; Murakami, Nozomu*; et al.

Proceedings of International Nuclear Fuel Cycle Conference / Light Water Reactor Fuel Performance Conference (Global/Top Fuel 2019) (USB Flash Drive), p.206 - 216, 2019/09

After the nuclear accident at Fukushima Daiichi Power Plant, research and development (R&D) program for establishing technical basis of accident-tolerant fuel (ATF) started from 2015 in Japan. Since then, both experimental and analytical studies necessary for designing a new light water reactor (LWR) core with ATF candidate materials are being conducted within the Japanese ATF R&D Consortium for implementing ATF to the existing LWRs, accompanying with various technological developments required. Until now, we have accumulated experimental data of the candidate materials by out-of-pile tests, developed fuel evaluation codes to apply to the ATF candidate materials, and evaluated fuel behavior simulating operational and accidental conditions by the developed codes. In this paper, the R&D progresses of the ATF candidate materials considered in Japan are reviewed based on the information available such as proceedings of international conference and academic papers, providing an overview of ATF program in Japan.

Impact of irradiation side on neutron-induced single-event upsets in 65-nm Bulk SRAMs

Abe, Shinichiro; Liao, W.*; Manabe, Seiya*; Sato, Tatsuhiko; Hashimoto, Masanori*; Watanabe, Yukinobu*

IEEE Transactions on Nuclear Science, 66(7, Part2), p.1374 - 1380, 2019/07

https://doi.org/10.1109/TNS.2019.2902176

Single event upsets (SEUs) caused by secondary cosmic-ray neutrons have recognized as a serious reliability problem for microelectronic devices. Acceleration tests at neutron facilities are convenient to validate soft error rates (SERs) quickly, but some corrections caused from measurement conditions are required to derive realistic SERs at actual environment or to compare other measured data. In this study, the effect of irradiation side on neutron-induced SEU cross sections was investigated by performing neutron transport simulation using PHITS. SERs for 65-nm bulk CMOS SRAMs are estimated using the sensitive volume model. It was found from simulation that SERs for the sealant side irradiation are 30-50% larger than those for the board side irradiation. This difference comes from the difference of production yield and angular distribution of secondary H and He ions, which are the main cause of SEUs. Thus the direction of neutron irradiation should be reported when the result of acceleration tests are published. This result also indicates that SERs can be reduced by equipping device with sealant side facing downward.

Background radiation monitoring using manned helicopter for establishment of technique of nuclear emergency response in the fiscal year 2017 (Contract research)

Futemma, Akira; Sanada, Yukihisa; Iwai, Takeyuki*; Seguchi, Eisaku; Matsunaga, Yuki*; Kawabata, Tomoki; Toyoda, Masayuki*; Tobita, Shinichiro*; Hiraga, Shogo*; Sato, Kazuhiko*; et al.

JAEA-Technology 2018-016, 98 Pages, 2019/02

JAEA-Technology-2018-016.pdf:18.64MB

By the nuclear disaster of Fukushima Daiichi Nuclear Power Station (FDNPS), Tokyo Electric Power Company (TEPCO), caused by the Great East Japan Earthquake and the following tsunami on March 11, 2011, a large amount of radioactive material was released from the NPS. After the nuclear disaster, airborne radiation monitoring using manned helicopter was conducted around FDNPS. We have carried out the background monitoring around the nuclear power stations of the whole country to apply the airborne radiation monitoring technique that has been cultivated in Fukushima against nuclear emergency response. The results of monitoring around Tomari, Kashiwazaki-Kariwa and Genkai Nuclear Power Station in the fiscal 2017 were summarized in this report. In addition, technical issues were described.

Establishment of a novel detection system for measuring primary knock-on atoms

Tsai, P.-E.; Iwamoto, Yosuke; Hagiwara, Masayuki*; Sato, Tatsuhiko; Ogawa, Tatsuhiko; Satoh, Daiki; Abe, Shinichiro; Ito, Masatoshi*; Watabe, Hiroshi*

Proceedings of 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2017) (Internet), 3 Pages, 2018/11

https://doi.org/10.1109/NSSMIC.2017.8532975

The energy spectra of primary knock-on atoms (PKAs) are essential for radiation damage assessment in design of accelerator facilities. However up to date the experimental data are still limited, due to the poor mass resolution and the high measurement threshold energies in the conventional setup of nuclear physics experiments using solid state detectors, which are typically above a few MeV/nucleon. In this study, a novel detection system consisting of two time detectors and one dE-E energy detector is proposed and being constructed to measure the PKA spectra. The system and detector design was based on Monte Carlo simulations by using the PHITS code. The PHITS simulations show that the system is able to distinguish the PKA isotopes above 0.2-0.3 MeV/nucleon for A=2030 amu; the PKA mass identification thresholds decrease to 0.1 MeV/nucleon for PKAs lighter than 20 amu. The detection system will be tested in the summer of 2017, and the test results will be presented at the conference.

Measurement and mechanism investigation of negative and positive muon-induced upsets in 65-nm Bulk SRAMs

Liao, W.*; Hashimoto, Masanori*; Manabe, Seiya*; Watanabe, Yukinobu*; Abe, Shinichiro; Nakano, Keita*; Sato, Hikaru*; Kin, Tadahiro*; Hamada, Koji*; Tampo, Motonobu*; et al.

IEEE Transactions on Nuclear Science, 65(8), p.1734 - 1741, 2018/08

https://doi.org/10.1109/TNS.2018.2825469

Soft error induced by secondary cosmic-ray muon is concerned since susceptibility of semiconductor device to soft error increases with the scaling of technology. In this study, we have performed irradiation tests of muons on 65-nm bulk CMOS SRAM in the Japan Proton Accelerator Research Complex (J-PARC) and measured soft error rate (SER) to investigate mechanism of muon-induced soft errors. It was found that SER by negative muon increases above 0.5 V supply voltage, although SER by positive muon increases monotonically as the supply voltage lowers. SER by negative muon also increases with forward body bias. In addition, negative muon causes large multiple cell upset (MCU) of more than 20 bits and the ratio of MCU events to all the events is 66% at 1.2V supply voltage. These tendencies indicate that parasitic bipolar action (PBA) is highly possible to contribute to SER by negative muon. Experimental data are analyzed by PHITS. It was found that negative muon can deposit larger charge than positive muon, and such events that can deposit large charge may trigger PBA.

2018 Annual Meeting of Japan Atomic Energy Society, Joint Session of Nuclear Data Subcommittee and Sigma Special Advisory Committee; Present status and future of nuclear data evaluation code in Japan, 4; Role and improvement of nuclear reaction models in the PHITS code

Hashimoto, Shintaro; Sato, Tatsuhiko; Iwamoto, Yosuke; Ogawa, Tatsuhiko; Furuta, Takuya; Abe, Shinichiro; Niita, Koji*

Kaku Deta Nyusu (Internet), (120), p.26 - 34, 2018/06

http://www.aesj.or.jp/~ndd/ndnews/pdf120/No120-05.pdf

Particle and heavy-ion transport code system PHITS has been used for calculations of radiation shielding in accelerator facilities. PHITS describes physical phenomena induced by radiation as combination of transport and collision processes. The collision process including nuclear reactions is simulated by the three-step calculation: a generation of a reaction, pre-equilibrium, and compound processes. In the simulation, many physics models are used. This report explains roles of the models in PHITS and shows their developments we recently performed.

Background radiation monitoring using manned helicopter for establishment of technique of nuclear emergency response in the fiscal year 2016 (Contract research)

Sanada, Yukihisa; Mori, Airi; Iwai, Takeyuki; Seguchi, Eisaku; Matsunaga, Yuki*; Kawabata, Tomoki; Toyoda, Masayuki*; Tobita, Shinichiro*; Hiraga, Shogo; Sato, Yoshiharu; et al.

JAEA-Technology 2017-035, 69 Pages, 2018/02

JAEA-Technology-2017-035.pdf:32.92MB

By the nuclear disaster of Fukushima Daiichi Nuclear Power Station (FDNPS), Tokyo Electric Power Company (TEPCO), caused by the East Japan earthquake and the following tsunami occurred on March 11, 2011, a large amount of radioactive materials was released from the NPS. After the nuclear disaster, airborne radiation monitoring using manned helicopter was conducted around FDNPS. We carried out the background monitoring around the nuclear power stations of the whole country to apply a technique of the airborne radiation monitoring that is cultivated in Fukushima as a technology of nuclear emergency response. This result of the aerial radiation monitoring using the manned helicopter around Ooi, Takahama and Ikata Nuclear Power Station and in the fiscal 2016 were summarized in the report. In addition, technical issues were described.