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Journal Articles

Depth concentration profile for cesium atom in fullerene C$$_{60}$$ investigated using synchrotron X-ray photoelectron spectroscopy

Sekiguchi, Tetsuhiro; Yokoyama, Keiichi; Yaita, Tsuyoshi

Photon Factory Activity Report 2023 (Internet), 5 Pages, 2024/00

For nuclear transmutation of cesium-135 ($$^{135}$$Cs), which is long-lived fission product, we are developing selective absorbent which takes only Cs atom in, but does not CsI. In this study, absorbing property of Cs atom or CsI into fullerene (C$$_{60}$$) solid has been investigated using synchrotron-based angle-dependent X-ray photoelectron spectroscopy (ARXPS). It was found that Cs penetrates into C$$_{60}$$ deep bulk. In contrast, CsI does not diffuse into bulk, although CsI over-layer was formed on the shallow surface. Furthermore, XPS spectra were measured as a function of Ar$$^{+}$$-sputtering time in order to know Cs concentration profiles in further deep region. Results showed that Cs penetrates into deep region of several hundreds ${AA}$.

Journal Articles

Extended X-ray absorption fine structure spectroscopy measurements and ${it ab initio}$ molecular dynamics simulations reveal the hydration structure of the radium(II) ion

Yamaguchi, Akiko; Nagata, Kojiro*; Kobayashi, Keita; Tanaka, Kazuya; Kobayashi, Toru; Tanida, Hajime; Shimojo, Kojiro; Sekiguchi, Tetsuhiro; Kaneta, Yui; Matsuda, Shohei; et al.

iScience (Internet), 25(8), p.104763_1 - 104763_12, 2022/08

 Times Cited Count:15 Percentile:72.63(Multidisciplinary Sciences)

no abstracts in English

Journal Articles

Annealing effect of absorbing property for Cs and CsI in fullerene investigated by synchrotron X-ray photoelectron spectroscopy

Sekiguchi, Tetsuhiro; Yokoyama, Keiichi; Yaita, Tsuyoshi

e-Journal of Surface Science and Nanotechnology (Internet), 20(3), p.186 - 195, 2022/07

Cesium-135 having long life, 2.3 million y, that is contained in nuclear wastes may cause long-term pollution. Technology of isotopic separation of such long lived nuclide is indispensable not only for its volume reduction but also annihilation by nuclear transmutation. The recovery of atomic Cs from molecular CsI is mandatory. We have investigated fullerene C$$_{60}$$ as a potential absorber for Cs. Angle-resolved X-ray photoelectron spectroscopy, AR-XPS has been used to analyze the depth concentration distribution of Cs. Experiments were performed at soft X-ray beamline BL27A at KEK PF facility. We report on the annealing effect after deposition of Cs and the effect of heating substrate during deposition. For Cs/C$$_{60}$$ sample, the intensity ratio of Cs-3d/C-1s increased in double at the high temperature. This suggests that Cs atoms remain in the material at high temperatures. On the other hand, for CsI/C$$_{60}$$, the intensity ratio does not change much by elevating temperatures.

Journal Articles

Marking actinides for separation; Resonance-enhanced multiphoton charge transfer in actinide complexes

Matsuda, Shohei; Yokoyama, Keiichi; Yaita, Tsuyoshi; Kobayashi, Toru; Kaneta, Yui; Simonnet, M.; Sekiguchi, Tetsuhiro; Honda, Mitsunori; Shimojo, Kojiro; Doi, Reisuke; et al.

Science Advances (Internet), 8(20), p.eabn1991_1 - eabn1991_11, 2022/05

 Times Cited Count:8 Percentile:47.78(Multidisciplinary Sciences)

no abstracts in English

Journal Articles

Investigation of hydration and adsorption structures on clay minerals of radium by EXAFS

Yamaguchi, Akiko; Nagata, Kojiro*; Tanaka, Kazuya; Kobayashi, Keita; Kobayashi, Toru; Shimojo, Kojiro; Tanida, Hajime; Sekiguchi, Tetsuhiro; Kaneta, Yui; Matsuda, Shohei; et al.

Hosha Kagaku, (45), p.28 - 30, 2022/03

no abstracts in English

Journal Articles

Unoccupied conduction band of chloroaluminum phthalocyanine

Ikeura, Hiromi*; Sekiguchi, Tetsuhiro

Japanese Journal of Applied Physics, 58(SI), p.SIIC04_1 - SIIC04_4, 2019/08

 Times Cited Count:0 Percentile:0.00(Physics, Applied)

The electronic structure of the unoccupied conduction band of polycrystalline chloroaluminum phthalocyanine was investigated by X-ray absorption spectroscopy (XAS) near the Cl K-edge. XAS spectra were recorded in total electron yield (TEY) and partial Auger electron yield (AEY) modes. Partial AEY spectra were measured using normal and spectator Cl KL$$_{2,3}$$L$$_{2,3}$$ Auger yields as a function of photon energy. Although the TEY spectrum showed a broad shape; that was difficult to deconvolute curve fitting, the normal and spectator AEY spectra clearly showed that $$Cl 1srightarrow $$ $$sigma$$*(Cl-Al) transition splits into two competitive peaks attributed to the core excitons (localized with a core hole) and conduction band (delocalized without a core hole). The existence of a band-like peak in the Cl K-edge XAS is evidence that the Cl axial ligand participates in forming the conduction band. Thus, band-like electron transport is expected to occur in the oligomer-like (-Al-Cl-Al-) site.

Journal Articles

Absorbent property of fullerene for cesium isotope separation investigated using X-ray photoelectron spectroscopy

Sekiguchi, Tetsuhiro; Yokoyama, Keiichi; Uozumi, Yuki*; Yano, Masahiro; Asaoka, Hidehito; Suzuki, Shinichi; Yaita, Tsuyoshi

Progress in Nuclear Science and Technology (Internet), 5, p.161 - 164, 2018/11

For nuclear transmutation of cesium-135 ($$^{135}$$Cs), which is long-lived fission product, we are developing selective absorbent which takes only Cs atom in, but does not CsI. In this study, absorbing property of Cs atom onto the surface of fullerene (C$$_{60}$$) film has been investigated using synchrotron-based angle-dependent X-ray photoelectron spectroscopy (XPS). The results were compared with those of CsI. It was found that Cs penetrates into C$$_{60}$$ deep bulk. In contrast, CsI deposits on shallow surface. Furthermore, XPS spectra were measured as a function of Ar$$^{+}$$-sputtering time in order to know Cs concentration profiles in deep region. Results showed that Cs penetrates into deep region of several hundreds ${AA}$.

Journal Articles

Photo-oxidative doping in $$pi$$-conjugated zig-zag chain of carbon atoms with sulfur-functional group

Ikeura, Hiromi*; Sekiguchi, Tetsuhiro

Applied Physics Letters, 111(23), p.231605_1 - 231605_4, 2017/12

 Times Cited Count:0 Percentile:0.00(Physics, Applied)

Photo-oxidative doping processes were studied for the trans-polyacetylene (PA) backbone with the -SCH$$_{3}$$ side group as a chemically representative of the S-functionalized zig-zag graphene nanoribbon edge. Sulfur K-edge X-ray absorption near edge structure (XANES) spectroscopy indicates that photochemical reaction of S-CH$$_{3}$$ with atmospheric O$$_{2}$$ forms selectively oxidized products such as -S(O)CH$$_{3}$$ and -SO$$_{3}$$$$^{-}$$ bound to the (PA) backbone. Using the correlation between the oxidation states of sulfur and the XANES peak positions, the partial charge distribution of CH$$_{3}$$S$$^{delta+}$$ -PA$$^{delta-}$$ has been estimated. The results can provide some strategy for area-selective and controllable doping processes of atomic-scale molecular systems with the assistance of UV light.

Journal Articles

Electronic properties of 6,13-Bis(triisopropylsilylethynyl)pentacene probed by inner-shell spectroscopy

Ikeura, Hiromi*; Sekiguchi, Tetsuhiro

Molecular Crystals and Liquid Crystals, 622(1), p.50 - 54, 2015/12

BB2014-1633.pdf:0.39MB

 Times Cited Count:0 Percentile:0.00(Chemistry, Multidisciplinary)

Organic electrically conducting $$pi$$-stacked molecules are widely regarded as promising materials for future application of nanoelectronics. Direct measurements of electronic structures of unoccupied states in organic semiconductors lead to better understanding of mechanism of electron conduction. For probing unoccupied partial density of states (DOS), X-ray absorption spectroscopy (XAS) is commonly used, where selective excitation of the 1s core electron to the unoccupied conduction band is possible. However, XAS cannot distinguish localized and delocalized features without comparing any theoretical approach. In this work, the core-hole-clock method in resonant Auger spectroscopy (RAS) has been applied to probe electron delocalization through the empty conduction band in the attosecond domain for the purpose of exploring electronic materials with high-speed electron transport. We will discuss some organic molecules such as pentacenes.

Journal Articles

Observation of oriented organic semiconductor using Photo-Electron Emission Microscope (PEEM) with polarized synchrotron

Sekiguchi, Tetsuhiro; Baba, Yuji; Hirao, Norie; Honda, Mitsunori; Izumi, Toshinori; Ikeura, Hiromi*

Molecular Crystals and Liquid Crystals, 622(1), p.44 - 49, 2015/12

BB2014-1632.pdf:0.71MB

 Times Cited Count:0 Percentile:0.00(Chemistry, Multidisciplinary)

The molecular orientation is one of the important factors for controlling various properties in organic semiconductor materials. Films are usually heterogeneous. Thus they exist as a mixture of microscopic domains which have a variety of orientation directions. Therefore, it is essential to observe selectively microscopic domains with different orientation direction. In this work, we have developed the photoelectron emission microscopy (PEEM) system combined with the linearly polarized vacuum ultraviolet (VUV) light or synchrotron radiation (SR) X-rays. PEEM images (FOV = ca.50 micro m) for poly(3-hexylthiophene), P3HT thin films were observed under the UV irradiation with various polarization angles, including in-plain and out-of-plain polarization. Morphologies at some bright parts are different each other. The resultant observation suggests that it enables us to distinguish oriented micro-domains with specific directions of polymer chain axis from other amorphous parts.

Journal Articles

Investigation of unoccupied electronic states near the fermi level of polysilane using resonant Auger spectroscopy

Ogawa, Hiroshi*; Ikeura, Hiromi*; Sekiguchi, Tetsuhiro

Molecular Crystals and Liquid Crystals, 622(1), p.164 - 169, 2015/11

 Times Cited Count:0 Percentile:0.00(Chemistry, Multidisciplinary)

Unoccupied electronic states near the Fermi level of poly(dimethylsilane) were probed using Si 1s X-ray absorption spectroscopy (XAS) and Si KL$$_{2,3}$$L$$_{2,3}$$ resonant Auger spectroscopy (RAS). The measured resonance peaks of XAS spectra near Si K-edge have been assigned in comparison with the discrete variational (DV)-X$$alpha$$ molecular orbital calculations. The rapid delocalization of Si 1s core-excited electron through the empty conduction band was observed along the polymer chain with the energy dependent RAS measurement, and the electron delocalization time was estimated based on the core-hole clock method.

Journal Articles

Reconsidering of a polarization rule on atomic arrangements of graphite-like boron carbonitride

Shimoyama, Iwao; Baba, Yuji; Sekiguchi, Tetsuhiro

DV-X$$alpha$$ Kenkyu Kyokai Kaiho, 27(1&2), p.34 - 44, 2015/03

no abstracts in English

Journal Articles

A Fluorescence XAFS measurement instrument in the Soft X-ray region toward observation under operando conditions

Honda, Mitsunori; Baba, Yuji; Shimoyama, Iwao; Sekiguchi, Tetsuhiro

Review of Scientific Instruments, 86(3), p.035103_1 - 035103_5, 2015/03

 Times Cited Count:11 Percentile:44.19(Instruments & Instrumentation)

Journal Articles

Structures of quasi-freestanding ultra-thin silicon films deposited on chemically inert surfaces

Baba, Yuji; Shimoyama, Iwao; Hirao, Norie; Sekiguchi, Tetsuhiro

Chemical Physics, 444, p.1 - 6, 2014/09

AA2014-0499.pdf:0.68MB

 Times Cited Count:2 Percentile:6.02(Chemistry, Physical)

Silicon thin films were deposited on a sapphire and a highly oriented pyrolytic graphite (HOPG), which have atomically flat and chemically inert surfaces. The electronic and geometrical structures of the films were analyzed by polarization-dependent X-ray absorption fine structure (XAFS). It was found that the silicon K-edge XAFS spectra for ultra-thin silicon films thinner than 0.2 monolayer exhibited two distinct resonance peaks which were not observed for bulk silicon. The peaks were assigned to the resonance excitations from the Si 1s into the valence unoccupied orbitals with $$pi^{*}$$ and $$sigma^{*}$$ characters. The average tilted angle of the $$pi^{*}$$ orbitals was determined by the polarization dependencies of the peak intensities. It was demonstrated that direction of a part of the $$pi^{*}$$ orbitals in silicon film is perpendicular to the surface. These results support the existence of quasi-freestanding single-layered silicon films with sp2 configuration.

Journal Articles

A Polarization rule on atomic arrangements of graphite-like boron carbonitride

Shimoyama, Iwao; Baba, Yuji; Sekiguchi, Tetsuhiro

Carbon, 71, p.1 - 10, 2014/05

 Times Cited Count:8 Percentile:26.74(Chemistry, Physical)

B and N K-edge near-edge X-ray absorption fine structure (NEXAFS) spectra of boron carbonitride (B-C-N) films prepared by ion beam deposition are interpreted by molecular orbital calculations with the core-hole effect. Model clusters with different atomic arrangements are compared in terms of photoabsorption cross section (PACS) and net charge, and they are classified into two groups, i.e., polarization and non-polarization types. PACS of $$pi$$$$^{*}$$ peaks near the lowest unoccupied molecular orbital (LUMO) state increase at B K-edge and decrease at N K-edge for polarization type and vice versa for non-polarization type. Based on a comparison between experimental and theoretical results, we propose a rule for atomic arrangements of boron, carbon, and nitrogen atoms in graphite-like B-C-N. Finally, the relationship between the rule and structural stability is discussed.

Journal Articles

Electrochemical immobilization of biomolecules on gold surface modified with monolayered L-cysteine

Honda, Mitsunori; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie

Thin Solid Films, 556, p.307 - 310, 2014/04

 Times Cited Count:5 Percentile:23.19(Materials Science, Multidisciplinary)

Journal Articles

Structure of ultra-thin silicon film on HOPG studied by polarization-dependence of X-ray absorption fine structure

Baba, Yuji; Shimoyama, Iwao; Hirao, Norie; Sekiguchi, Tetsuhiro

Chemical Physics Letters, 594, p.64 - 68, 2014/02

 Times Cited Count:4 Percentile:13.83(Chemistry, Physical)

Structures of mono-layered silicon on a highly oriented pyrolytic graphite (HOPG) have been investigated by X-ray photoelectron spectroscopy and X-ray absorption near edge structure (XANES). For the Si K-edge XANES spectrum of the 0.15 mono-layered film, two distinct peaks were observed, which were assigned to the resonant excitations from the Si 1s into the valence unoccupied orbitals with $$pi$$$$^{*}$$ and $$sigma$$$$^{*}$$ characters. On the basis of the polarization dependences of the peak intensities, it was concluded that a part of the Si film lies flat on the HOPG surface, which supports the existence of two-dimensional graphene-like structure in mono-layered silicon.

Journal Articles

Molecular ordering effect of regioregular poly(3-hexylthiophene) using sulfur K-edge X-ray absorption spectroscopy

Ikeura, Hiromi*; Sekiguchi, Tetsuhiro

Japanese Journal of Applied Physics, 53(2S), p.02BB07_1 - 02BB07_4, 2014/02

 Times Cited Count:14 Percentile:50.95(Physics, Applied)

The electronic structure of the unoccupied conduction band of regioregular poly(3-hexylthiophene) (RR-P3HT) was investigated by X-ray absorption spectroscopy (XAS) near the sulfur K-edge. Angle-dependent XAS studies revealed that polymer chains in films are well aligned and oriented edge-on with respect to the Si substrate. It was clearly observed that the bottom of the conduction band near the Fermi level in a $$pi$$-$$pi$$ stacking film is lower (0.3 eV) than that in a powder. It was demonstrated that $$pi$$-$$pi$$ stacking interactions improve the power conversion efficiency through the reduction of the lowest unoccupied molecular orbital (LUMO) energy level.

Journal Articles

Focusing of soft X-rays using poly-capillary with precise adjustment mechanism and its application to quick chemical-state analysis

Hirao, Norie; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao

Bunseki Kagaku, 63(1), p.53 - 58, 2014/01

AA2013-0769.pdf:1.16MB

 Times Cited Count:0 Percentile:0.00(Chemistry, Analytical)

A method for quick and real-time observations of a solid surface at nanometer scale is described. The principle of the method is as follows. Soft X-rays from a synchrotron light source are irradiated on a solid surface and the total photoelectrons are expanded and focused on a screen using electrostatic lenses. When the energy of X-rays is scanned and the brightness is plotted, we can obtain micro X-ray absorption (micro-XAFS) spectra in all regions of the image. The spacial resolution of the method was 40 nm. In order to more quickly observe a microscopic image and measure micro-XAFS spectra, the soft X-rays from the bending magnet were focused using a newly developed poly-capillary. As a result, the photon flux of 3 keV X-rays was increased about 60 time higher than that before the focusing. Using focused X-rays, we succeeded in observing one image at 10 ms for a bulk sample. We have also tried to shorten the measuring time of the micro-XAFS spectrum. For a Si-SiO$$_{2}$$ sample, it has been demonstrated that micro-XAFS spectra in all regions of an image can be obtained within 1 min. It is concluded that real-time observations of chemical-states at nanometer scale are possible by the present method.

Journal Articles

Molecular orientation of pentacene derivative

Ikeura, Hiromi*; Sekiguchi, Tetsuhiro

Photon Factory Activity Report 2013, Part B, P. 518, 2014/00

Organic electrically conducting $$pi$$-stacked small molecules are widely regarded as promising materials for future application of low-cost and flexible nanoelectronics. Pentacene is one of the most promising organic semiconductors because of its excellent device performance. Direct measurements of electronic structures of unoccupied states of organic semiconductors lead to better understanding of mechanism of electron conduction. For probing unoccupied partial density of states (DOS), X-ray absorption spectroscopy (XAS) is commonly used, where selective excitation of the 1s core electron to the unoccupied conduction band is possible. The molecular orientation of pentacene derivative has been investigated by angle dependent XAS measurements. Electronic states were calculated by DVX$$alpha$$ method.

314 (Records 1-20 displayed on this page)