Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Iwata, Yoshihiro; Sekiya, Hiroyuki*; Ito, Chikara
Nuclear Instruments and Methods in Physics Research A, 797, p.64 - 69, 2015/10
Times Cited Count：3 Percentile：27.05(Instruments & Instrumentation)An ultrasensitive resonance ionization mass spectrometer that can be applied to evaluate krypton (Kr) contamination in xenon (Xe) dark matter detectors has been developed for measuring Kr at the parts-per-trillion (ppt) or sub-ppt level in Xe. The gas sample is introduced without any condensation into a time-of-flight mass spectrometer through a pulsed supersonic valve. Using a nanosecond pulsed laser at 212.6 nm, 
Kr atoms in the sample are resonantly ionized along with other Kr isotopes. Kr ions are then mass separated and detected by the mass spectrometer in order to measure the Kr impurity concentration. With our current setup, approximately 0.4 ppt of Kr impurities contained in pure argon (Ar) gas are detectable with a measurement time of 1,000 s. Although Kr detection sensitivity in Xe is expected to be approximately half of that in Ar, our spectrometer can evaluate Kr contamination in Xe to the sub-ppt level.
Yamanishi, Takeshi; Sekiya, Yoshitomo; Sataka, Hiroyuki; Kitagawa, Yoshito*; Kato, Kinya*
no journal, ,
no abstracts in English
Itabashi, Hideharu; Sekiya, Yoshitomo*; Sataka, Hiroyuki; Shimada, Tomohiro*; Kato, Kinya*
no journal, ,
no abstracts in English
Iwata, Yoshihiro; Sekiya, Hiroyuki*; Ito, Chikara
no journal, ,
no abstracts in English
Iwata, Yoshihiro; Sekiya, Hiroyuki*; Ito, Chikara
no journal, ,
no abstracts in English
Iwata, Yoshihiro; Sekiya, Hiroyuki*; Ito, Chikara
no journal, ,
no abstracts in English
Iwata, Yoshihiro; Sekiya, Hiroyuki*
no journal, ,
no abstracts in English
Iwata, Yoshihiro; Sekiya, Hiroyuki*; Ito, Chikara
no journal, ,
no abstracts in English
Sekiya, Hiroyuki*; Iwata, Yoshihiro; Ito, Chikara
no journal, ,
no abstracts in English
Iwata, Yoshihiro; Sekiya, Hiroyuki*; Ito, Chikara
no journal, ,
no abstracts in English
Iwata, Yoshihiro; Sekiya, Hiroyuki*
no journal, ,
no abstracts in English
Iwata, Yoshihiro; Sekiya, Hiroyuki*; Ito, Chikara
no journal, ,
no abstracts in English
Iwata, Yoshihiro; Sekiya, Hiroyuki*; Ito, Chikara
no journal, ,
no abstracts in English
Rekimoto, Masafumi; Ando, Masato; Chikazawa, Yoshitaka; Kato, Atsushi; Hamano, Tomoharu; Shiohama, Yasutaka; Miyagawa, Takayuki*; Uzawa, Masayuki*; Hara, Hiroyuki*; Yamauchi, Kanau*; et al.
no journal, ,
no abstracts in English
ion emission lifetime in aqueous solution of Gd sulfateIwata, Yoshihiro; Sekiya, Hiroyuki*; Ito, Chikara
no journal, ,
We are studying the measurement of Gd ion emission lifetime in aqueous solution of Gd sulfate. In this study, a nanosecond pulsed laser at 266 nm was used as the excitation light source, and emission at 312 nm was detected by a photomultiplier tube attached to a monochromator. The emission lifetime was measured to be about 2 ms, which was longer than that of other lanthanoid ions.
Iwata, Yoshihiro; Sekiya, Hiroyuki*; Ieki, Kei*; Ito, Chikara
no journal, ,
Emission characteristics of gadolinium ions (Gd) in water are studied to estimate the effect of ion emission on the water Cherenkov detector. The emission lifetime is about 5 ms, and it was found that Gd emission measurement using a pulsed laser at 252.3 nm can be used for remote monitoring of Gd concentration in the range 0.01-0.1%.
ion emission on a water Cherenkov detectorIwata, Yoshihiro; Sekiya, Hiroyuki*; Ieki, Kei*; Ito, Chikara
no journal, ,
Emission characteristics of gadolinium ions (Gd) in water are studied to estimate the effect of ion emission on the water Cherenkov detector. The excitation spectrum of Gd was measured in the wavelength range of 245-255 nm, and it was confirmed that the ion emission intensity was proportional to the Gd concentration.
ion emission properties in water using laserIwata, Yoshihiro; Sekiya, Hiroyuki*; Ieki, Kei*; Ito, Chikara
no journal, ,
Emission characteristics of gadolinium ions (Gd) in water are studied to estimate the effect of ion emission on the water Cherenkov detector. The quenching effect of sulfate ions is considered negligible. The excitation spectrum of Gd was measured in the wavelength range of 245-255 nm, and it was confirmed that the ion emission intensity was proportional to the Gd concentration.
