Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Iyota, Muneyoshi*; Matsuda, Tomoki*; Sano, Tomokazu*; Shigeta, Masaya*; Shobu, Takahisa; Yumoto, Hirokatsu*; Koyama, Takahisa*; Yamazaki, Hiroshi*; Semba, Yasunori*; Ohashi, Haruhiko*; et al.
Journal of Manufacturing Processes, 94, p.424 - 434, 2023/05
Times Cited Count：7 Percentile：74.72(Engineering, Manufacturing)Nisawa, Atsushi*; Yoneda, Yasuhiro; Ueno, Go*; Murakami, Hironori*; Okajima, Yuka*; Yamamoto, Kenichiro*; Semba, Yasunori*; Uesugi, Kentaro*; Tanaka, Yoshihito*; Yamamoto, Masaki*; et al.
Journal of Synchrotron Radiation, 20(2), p.219 - 225, 2013/03
Times Cited Count：12 Percentile：52.75(Instruments & Instrumentation)A Si(111) winged crystal has been designed to minimize anticlastic bending and improve sagittal focusing efficiency. The crystal was thin with wide stiffening wings. The length-to-width ratio of the crystal was optimized by finite element analysis, and the optimal value was larger than the "golden value". The analysis showed that the slope error owing to anticlastic bending is less than the Darwin width. The X-rays were focused two-dimensionally using the crystal and a tangentially bent mirror. The observed profiles of the focal spot agreed well with the results of a ray-tracing calculation in the energy range from 8 to 17.5 keV. X-ray diffraction measurements with a high signal-to-noise ratio using this focusing system were demonstrated for a small protein crystal.
Pikuz, T.; Faenov, A.*; Fukuda, Yuji; Kando, Masaki; Bolton, P.; Mitorfanov, A.*; Vinogradov, A.*; Nagasono, Mitsuru*; Ohashi, Haruhiko*; Yabashi, Makina*; et al.
Optics Express (Internet), 20(4), p.3424 - 3433, 2012/02
Times Cited Count：30 Percentile：77.63(Optics)Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
Physical Review Letters, 107(19), p.193603_1 - 193603_5, 2011/11
Times Cited Count：37 Percentile：81.48(Physics, Multidisciplinary)Inogamov, N. A.*; Anisimov, S. I.*; Petrov, Y. V.*; Khokhlov, V. A.*; Zhakhovskii, V. V.*; Faenov, A. Ya.*; Pikuz, T.; Fortov, V. E.*; Skobelev, I. Y.*; Kato, Yoshiaki*; et al.
Journal of Optical Technology, 78(8), p.473 - 480, 2011/08
Times Cited Count：6 Percentile：32.05(Optics)Inogamov, N. A.*; Faenov, A. Ya.*; Zhakhovsky, V. V.*; Pikuz, T. A.*; Skobelev, I. Yu.*; Petrov, Y. V.*; Khokhlov, V. A.*; Shepelev, V. V.*; Anisimov, S. I.*; Fortov, V. E.*; et al.
Contributions to Plasma Physics, 51(5), p.419 - 426, 2011/06
Times Cited Count：20 Percentile：62.54(Physics, Fluids & Plasmas)Warm dense matter, arising under the action of ultrashort EUV-FEL pulse onto LiF dielectric crystal, is characterized by high temperature of conduction electrons, with their number density achieving values of the order of atom number density at maximum laser fluences in our experiments. Expansion of matter, heated and pressurized through the electron-ion energy exchange, gives rise to the spallative ablation at small fluences and gaseous outflow from a target in the case of large fluences. Ablation threshold is low in comparison with a longer nanosecond XRL.
Fukuda, Yuji; Faenov, A. Y.; Pikuz, T. A.*; Ohashi, Haruhiko*; Semba, Yasunori*; Nagasono, Mitsuru*; Tono, Kensuke*; Togashi, Tadashi*; Yabashi, Makina*; Ishikawa, Tetsuya*
no journal, ,
We have conducted detailed focused spot shape measurements for EUVFEL using a LiF crystal radiation detector. The single shot focused spot images were recorded on the LiF detector surface as a function of detector position. As a result, we found that the spot images were distorted due to aberrations, and that laser beam was focused about 1-mm up to the laser beam axis. Moreover, we found that the LiF crystal was ablated due to high intensity of the focused beam.
Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Tanaka, Hitoshi*; Ishikawa, Tetsuya*; et al.
no journal, ,
Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Tono, Kensuke*; Togashi, Tadashi*; Semba, Yasunori*; Ohashi, Haruhiko*; Yabashi, Makina*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
no abstracts in English
Harries, J.; Nagasono, Mitsuru*; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
Inogamov, N. A.*; Faenov, A. Y.; Pikuz, T.*; Zhakhovski, V.*; Skobelev, I.*; Khokhlov, V.*; Anisimov, S. I.*; Fortov, V. E.*; Fukuda, Yuji; Kato, Yoshiaki*; et al.
no journal, ,
Faenov, A. Y.; Pikuz, T.*; Inogamov, N. A.*; Zhakhovski, V.*; Skobelev, I.*; Khokhlov, V.*; Anisimov, S. I.*; Fortov, V. E.*; Fukuda, Yuji; Kato, Yoshiaki*; et al.
no journal, ,
Pikuz, T.; Faenov, A.*; Fukuda, Yuji; Tanaka, Momoko; Ishino, Masahiko; Hasegawa, Noboru; Nishikino, Masaharu; Ohashi, Haruhiko*; Yabashi, Makina*; Tono, Kensuke*; et al.
no journal, ,
Harries, J.; Nagasono, Mitsuru*; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
Faenov, A.*; Pikuz, T.; Fukuda, Yuji; Tanaka, Momoko; Kishimoto, Maki; Ishino, Masahiko; Nishikino, Masaharu; Kando, Masaki; Kawachi, Tetsuya; Nagasono, Mitsuru*; et al.
no journal, ,
