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TaS
with perpendicular magnetic anisotropy; Comparison with Fe
TiS
Shibata, Goro; Won, C.*; Kim, J.*; Nonaka, Yosuke*; Ikeda, Keisuke*; Wan, Y.*; Suzuki, Masahiro*; Koide, Tsuneharu*; Tanaka, Arata*; Cheong, S.-W.*; et al.
Photon Factory Activity Report 2022 (Internet), 2 Pages, 2023/00
no abstracts in English
Igashira, Masayuki*; Shibata, Keiichi; Takano, Hideki*; Yamano, Naoki*; Matsunobu, Hiroyuki*; Kitao, Kensuke*; Katakura, Junichi; Nakagawa, Tsuneo; Hasegawa, Akira; Iwasaki, Tomohiko*; et al.
Nihon Genshiryoku Gakkai Wabun Rombunshi, 3(1), p.128 - 139, 2004/03
no abstracts in English
Ga
N(0
x
1)Nakanishi, Yasuo*; Wakahara, Akihiro*; Okada, Hiroshi*; Yoshida, Akira*; Oshima, Takeshi; Ito, Hisayoshi; Shibata, Tomohiko*; Tanaka, Mitsuhiro*
Physica Status Solidi, 0(7), p.2623 - 2626, 2003/07
In our previous study, it was reported that Eu-doped Nitride semiconductors show luminescence propetires. In this study, we investigate the relationship between luminescence properties and Al composition using Al
Ga
N(0
x
1). Al
Ga
N were grown using OMVPE. Eu atoms were doped into the samples by ion implantation (200keV). After implantation, the samples were annealed to remove residual damege. Luminescence propreties of the samples were measured using photoluminescence and cathodeluminescence. As a result, luminescence at 621 nm which relates 4f-4f transition were observed for all samples (x=0 to 1). As for intensity, samples with x=0.5 show the strongest luminescence. This result can be interpreted in terms of the internal stress of crystals by the existence of Al atoms.
Ishibashi, Ryo*; Hirosaka, Kazuma*; Ikegawa, Tomohiko*; Shibata, Masatoshi*; Sasaki, Masana*; Tsuchiya, Akiyuki*; Pham, V. H.; Kurata, Masaki; Nemoto, Yoshiyuki
no journal, ,
no abstracts in English