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Journal Articles

Applicability of redundant pairs of SOI transistors for analog circuits and their applications to phase-locked loop circuits

Makihara, Akiko*; Yokose, Tamotsu*; Tsuchiya, Yoshihisa*; Miyazaki, Yoshio*; Abe, Hiroshi; Shindo, Hiroyuki*; Ebihara, Tsukasa*; Maru, Akifumi*; Morikawa, Koichi*; Kuboyama, Satoshi*; et al.

IEEE Transactions on Nuclear Science, 60(1), p.230 - 235, 2013/02

 Times Cited Count:6 Percentile:44.21(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

Applicability of redundant pairs of SOI transistors for analog circuits

Makihara, Akiko*; Yokose, Tamotsu*; Tsuchiya, Yoshihisa*; Tani, Koichi*; Morimura, Tadaaki*; Abe, Hiroshi; Shindo, Hiroyuki*; Ebihara, Tsukasa*; Maru, Akifumi*; Morikawa, Koichi*; et al.

Proceedings of 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-10) (Internet), p.119 - 122, 2012/12

no abstracts in English

Journal Articles

DICE-based flip-flop with SET pulse discriminator on a 90 nm bulk CMOS process

Maru, Akifumi*; Shindo, Hiroyuki*; Ebihara, Tsukasa*; Makihara, Akiko*; Hirao, Toshio; Kuboyama, Satoshi*

IEEE Transactions on Nuclear Science, 57(6), p.3602 - 3608, 2010/12

 Times Cited Count:11 Percentile:62.45(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

DICE based flip-flop with SET pulse discriminator on a 90 nm bulk CMOS process

Maru, Akifumi*; Kuboyama, Satoshi*; Shindo, Hiroyuki*; Ebihara, Tsukasa*; Makihara, Akiko*; Hirao, Toshio; Tamura, Takashi*

Proceedings of 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-9), p.64 - 67, 2010/10

no abstracts in English

Journal Articles

Evaluation of element circuits constructing new radiation hardened SOI FPGAs

Shindo, Hiroyuki*; Midorikawa, Masahiko*; Sato, Yohei*; Kuboyama, Satoshi*; Hirao, Toshio; Oshima, Takeshi

JAEA-Review 2008-055, JAEA Takasaki Annual Report 2007, P. 5, 2008/11

no abstracts in English

Journal Articles

Optimization for SEU/SET immunity on 0.15 $$mu$$m fully depleted CMOS/SOI digital logic devices

Makihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.

Proceedings of 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-7), p.95 - 98, 2006/10

no abstracts in English

Journal Articles

Bulk damage observed in recent LSI devices

Shindo, Hiroyuki*; Kuboyama, Satoshi*; Ikeda, Naomi*; Otomo, Hiromitsu*; Shimada, Osamu*; Hirao, Toshio; Matsuda, Sumio*

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.63 - 66, 2004/10

no abstracts in English

Journal Articles

Bulk damage caused by single protons in SDRAMs

Shindo, Hiroyuki*; Kuboyama, Satoshi*; Ikeda, Naomi*; Hirao, Toshio; Matsuda, Sumio*

IEEE Transactions on Nuclear Science, 50(6, Part1), p.1839 - 1845, 2003/12

 Times Cited Count:15 Percentile:72.83(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

Consistency of bulk damage factor and NIEL for electrons, protons, and heavy ions in Si CCDs

Kuboyama, Satoshi*; Shindo, Hiroyuki*; Hirao, Toshio; Matsuda, Sumio*

IEEE Transactions on Nuclear Science, 49(6), p.2684 - 2689, 2002/12

 Times Cited Count:10 Percentile:54.94(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

Research of single-event burnout in bipolar transistors

Hirao, Toshio; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Nagai, Yuki*; Ohira, Hideharu*; Ito, Hisayoshi; Matsuda, Sumio*

JNC TN7200 2001-001, p.66 - 68, 2002/01

no abstracts in English

Journal Articles

Analysis of single-ion multiple-bit upset in high-density DRAMs

Makihara, Akiko*; Shindo, Hiroyuki*; Nemoto, Norio*; Kuboyama, Satoshi*; Matsuda, Sumio*; Oshima, Takeshi; Hirao, Toshio; Ito, Hisayoshi; Buchner, S.*; Campbell, A. B.*

IEEE Transactions on Nuclear Science, 47(6), p.2400 - 2404, 2000/12

 Times Cited Count:33 Percentile:87.39(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

Analysis of single-ion multiple-bit upset in high-density DRAMs

Makihara, Akiko*; Shindo, Hiroyuki*; Nemoto, Norio*; Kuboyama, Satoshi*; Matsuda, Sumio*; Oshima, Takeshi; Hirao, Toshio; Ito, Hisayoshi; Buchner, S.*; Campbell, A. B.*

Proceedings of 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Application, p.103 - 107, 2000/00

no abstracts in English

Journal Articles

SEU testing using cocktail ion beams

Nemoto, N.*; Shindo, Hiroyuki*; *; Kuboyama, Satoshi*; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Matsuda, Sumio*

Proceedings of 3rd International Workshop on Radiation Effects on Semiconductor Devices for Space Application, p.154 - 159, 1998/00

no abstracts in English

Oral presentation

Technologies of radiation hardness for deep submicron semiconductor devices; Development of rad-hard high-speed logic circuit using SOI technology

Shindo, Hiroyuki*; Sato, Yohei*; Midorikawa, Masahiko*; Kuboyama, Satoshi*; Makihara, Akiko*; Hirao, Toshio; Ito, Hisayoshi

no journal, , 

no abstracts in English

Oral presentation

Optimization for SEU/SET immunity on 0.15$$mu$$m fully depleted CMOS/SOI digital logic devices

Makihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.

no journal, , 

no abstracts in English

Oral presentation

The Present status and prospect of the development of space LSIs using SOI substrates

Kuboyama, Satoshi*; Shindo, Hiroyuki*; Midorikawa, Masahiko*; Sato, Yohei*; Oshima, Takeshi; Hirao, Toshio; Yokose, Tamotsu*; Makihara, Akiko*

no journal, , 

no abstracts in English

Oral presentation

Evaluation of new SOI FPGA element circuits with radiation hardness

Shindo, Hiroyuki*; Midorikawa, Masahiko*; Sato, Yohei*; Kuboyama, Satoshi*; Hirao, Toshio

no journal, , 

no abstracts in English

Oral presentation

Analysis of single event phenomena induced by cosmic rays

Kuboyama, Satoshi*; Shindo, Hiroyuki*; Hirao, Toshio; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Evaluation and development of a radiation hardness-by-design library for 0.15$$mu$$m SOI-ASIC

Shindo, Hiroyuki*; Maru, Akifumi*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Feasibility study on a 90 nm bulk CMOS process for applicability to space environments

Maru, Akifumi*; Kuboyama, Satoshi*; Shindo, Hiroyuki*; Ikeda, Naomi*; Tamura, Takashi*; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Study for establishment of radiation-resistant technologies for next-generation space applications

Maru, Akifumi*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Suzuki, Koichi*; Abe, Hiroshi; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi

no journal, , 

no abstracts in English

21 (Records 1-20 displayed on this page)