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Journal Articles

The Degradation of the electrical properties of IGBTs by 2-MeV electron irradiation at high-temperatures

Nakabayashi, Masakazu*; Oyama, Hidenori*; Hanano, N.*; Hirao, Toshio; Simoen, E.*; Claeys, C.*

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.183 - 186, 2004/10

no abstracts in English

Journal Articles

Radiation damages of InGaAs photodiodes by high-temperature electron irradiation

Oyama, Hidenori*; Takakura, Kenichiro*; Nakabayashi, Masakazu*; Hirao, Toshio; Onoda, Shinobu; Kamiya, Tomihiro; Simoen, E.*; Claeys, C.*; Kuboyama, Satoshi*; Oka, Katsumi*; et al.

Nuclear Instruments and Methods in Physics Research B, 219-220, p.718 - 721, 2004/06

 Times Cited Count:3 Percentile:24.93(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Induced lattice defects in InGaAs laser diodes by high-temperature $$gamma$$-ray irradiation

Oyama, Hidenori*; Hirao, Toshio; Simoen, E.*; Claeys, C.*; Onoda, Shinobu; Takami, Yasukiyo*; Ito, Hisayoshi

Physica B; Condensed Matter, 308-310, p.1185 - 1188, 2001/12

 Times Cited Count:8 Percentile:44.96(Physics, Condensed Matter)

no abstracts in English

Journal Articles

Impact of lattice defects on the preformance degradation of Si photodiodes by high-temperature $$gamma$$ and electron irradiation

Oyama, Hidenori*; Hirao, Toshio; Simoen, E.*; Claeys, C.*; Onoda, Shinobu*; Takami, Yasukiyo*; Ito, Hisayoshi

Physica B; Condensed Matter, 308-310, p.1226 - 1229, 2001/12

 Times Cited Count:30 Percentile:79.73(Physics, Condensed Matter)

no abstracts in English

Oral presentation

Study on radiation susceptibility of SiGe/Si Heterojunctions

Kobayashi, Daisuke*; Makino, Takahiro; Onoda, Shinobu; Oshima, Takeshi; Simoen, E.*; Claeys, C.*; Hirose, Kazuyuki*

no journal, , 

no abstracts in English

5 (Records 1-5 displayed on this page)
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