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Journal Articles

Measurement of transient photo-induced changes in thin films at J-PARC; Time-resolved neutron reflectivity measurements of silver photo-diffusion into Ge-chalcogenide films

Sakaguchi, Yoshifumi*; Asaoka, Hidehito; Uozumi, Yuki; Kawakita, Yukinobu; Ito, Takayoshi*; Kubota, Masato; Yamazaki, Dai; Soyama, Kazuhiko; Ailavajhala, M.*; Wolf, K.*; et al.

JPS Conference Proceedings (Internet), 8, p.031023_1 - 031023_6, 2015/09

We report recent results of time-resolved neutron reflectivity measurements for silver photo-diffusion into Ge$$_{x}$$S$$_{1-x}$$ (x=0.20, 0.33, 0.40) films performed on BL17 (SHARAKU). It is well known that silver diffuses into Ge-chalcogenide layer by visible light exposure with a distinct diffusion front, where the silver concentration abruptly drops off. Using an event recording system at the Materials and Life Science Experimental Facility, neutron reflectivity profiles were collected with a time-resolution of 30 seconds in the shortest case. It was found from the measurements that a relatively stable Ag-rich phase in the reaction layer is firstly formed, and then, slower diffusion occurs at the interface between Ag-rich and Ag-poor layers. Fourier transform analysis showed that the position of the interface is essentially fixed. This result is in contrast to the previously reported model of silver diffusion that postulates a mechanism involving progression of the diffusion front. The results of the measurements on Ag/Ge-Se films performed on the INTER instrument at ISIS are also reported.

Journal Articles

Dynamics of silver photo-diffusion into Ge-chalcogenide films; Time-resolved neutron reflectometry

Sakaguchi, Yoshifumi*; Asaoka, Hidehito; Uozumi, Yuki; Kawakita, Yukinobu; Ito, Takayoshi*; Kubota, Masato; Yamazaki, Dai; Soyama, Kazuhiko; Ailavajhala, M.*; Latif, M. R.*; et al.

Journal of Physics; Conference Series, 619(1), p.012046_1 - 012046_4, 2015/06

 Times Cited Count:8 Percentile:96.8

We report the results of time-resolved neutron reflectivity measurements of Ag/a- Ge$$_{20}$$S$$_{80}$$/Si and a- Ge$$_{40}$$Se$$_{60}$$/Ag/ Si films taken while the films are exposed to visible light. Silver diffuses into an amorphous (a-) chalcogenide layer while visible light illuminates Ag/a-chalcogenide films. Neutron reflectometry is a suitable technique probing time evolution of the multi-layer structure without damaging the sample by the probe beam itself. It was found from the measurements of Ag/a-Ge$$_{20}$$S$$_{80}$$/Si films that a relatively stable Ag-rich phase in the reaction layer is first formed, and then, slower diffusion occurs at the interface between Ag-rich and Ag-poor layers. This result is in contrast to the previously reported model of silver diffusion that suggests a mechanism involving progression of the diffusion front. From the measurements of a-Ge$$_{40}$$Se$$_{60}$$/Ag/ Si films, we found enormous changes in the neutron reflectivity profile, including loss of total reflection region, with continuous illumination even after forming one homogeneous layer, which was about 60 min after starting illumination. At this stage, clear off-specular scattering was observed by a linear detector and a surface roughness was observed with naked eyes.

Oral presentation

Time-resolved neutron reflectivity measurements of Ag/Ge-chalcogenide films during illumination by visible light; Investigation of the silver photo-diffusion kinetics

Sakaguchi, Yoshifumi*; Asaoka, Hidehito; Uozumi, Yuki; Kawakita, Yukinobu; Ito, Takayoshi*; Kubota, Masato; Yamazaki, Dai; Soyama, Kazuhiko; Ailavajhala, M.*; Latif, R.*; et al.

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