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Au with synchrotron radiationSowa, Makoto*; Yamazaki, Daichi*; Okada, Michio*; Yoshigoe, Akitaka; Teraoka, Yuden; Kasai, Toshio*
Electrical Engineering in Japan, 175(4), p.43 - 47, 2011/06
Times Cited Count：2 Percentile：18.52(Engineering, Electrical & Electronic)Yamazaki, Daichi*; Sowa, Makoto*; Okada, Michio*; Teraoka, Yuden; Kasai, Toshio*
Journal of the Vacuum Society of Japan, 54(5), p.307 - 312, 2011/05
Okada, Michio*; Sowa, Makoto*; Kasai, Toshio*; Teraoka, Yuden
Applied Surface Science, 257(9), p.4257 - 4263, 2011/02
Times Cited Count：11 Percentile：44.66(Chemistry, Physical)Au with synchrotron radiationSowa, Makoto*; Yamazaki, Daichi*; Okada, Michio*; Yoshigoe, Akitaka; Teraoka, Yuden; Kasai, Toshio*
Denki Gakkai Rombunshi, C, 129(2), p.229 - 232, 2009/02
Native oxide at CuAu(110) surface has been studied by high energy-resolution X-ray photoemission spectroscopy with synchrotron radiation. The clean surface of CuAu(110) is terminated by Au and Cu atoms with equal contents. After oxidation in the air, Cu atoms segregated on the surface and the Cu-oxide was formed. In other words, Au atoms moved into the bulk. Au atoms below the oxide prevented the O atom diffusion into the bulk. Surface index dependences of natural oxidation suggested in every cases that the diffusion of Cu atoms contributed to the oxide formation.
molecular beamSowa, Makoto*; Okada, Michio*; Yoshigoe, Akitaka; Teraoka, Yuden; Kasai, Toshio*
no journal, ,
Oxidation reactions of a TiNi alloy have been studied at BL23SU of JAEA in the SPring-8 using supersonic oxygen molecular beams and photoemission spectroscopy with synchrotron radiation. A clean TiNi surface was obtained by an Ar ion sputtering method. The surface was exposed to oxygen gas to form a TiO surface with a small amount of Ti
component. This fact suggests many defects are included in the oxide layer. On the other hand, a pure TiO layer was formed by using supersonic oxygen molecular beams with the kinetic energy of 2 eV. The thickness was about 2 nm. Furthermore, the molecular beam irradiation during sample heating at 673 K gave a pure TiO layer with the thickness of 80 nm.
Yamazaki, Daichi*; Kasai, Toshio*; Sowa, Makoto*; Okada, Michio*; Yoshigoe, Akitaka; Teraoka, Yuden
no journal, ,
