JOPSS - Search Results

Journal Articles

Temperature of thermal spikes in amorphous silicon nitride films produced by 1.11 MeV C $_{60}^{3+}$ impacts

Kitayama, Takumi*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Isoda, Shoji*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 354, p.183 - 186, 2015/07

https://doi.org/10.1016/j.nimb.2014.11.002

Times Cited Count：2 Percentile：15.91(Instruments & Instrumentation)

Journal Articles

Sputtering of SiN films by 540 keV C $_{60}$ $^{2+}$ ions observed using high-resolution Rutherford backscattering spectroscopy

Nakajima, Kaoru*; Morita, Yosuke*; Kitayama, Takumi*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Tsujimoto, Masahiko*; Isoda, Shoji*; Fujii, Yoshikazu*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 332, p.117 - 121, 2014/08

https://doi.org/10.1016/j.nimb.2014.02.042

Times Cited Count：7 Percentile：44.93(Instruments & Instrumentation)

Journal Articles

Transmission secondary ion mass spectrometry using 5 MeV C $_{60}$ $^{+}$ ions

Nakajima, Kaoru*; Nagano, Kengo*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Hirata, Koichi*; Kimura, Kenji*

Applied Physics Letters, 104(11), p.114103_1 - 114103_4, 2014/03

https://doi.org/10.1063/1.4868655

Times Cited Count：7 Percentile：28.81(Physics, Applied)

Journal Articles

Surface effect on ion track formation in amorphous Si $_{3}$ N $_{4}$ films

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Ishikawa, Norito; Hojo, Kiichi; Tsujimoto, Masahiko*; Isoda, Shoji*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 315, p.142 - 145, 2013/11

https://doi.org/10.1016/j.nimb.2013.03.043

Times Cited Count：13 Percentile：66.64(Instruments & Instrumentation)

Journal Articles

Cluster effect on projected range of 30-keV C $_{60}$ $^{+}$ in silicon

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Kimura, Kenji*

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 167, 2013/01

https://doi.org/10.11484/jaea-review-2012-046

no abstracts in English

Journal Articles

Direct observation of fine structure in ion tracks in amorphous Si $_{3}$ N $_{4}$ by TEM

Nakajima, Kaoru*; Morita, Yosuke*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Ishikawa, Norito; Hojo, Kiichi; Tsujimoto, Masahiko*; Isoda, Shoji*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 291, p.12 - 16, 2012/11

https://doi.org/10.1016/j.nimb.2012.09.007

Times Cited Count：15 Percentile：70.64(Instruments & Instrumentation)

Thin films of amorphous Si $_{3}$ N $_{4}$ (thickness 20 nm) were irradiated with 120-720 keV C $_{60}$ $^{+,2+}$ ions and observed using transmission electron microscopy (TEM). The ion track produced in an amorphous material was directly observed by TEM. For quantitative analysis, the ion tracks were also observed using high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM). The observed ion track consists of a low density core (radius 2.5 nm) and a high density shell (width 2.5 nm), which is very similar to the ion tracks in amorphous SiO $_{2}$ irradiated with high energy heavy ions observed by small angle X-ray scattering (SAXS). Although the observed ion tracks may be affected by surface effects, the present result indicates that TEM and HAADF-STEM have potential to observe directly the fine structures of ion tracks in amorphous materials.

Journal Articles

Cluster effect on projected range of 30 keV C $_{60}$ $^{+}$ in silicon

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Vandervorst, W.*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 269(19), p.2080 - 2083, 2011/10

https://doi.org/10.1016/j.nimb.2011.06.015

Times Cited Count：7 Percentile：46.50(Instruments & Instrumentation)

Pre-amorphized silicon wafers are implanted with 30 keV C $_{60}$ $^{+}$ and 0.5 keV C $^{+}$ ions at room temperature with fluences about 210 $^{15}$ atoms/cm $^{2}$ . The depth profiles of implanted carbon are measured using high-resolution Rutherford backscattering spectroscopy. The observed average depth of C for the C $_{60}$ $^{+}$ implantation is 6.1 nm while that for the C $^{+}$ implantation is 4.0 nm, showing a large cluster effect on the projected range.

Journal Articles

Deoxymugineic acid increases Zn translocation in Zn-deficient rice plants

Suzuki, Motofumi*; Tsukamoto, Takashi*; Inoue, Haruhiko*; Watanabe, Satoshi; Matsuhashi, Shimpei; Takahashi, Michiko*; Nakanishi, Hiromi*; Mori, Satoshi*; Nishizawa, Naoko*

Plant Molecular Biology, 66(6), p.609 - 617, 2008/04

https://doi.org/10.1007/s11103-008-9292-x

Times Cited Count：144 Percentile：94.79(Biochemistry & Molecular Biology)

Journal Articles

Biosynthesis and secretion of mugineic acid family phytosiderophores in zinc-deficient barley

Suzuki, Motofumi*; Takahashi, Michiko*; Tsukamoto, Takashi*; Watanabe, Satoshi; Matsuhashi, Shimpei; Yazaki, Junshi*; Kishimoto, Naoki*; Kikuchi, Shoshi*; Nakanishi, Hiromi*; Mori, Satoshi*; et al.

Plant Journal, 48(1), p.85 - 97, 2006/10

https://doi.org/10.1111/j.1365-313X.2006.02853.x

Times Cited Count：180 Percentile：95.54(Plant Sciences)

Journal Articles

Rice plants take up iron as an Fe $^{3+}$ -phytosiderophore and as Fe $^{2+}$

Ishimaru, Yasuhiro*; Suzuki, Motofumi*; Tsukamoto, Takashi*; Suzuki, Kazumasa*; Nakazono, Mikio*; Kobayashi, Takanori*; Wada, Yasuaki*; Watanabe, Satoshi; Matsuhashi, Shimpei; Takahashi, Michiko*; et al.

Plant Journal, 45(3), p.335 - 346, 2006/02

https://doi.org/10.1111/j.1365-313X.2005.02624.x

Times Cited Count：603 Percentile：99.64(Plant Sciences)

Oral presentation

HAADF-STEM observation of ion tracks in amorphous Si $_{3}$ N $_{4}$ thin films

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Tsujimoto, Masahiko*; Isoda, Shoji*

no journal, ,

no abstracts in English

Oral presentation

Forward emission of secondary ions from phenylalanine films on SiN membranes penetrated by MeV Cu $^{4+}$ and C $_{60}$ $^{+}$ from the backside

Nagano, Kengo*; Nakajima, Kaoru*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi

no journal, ,

no abstracts in English

Oral presentation

Thickness dependence of length of ion tracks induced in amorphous SiN membranes by bombardment of C $_{60}$ ions

Nakajima, Kaoru*; Morita, Yosuke*; Kitayama, Takumi*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Tsujimoto, Masahiko*; Isoda, Shoji*

no journal, ,

no abstracts in English

Oral presentation

Kitayama, Takumi*; Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; et al.

no journal, ,

no abstracts in English

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Temperature of thermal spikes in amorphous silicon nitride films produced by 1.11 MeV C $_{60}^{3+}$ impacts

Sputtering of SiN films by 540 keV C $_{60}$ $^{2+}$ ions observed using high-resolution Rutherford backscattering spectroscopy

Transmission secondary ion mass spectrometry using 5 MeV C $_{60}$ $^{+}$ ions

Surface effect on ion track formation in amorphous Si $_{3}$ N $_{4}$ films

Cluster effect on projected range of 30-keV C $_{60}$ $^{+}$ in silicon

Direct observation of fine structure in ion tracks in amorphous Si $_{3}$ N $_{4}$ by TEM

Cluster effect on projected range of 30 keV C $_{60}$ $^{+}$ in silicon

Deoxymugineic acid increases Zn translocation in Zn-deficient rice plants

Biosynthesis and secretion of mugineic acid family phytosiderophores in zinc-deficient barley

Rice plants take up iron as an Fe $^{3+}$ -phytosiderophore and as Fe $^{2+}$

HAADF-STEM observation of ion tracks in amorphous Si $_{3}$ N $_{4}$ thin films

Forward emission of secondary ions from phenylalanine films on SiN membranes penetrated by MeV Cu $^{4+}$ and C $_{60}$ $^{+}$ from the backside

Thickness dependence of length of ion tracks induced in amorphous SiN membranes by bombardment of C $_{60}$ ions

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation

Cluster effect on projected range of 30-keV C $_{60}$ ions in Si

Direct observation of fine structure in ion tracks in amorphous thin films by TEM

Direct observation of ion tracks in amorphous insulator thin films with transmission electron microscopy

Fast-C $_{60}$ $^{+}$ -ion-transimission-induced secondary-ion forward emissions from amino acids on SiN thin films

Forward emission of secondary ions from phenylalanine films on SiN membrane penetrated by swift C $_{60}$ $^{+}$ from the backside

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation