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論文

Magnetic layer thickness influence on magnetoelastic properties anisotropy in Co$$_{2}$$Fe$$_{0.4}$$Mn$$_{0.6}$$Si heusler alloy thin films

Nabialek, A.*; Chumak, O.*; 関 剛斎*; 高梨 弘毅; Baczewski, L. T.*; Szymczak, H.*

IEEE Transactions on Magnetics, 59(11), p.2501405_1 - 2501405_5, 2023/11

https://doi.org/10.1109/TMAG.2023.3287324
 被引用回数：2 パーセンタイル：17.75(Engineering, Electrical & Electronic)

The anisotropic magnetoelastic (ME) properties of epitaxial Co$$_{2}$$Fe$$_{0.4}$$Mn$$_{0.6}$$Si(CFMS) Heusler alloy thin films with thicknesses ranging from 8 to 100 nm were investigated using the strain-modulated ferromagnetic resonance (SMFMR) technique. The calculation of the first cubic magnetocrystalline (MC) constant ${it K}$ $$_{1}$$ and the two cubic ME constants ${it b}$ $$_{1}$$ and ${it b}$ $$_{2}$$ was carried out assuming the cubic symmetry of the magnetic layer. A significant negative perpendicular MC anisotropy, of the order of 10$$^{5}$$ J/m$$^{3}$$, was also observed. The investigated parameters were found to be dependent on the thickness of the magnetic layer. The thinnest magnetic layers showed the strongest cubic MC anisotropy and the weakest anisotropy of ME properties. These findings highlight the importance of considering the magnetic layer thickness when evaluating the anisotropy in the ME properties of Heusler alloy thin films.

論文

Influence of the strain effect on magnetocrystalline anisotropy in Co$$_{2}$$Fe$$_{0.4}$$Mn$$_{0.6}$$Si Heusler alloys

Nabialek, A.*; Chumak, O. M.*; Aleshkevych, P.*; Domagala, J. Z.*; Pacewicz, A.*; Salski, B.*; Krupka, J.*; 関 剛斎*; 高梨 弘毅; Baczewski, L. T.*; et al.

Scientific Reports (Internet), 13, p.17016_1 - 17016_9, 2023/10

https://doi.org/10.1038/s41598-023-43979-x
 被引用回数：8 パーセンタイル：59.01(Multidisciplinary Sciences)

The perpendicular magnetocrystalline anisotropy, magnetoelastic properties as well as the Gilbert damping factor in Co$$_{2}$$Fe$$_{0.4}$$Mn$$_{0.6}$$Si thin films were found to depend on a magnetic layer thickness, and they can be also tuned by the application of additional Ag buffer layer. The tetragonal distortion of a magnetic layer was found to increase with decreasing thickness, and after the application of an additional Ag buffer layer, the character of this distortion was changed from tensile to compressive in the plane of a film. A correlation between the tetragonal distortion and perpendicular magnetocrystalline anisotropy was found. However, the magnitude of the observed tetragonal distortion for most samples seems to be too small to explain alone the experimentally found large magnitude of the perpendicular magnetocrystalline anisotropy. For these samples, other mechanisms including both surface and volume effects must be taken into account.

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