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Ge in the normal stateNakatani, Yasuhiro*; Aratani, Hidekazu*; Fujiwara, Hidenori*; Mori, Takeo*; Tsuruta, Atsushi*; Tachibana, Shoichi*; Yamaguchi, Takashi*; Kiss, Takayuki*; Yamasaki, Atsushi*; Yasui, Akira*; et al.
Physical Review B, 97(11), p.115160_1 - 115160_7, 2018/03
Times Cited Count：5 Percentile：20.71(Materials Science, Multidisciplinary)GeNakatani, Yasuhiro*; Fujiwara, Hidenori*; Aratani, Hidekazu*; Mori, Takeo*; Tachibana, Shoichi*; Yamaguchi, Takashi*; Kiss, Takayuki*; Yamasaki, Atsushi*; Yasui, Akira*; Yamagami, Hiroshi*; et al.
Journal of Electron Spectroscopy and Related Phenomena, 220, p.50 - 53, 2017/01
Times Cited Count：2 Percentile：17.1(Spectroscopy)We report the soft X-ray angle-resolved photoemission study for LaNiGe to reveal the electronic structures derived from non-4
bands of the heavy fermion compound CeNiGe. The photoemission spectra recorded at the La M
absorption edges clearly show the enhancement of the La 5
components in the valence band spectra. The circular dichroism of photoemission spectra reveals the band-dependent dichroic response due to the orbital symmetry.
Wada, Ken*; Hyodo, Toshio*; Yagishita, Akira*; Ikeda, Mitsuo*; Osawa, Satoshi*; Shidara, Tetsuo*; Michishio, Koji*; Tachibana, Takayuki*; Nagashima, Yasuyuki*; Fukaya, Yuki; et al.
European Physical Journal D, 66(2), p.37 - 40, 2012/02
Times Cited Count：38 Percentile：85.29(Optics)no abstracts in English
Sakaba, Nariaki; Nakagawa, Shigeaki; Furusawa, Takayuki*; Emori, Koichi; Tachibana, Yukio
Nihon Genshiryoku Gakkai Wabun Rombunshi, 3(4), p.388 - 395, 2004/12
Chemistry control is important for the helium coolant of High Temperature Gas-cooled Reactors (HTGRs) because impurities cause oxidation of the graphite used in the core and corrosion of high temperature materials used in the heat exchanger. In the High Temperature Engineering Test Reactor (HTTR) which is the first HTGR in Japan, the chemical impurity concentration is restricted and its behaviour is monitored during reactor operations. The impurity is reduced by the helium purification system and the concentration is measured by the helium sampling system installed to the primary and secondary helium system, continuously. This paper describes the impurity behaviour during the rise-to-power test which is the initial power-up of the HTTR. Also, the amount of the emitted impurity to the primary circuit from the graphite component and insulator used at the concentric hot gas duct are evaluated. During the power up, any abnormal impurity increases were not obtained and the chemical composition of the primary circuit is sufficiently in the stability area to avoid carbon deposition.
Sakaba, Nariaki; Nakagawa, Shigeaki; Furusawa, Takayuki; Tachibana, Yukio
JAERI-Tech 2004-045, 67 Pages, 2004/04
JAERI-Tech-2004-045.pdf:4.74MB
Safety demonstration tests using the HTTR are now underway in order to verify the inherent safety features and to improve the safety design and evaluation technologies for HTGRs, as well as to contribute to research and development for the VHTR, which is one of the Generation IV reactors. In the safety demonstration tests, the coolant flow reduction test by tripping one or two out of three gas circulators is being performed between FY2002 and FY 2005 and by tripping all the three gas circulators will be conducted after FY2006. This paper describes the structural integrity assessment of the primary pressurised water cooler after one and two gas circulators run down. Also, the possibility of natural convection in the primary coolant after all the three gas circulator stopped was evaluated by the operation data of the reactor-scram test performed during the rise-to-power tests.
Sakaba, Nariaki; Nakagawa, Shigeaki; Takamatsu, Kuniyoshi; Takada, Eiji*; Saito, Kenji; Furusawa, Takayuki; Tochio, Daisuke; Tachibana, Yukio; Iyoku, Tatsuo
JAERI-Tech 2004-014, 24 Pages, 2004/02
JAERI-Tech-2004-014.pdf:1.06MB
Safety demonstration tests using the HTTR are in progress to verify the inherent safety features and to improve the safety design and evaluation technologies for HTGRs, as well as to contribute to not only the commercial HTGRs but also the research and development for the VHTR one of the Generation IV reactors. This paper describes the reactivity insertion test and coolant flow reduction test by trip of gas circulator and partial flow loss of coolant planned in 2004 with detailed test method, procedure and results of pre-test analysis. From the analytical results, it was found that the negative reactivity feedback effect of the core brings the reactor power safely to a stable level without a reactor scram.
Sakaba, Nariaki; Nakagawa, Shigeaki; Furusawa, Takayuki; Tachibana, Yukio
Transactions of the American Nuclear Society, 91, P. 377, 2004/00
Carbon deposition occurred occasionally in the graphite-moderated gas-cooled reactors was evaluated for the reactor pressure vessel, intermediate heat exchanger, etc. using the measured chemical impurity data for the initial condition of the safety demonstration test. By the evaluated result, it is confirmed that the high-temperature components keep their structural integrity during the any temperature transients in safety demonstration tests.
Tachibana, Yukio; Nakagawa, Shigeaki; Takeda, Takeshi; Saikusa, Akio; Furusawa, Takayuki; Takamatsu, Kuniyoshi; Sawa, Kazuhiro; Iyoku, Tatsuo
Nuclear Engineering and Design, 224(2), p.179 - 197, 2003/09
Times Cited Count：13 Percentile：64.66(Nuclear Science & Technology)no abstracts in English
Sakaba, Nariaki; Nakagawa, Shigeaki; Takada, Eiji*; Tachibana, Yukio; Saito, Kenji; Furusawa, Takayuki; Takamatsu, Kuniyoshi; Tochio, Daisuke; Iyoku, Tatsuo
JAERI-Tech 2003-074, 37 Pages, 2003/08
JAERI-Tech-2003-074.pdf:1.83MB
Safety demonstration tests using HTTR are now underway in order to verify the inherent safety features and to improve the safety design and evaluation technologies for HTGRs, as well as to contribute to research and development for the VHTR, which is one of the Generation IV reactors. The first phase of the safety demonstration tests includes reactivity insertion tests by means of control-rod withdrawal and coolant flow reduction tests by tripping the gas circulators. In the second phase, accident simulation tests will be conducted. This paper describes the plan of coolant flow reduction tests by tripping of gas circulators planned in August 2003 with detailed test method, procedure and results of pre-test analysis. The analysis results of the steady state and transient behaviours of the reactor and the plant of the HTTR show that in the case of a rapid decrease of the coolant flow rate, the negative reactivity feedback effect of the core brings the reactor power safely to certain stable level without a reactor scram, and that the temperature transient of the reactor core is slow.
Nakagawa, Shigeaki; Sakaba, Nariaki; Takada, Eiji*; Tachibana, Yukio; Saito, Kenji; Furusawa, Takayuki; Sawa, Kazuhiro
JAERI-Tech 2003-049, 22 Pages, 2003/03
JAERI-Tech-2003-049.pdf:1.17MB
Safety demonstration tests in the HTTR (High Temperature Engineering Test Reactor) will be carried out in order to verify inherent safety features of the HTGR (High Temperature Gas-cooled Reactor). The first phase of the safety demonstration tests includes the reactivity insertion test by the control rod withdrawal and the coolant flow reduction test by the gas circulator trip. In the second phase, accident simulation tests will be conducted. By comparison of their experimental and analytical results, the prediction capability of the safety evaluation codes such as the core and the plant dynamics codes will be improved and verified, which will contribute to establish the safety design and the safety evaluation technologies of the HTGRs. The results obtained through its safety demonstration tests will be also utilised for the establishment of the safety design guideline, the safety evaluation guideline, etc. This paper describes the test program of the overall safety demonstration tests and the test method, the test conditions and the results of the pre-test analysis of the reactivity insertion test and the partial gas circulator trip test planned in March 2003.
Tachibana, Yukio; Nakagawa, Shigeaki; Takeda, Takeshi; Saikusa, Akio; Furusawa, Takayuki; Takamatsu, Kuniyoshi; Nishihara, Tetsuo; Sawa, Kazuhiro; Iyoku, Tatsuo
JAERI-Tech 2002-059, 42 Pages, 2002/08
JAERI-Tech-2002-059.pdf:1.63MB
no abstracts in English
Tachibana, Yukio; Kunitomi, Kazuhiko; Furusawa, Takayuki; Shinozaki, Masayuki; *; *
JAERI-Tech 98-045, 36 Pages, 1998/10
no abstracts in English
Okumura, Susumu; Agematsu, Takashi; Yokota, Wataru; Kamiya, Tomihiro; Fukuda, Mitsuhiro; Nakamura, Yoshiteru; Nara, Takayuki; Ishibori, Ikuo; Arakawa, Kazuo; Maruyama, M.*; et al.
Proceedings of 13th International Conference on Cyclotrons and Their Applications, p.648 - 651, 1993/00
no abstracts in English
Okumura, Susumu; Agematsu, Takashi; Yokota, Wataru; Kamiya, Tomihiro; Fukuda, Mitsuhiro; Nakamura, Yoshiteru; Nara, Takayuki; Ishibori, Ikuo; Arakawa, Kazuo; Maruyama, M.*; et al.
Proceedings of the International Conference on Evolution in Beam Applications, p.275 - 279, 1992/00
no abstracts in English
Okumura, Susumu; Agematsu, Takashi; Yokota, Wataru; Kamiya, Tomihiro; Fukuda, Mitsuhiro; Nakamura, Yoshiteru; Nara, Takayuki; Ishibori, Ikuo; Arakawa, Kazuo; Maruyama, M.*; et al.
Proc. of the 8th Symp. on Accelerator Science and Technology, p.356 - 358, 1991/00
no abstracts in English
Miyauchi, Hideaki; Sekiguchi, Masato; Takahashi, Masa; Yasuda, Takayuki; Tachibana, Haruo; Yoshizawa, Michio
no journal, ,
no abstracts in English
Wada, Ken*; Hyodo, Toshio*; Yagishita, Akira*; Ikeda, Mitsuo*; Osawa, Satoshi*; Shidara, Tetsuo*; Michishio, Koji*; Suzuki, Ryohei*; Tachibana, Takayuki*; Nagashima, Yasuyuki*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Hyodo, Toshio*; Kosuge, Takashi*; Saito, Yuki*; Ikeda, Mitsuo*; Osawa, Satoshi*; Shidara, Tetsuo*; Michishio, Koji*; Tachibana, Takayuki*; Nagashima, Yasuyuki*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Hyodo, Toshio*; Kosuge, Takashi*; Saito, Yuki*; Yagishita, Akira*; Ikeda, Mitsuo*; Osawa, Satoshi*; Suwada, Tsuyoshi*; Furukawa, Kazuro*; Shirakawa, Akihiro*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Mochizuki, Izumi*; Hyodo, Toshio*; Kosuge, Takashi*; Saito, Yuki*; Shidara, Tetsuo*; Osawa, Satoshi*; Ikeda, Mitsuo*; Shirakawa, Akihiro*; Furukawa, Kazuro*; et al.
no journal, ,
no abstracts in English
