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Toyomori, Yuka*; Tsuji, Satoru*; Mitsuda, Shinobu*; Okayama, Yoichi*; Ashida, Shiomi*; Mori, Atsunori*; Kobayashi, Toru; Miyazaki, Yuji; Yaita, Tsuyoshi; Arae, Sachie*; et al.
Bulletin of the Chemical Society of Japan, 89(12), p.1480 - 1486, 2016/09
Times Cited Count:6 Percentile:27.13(Chemistry, Multidisciplinary)Takahashi, Masamitsu; Kozu, Miwa*; Sasaki, Takuo
Japanese Journal of Applied Physics, 55(4S), p.04EJ04_1 - 04EJ04_4, 2016/04
Times Cited Count:5 Percentile:28.82(Physics, Applied)Suzuki, Hidetoshi*; Nakata, Yuka*; Takahashi, Masamitsu; Ikeda, Kazuma*; Oshita, Yoshio*; Morohara, Osamu*; Geka, Hirotaka*; Moriyasu, Yoshitaka*
AIP Advances (Internet), 6(3), p.035303_1 - 035303_6, 2016/03
Times Cited Count:4 Percentile:23.45(Nanoscience & Nanotechnology)Sasaki, Takuo; Ishikawa, Fumitaro*; Takahashi, Masamitsu
Applied Physics Letters, 108(1), p.012102_1 - 012102_5, 2016/01
Times Cited Count:2 Percentile:11.5(Physics, Applied)Shimomura, Kenichi*; Suzuki, Hidetoshi*; Sasaki, Takuo; Takahashi, Masamitsu; Oshita, Yoshio*; Kamiya, Itaru*
Journal of Applied Physics, 118(18), p.185303_1 - 185303_7, 2015/11
Times Cited Count:7 Percentile:34.71(Physics, Applied)Takahashi, Masamitsu; Kozu, Miwa*; Sasaki, Takuo; Hu, W.*
Crystal Growth & Design, 15(10), p.4979 - 4985, 2015/10
Times Cited Count:12 Percentile:70.9(Chemistry, Multidisciplinary)Sasaki, Takuo; Takahashi, Masamitsu
Nihon Kessho Seicho Gakkai-Shi, 42(3), p.210 - 217, 2015/10
Takahashi, Masamitsu
Nihon Kessho Seicho Gakkai-Shi, 42(3), p.201 - 209, 2015/10
Sasaki, Takuo; Takahashi, Masamitsu; Suzuki, Hidetoshi*; Oshita, Yoshio*; Yamaguchi, Masafumi*
Journal of Crystal Growth, 425, p.13 - 15, 2015/09
Times Cited Count:3 Percentile:32.4(Crystallography)Hu, W.*; Hayashi, Koichi*; Fukumura, Tomoteru*; Akagi, Kazuto*; Tsukada, Masaru*; Happo, Naohisa*; Hosokawa, Shinya*; Owada, Kenji; Takahashi, Masamitsu; Suzuki, Motohiro*; et al.
Applied Physics Letters, 106(22), p.222403_1 - 222403_5, 2015/06
Times Cited Count:35 Percentile:82.69(Physics, Applied)Biermanns, A.*; Dimakis, E.*; Davydok, A.*; Sasaki, Takuo; Geelhaar, L.*; Takahashi, Masamitsu; Pietsch, U.*
Nano Letters, 14(12), p.6878 - 6883, 2014/12
Times Cited Count:26 Percentile:75.28(Chemistry, Multidisciplinary)Terauchi, Masami*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Imazono, Takashi; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; et al.
Microscopy and Microanalysis, 20(Suppl.3), p.682 - 683, 2014/08
X-rays originate form electronic transitions from valence bands (VB, bonding electron states) to inner-shell electron levels inform us energy states of bonding electrons. We have developed the SXES spectrometers attaching to TEM, EPMA, and SEM. A spectrometer has an energy range of 50-4000 eV by using four varied-line-spacing gratings. Applications of TEM-SXES instrument to C have revealed characteristic energy distribution of bonding electrons. Carbon K-emission spectra of C
crystals showed that both the peak structures in
- and
-bands and the characteristic dip structure between the
- and
-bonding states in monomer-C
disappear in the most polymerized-C
crystals. Bulk specimens were examined by applying SXES to a SEM. Al L-emission spectra of intermetallic compounds of Al
Au, AlCo, and aluminum showed different intensity distributions due to different band structures originating from different crystal structures.
Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Terauchi, Masami*; Koike, Masato; Kawachi, Tetsuya; Imazono, Takashi; Hasegawa, Noboru; Koeda, Masaru*; Nagano, Tetsuya*; et al.
Microscopy and Microanalysis, 20(Suppl.3), p.684 - 685, 2014/08
A novel wavelength dispersive soft X-ray emission spectrometer (SXES) having a X-ray energy range of 50-210 eV has been developed. One feature is that the SXES is parallel detection of the signals so that it can be used like a conventional energy dispersive spectrometer. The other is a high energy resolution, which is about 0.2 eV at Al-L comparable to those revealed by XPS and EELS. These features enable us to obtain meaningful information about chemical bonding in various bulk samples. The SXES can detect Li-K emission spectrum. In the case of an anode electrode of a lithium ion battery (LIB), two types of lithium peaks are observed: one lower energy peak at 50 eV and the other higher energy peak at 54 eV. It was found that the former peak corresponds to the amount of charging, whereas the latter corresponds to the metallic state of lithium.
Haraga, Tomoko; Saito, Shingo*; Sato, Yoshiyuki; Asai, Shiho; Hanzawa, Yukiko; Hoshino, Hitoshi*; Shibukawa, Masami*; Ishimori, Kenichiro; Takahashi, Kuniaki
Analytical Sciences, 30(7), p.773 - 776, 2014/07
Times Cited Count:6 Percentile:24.54(Chemistry, Analytical)A simple and rapid method with low radiation exposure risk was developed for the determination of neodymium in spent nuclear fuel by CE with LIF detection using a fluorescent ligand having a macrocyclic hexadentate polyaminocarboxylate structure. The concentration of Nd(III) in a spent nuclear fuel sample was determined with no interference from various matrix elements, including lanthanides and uranium (at a 200-fold excess), with 92 3% recovery. This is due to method's high resolution based on establishing a ternary complex equilibrium during migration in which the hydroxyl ion plays an auxiliary role.
Terauchi, Masami*; Koshiya, Shogo*; Sato, Futami*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Imazono, Takashi; Koeda, Masaru*; Nagano, Tetsuya*; et al.
Microscopy and Microanalysis, 20(3), p.692 - 697, 2014/06
Times Cited Count:25 Percentile:88.29(Materials Science, Multidisciplinary)Electron beam induced soft-X-ray emission spectroscopy (SXES) by using a grating spectrometer has been introduced to a conventional scanning electron microscope (SEM) for characterizing desired specimen areas of bulk materials. The spectrometer was designed as a grazing-incidence flat-field optics by using aberration corrected (varied-line-spacing) gratings and a multi-channel-plate detector combined with a charge-coupled-device camera, which has already applied for a transmission electron microscope. The best resolution was confirmed as 0.13 eV at Mg L-emission (50 eV), which value is comparable to that of recent dedicated electron energy-loss spectroscopy instruments. This SXES-SEM instrument presents density of states of simple metals of bulk Mg and Li. Apparent band structure effects have been observed in Si L-emission of Si-wafer, P L-emission of GaP-wafer, and Al L-emissions of intermetallic compounds of AlCo, AlPd, AlPt, and Al
Au.
Kim, J.*; Sinha, J.*; Mitani, Seiji*; Hayashi, Masamitsu*; Takahashi, Saburo*; Maekawa, Sadamichi; Yamanouchi, Michihiko*; Ohno, Hideo*
Physical Review B, 89(17), p.174424_1 - 174424_8, 2014/05
Times Cited Count:84 Percentile:94.46(Materials Science, Multidisciplinary)We have studied the underlayer thickness and temperature dependencies of the current-induced effective field in CoFeB/MgO heterostructures with Ta-based underlayers. The underlayer thickness at which the effective field saturates is found to be different between the two orthogonal components of the effective field; i.e., the dampinglike term tends to saturate at a smaller underlayer thickness than the fieldlike term. For large underlayer thickness films in which the effective field saturates, we find that the measurement temperature significantly influences the size of the effective field. A striking difference is found in the temperature dependence of the two components: the dampinglike term decreases whereas the fieldlike term increases with increasing temperature. Using a simple spin diffusion-spin transfer model, we find that all of these results can be accounted for provided the real and imaginary parts of an effective spin mixing conductance are negative. These results imply that either spin transport in this system is different from conventional metallic interfaces or effects other than spin diffusion into the magnetic layer need to be taken into account in order to model the system accurately.
Hu, W.*; Hayashi, Koichi*; Owada, Kenji; Chen, J.*; Happo, Naohisa*; Hosokawa, Shinya*; Takahashi, Masamitsu; Bokov, A.*; Ye, Z.-G*
Physical Review B, 89(14), p.140103_1 - 140103_5, 2014/04
Times Cited Count:40 Percentile:85.21(Materials Science, Multidisciplinary)Ueno, Yumi; Koarashi, Jun; Iwai, Yasunori; Sato, Junya; Takahashi, Teruhiko; Sawahata, Katsunori; Sekita, Tsutomu; Kobayashi, Makoto; Tsunoda, Masahiko; Kikuchi, Masamitsu
Hoken Butsuri, 49(1), p.39 - 44, 2014/03
The Japan Atomic Energy Agency has conducted a monthly monitoring of airborne C discharge at the forth research building (RI facility) of the Tokai Research and Development Center. In the current monitoring,
C, which exists in various chemical forms in airborne effluent, is converted into
CO
with CuO catalyst and then collected using monoethanolamine (MEA) as CO
absorbent. However, this collection method has some issues on safety management because the CuO catalyst requires a high heating temperature (600
C) to ensure a high oxidation efficiency and the MEA is specified as a poisonous and deleterious substance. To establish a safer, manageable and reliable method for monitoring airborne
C discharge, we examined collection methods that use different CO
absorbents (MEA and Carbo-Sorb E) and oxidation catalysts (CuO, Pt/Alumina and Pd/ZrO
). The results showed 100% CO
collection efficiency of MEA during a 30-day sampling period under the condition tested. In contrast, Carbo-Sorb E was found to be unsuitable for the monthly-long CO
collection because of its high volatile nature. Among the oxidation catalysts, the Pd/ZrO
showed the highest oxidation efficiency for CH
at a lower temperature.
Sasaki, Takuo; Norman, A. G.*; Romero, M. J.*; Al-Jassim, M. M.*; Takahashi, Masamitsu; Kojima, Nobuaki*; Oshita, Yoshio*; Yamaguchi, Masafumi*
Physica Status Solidi (C), 10(11), p.1640 - 1643, 2013/11
Times Cited Count:4 Percentile:85.38Nishi, Toshiaki*; Sasaki, Takuo; Ikeda, Kazuma*; Suzuki, Hidetoshi*; Takahashi, Masamitsu; Shimomura, Kenichi*; Kojima, Nobuaki*; Oshita, Yoshio*; Yamaguchi, Masafumi*
AIP Conference Proceedings 1556, p.14 - 17, 2013/09
Times Cited Count:0 Percentile:0.01